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173 条记录 (耗时 0.047 秒)

    Contactless system for detecting subtle surface potential charge patterns
    113.
    发明授权
    Contactless system for detecting subtle surface potential charge patterns 失效
    用于检测微小表面电荷电荷模式的非接触式系统

    公开(公告)号：US6150824A

    公开(公告)日：2000-11-21

    申请号：US961061

    申请日：1997-10-30

    申请人： Satchidanand Mishra ,  Edward A. Domm ,  Zoran D. Popovic ,  Denis C. Thomas ,  Samy A. Mesbah ,  Dennis J. Prosser ,  Steven P. Nonkes

    发明人： Satchidanand Mishra ,  Edward A. Domm ,  Zoran D. Popovic ,  Denis C. Thomas ,  Samy A. Mesbah ,  Dennis J. Prosser ,  Steven P. Nonkes

    IPC分类号： G01R29/12 ,  G01N27/60 ,  G01R29/14 ,  G03G15/00

    CPC分类号： G03G15/75 ,  G01N27/60

    摘要： A contactless process for detecting electrical patterns on the outer surface of a member comprising providing a member having a charge pattern on an outer surface, repetitively measuring the charge pattern on the outer surface of the member with an electrostatic voltmeter probe maintained at a substantially constant distance from the surface, the distance between the probe and the imaging member being slightly greater than the minimum distance at which Paschen breakdown will occur to form a parallel plate capacitor with a gas between the probe and the surface, the frequency of repetition being selected to cause all time dependent signals to fall out of phase by a predetermined amount, and averaging the out of phase time dependent signals over a sufficient number of measuring repetitions to eliminate the time dependent signals. In one embodiment, the contactless process detects surface potential charge patterns in an electrostatographic imaging member. Apparatus for carrying out these processes are also described.

    摘要翻译： 一种用于检测构件的外表面上的电气图案的非接触式方法，包括在外表面上提供具有电荷图案的构件，用保持在基本上恒定距离的静电电压表探针重复测量构件的外表面上的电荷图案 从表面来看，探针与成像构件之间的距离略大于发生帕辛击穿的最小距离，以便在探头和表面之间形成具有气体的平行平板电容器，选择重复频率导致 所有时间相关信号相位相差预定量，并通过足够数量的测量重复对异相时间相关信号进行平均，以消除与时间相关的信号。 在一个实施例中，非接触式过程检测电摄影成像构件中的表面电荷电荷模式。 还描述了用于执行这些处理的装置。

    Contactless system for detecting microdefects on electrostatographic members
    114.
    发明授权
    Contactless system for detecting microdefects on electrostatographic members 失效
    用于检测静电元件上的微缺陷的非接触式系统

    公开(公告)号：US06008653A

    公开(公告)日：1999-12-28

    申请号：US960673

    申请日：1997-10-30

    申请人： Zoran D. Popovic ,  Steven I. Dejak ,  Satchidanand Mishra

    发明人： Zoran D. Popovic ,  Steven I. Dejak ,  Satchidanand Mishra

    IPC分类号： G01R29/12 ,  G01N27/24 ,  G01N27/60 ,  G01Q30/04 ,  G01Q30/12 ,  G03G21/00

    CPC分类号： G01N27/24 ,  B82Y35/00

    摘要： A contactless process for detecting surface potential charge patterns in an electrophotographic imaging member including at least one photoconductive imaging layer having an imaging surface, providing a scanner including a capacitive probe having an outer shield electrode, maintaining the probe adjacent to and spaced from the imaging surface to form a parallel plate capacitor with a gas between the probe and the imaging surface, providing a probe amplifier optically coupled to the probe, establishing relative movement between the probe and the imaging surface, maintaining a substantially constant distance between the probe and the imaging surface, applying a constant voltage charge to the imaging surface prior to relative movement of the probe and the imaging surface past each other, synchronously biasing the probe to within about .+-.300 volts of the average surface potential of the imaging surface, measuring variations in surface potential with the probe, compensating the surface potential variations for variations in distance between the probe and the imaging surface, and comparing the compensated voltage values to a baseline voltage value to detect charge patterns in the electrophotographic imaging member. This process may be conducted with a contactless scanning system comprising a high resolution capacitive probe, a low spatial resolution electrostatic voltmeter coupled to a bias voltage amplifier, and an imaging member having an imaging surface capacitively coupled to and spaced from the probe and the voltmeter, the probe comprising an inner electrode surrounded by and insulated from a coaxial outer Faraday shield electrode, the inner electrode connected to an optocoupled amplifier, and the Faraday shield connected to the bias voltage amplifier.

    摘要翻译： 一种用于检测电子照相成像构件中的表面电荷电荷图案的非接触式方法，包括具有成像表面的至少一个光电导成像层，提供包括具有外部屏蔽电极的电容式探针的扫描器，将探针保持在邻近和与成像表面隔开的位置 以在探针和成像表面之间形成具有气体的平行平板电容器，提供光学耦合到探针的探针放大器，建立探头与成像表面之间的相对运动，保持探头与成像表面之间基本恒定的距离 在探针和成像表面相对移动彼此相对移动之前，将恒定电压电荷施加到成像表面，同步地将探针偏置在成像表面的平均表面电位的约+/- 300伏之内，测量成像表面的变化 表面电位与探头，补偿表面纸 探头和成像表面之间的距离变化的微小变化，以及将补偿的电压值与基线电压值进行比较，以检测电子照相成像构件中的电荷模式。 该过程可以使用包括高分辨率电容式探针，耦合到偏置电压放大器的低空间分辨率静电电压计和具有电容耦合到探针和电压计的成像表面的成像表面的非接触式扫描系统进行， 该探针包括被同轴的外部法拉第屏蔽电极包围并绝缘的内部电极，连接到光耦合放大器的内部电极和连接到偏置电压放大器的法拉第屏蔽。

    Differential increase in dark decay comparison
    115.
    发明授权
    Differential increase in dark decay comparison 失效
    黑暗衰变比较差异增大

    公开(公告)号：US5697024A

    公开(公告)日：1997-12-09

    申请号：US586472

    申请日：1996-01-11

    申请人： Satchidanand Mishra

    发明人： Satchidanand Mishra

    IPC分类号： G01N21/88 ,  G01N21/93 ,  G03G15/00 ,  G03G15/02 ,  G03G21/00

    CPC分类号： G03G15/75

    摘要： A process for ascertaining the microdefect levels of an electrophotographic imaging member including establishing for a first electrophotographic imaging member, having a known differential increase in dark decay value and a measured crest value, a first reference datum for dark decay crest value at an initial applied field; establishing with the crest value a second reference datum for dark decay crest value at a final applied field; determining the differential increase in dark decay between the first reference datum and the second reference datum for the first electrophotographic imaging member; repeatedly subjecting a virgin electrophotographic imaging member, having a measured crest value, to aforesaid cycles until the amount of dark decay reaches the crest value for the virgin electrophotographic imaging which remains substantially constant; establishing with virgin electrophotographic imaging member, having a measured crest value, a third reference datum for dark decay crest value; establishing for the virgin electrophotographic imaging member a fourth reference datum for dark decay crest value; determining the differential increase in dark decay between the third reference datum and the fourth reference datum to establish a differential increase in dark decay value for the virgin electrophotographic imaging member; and comparing the differential increase in dark decay value of the virgin electrophotographic imaging member with the known differential increase in dark decay value.

    摘要翻译： 一种用于确定电子照相成像构件的微缺陷水平的方法，包括建立用于第一电子照相成像构件的，具有已知的暗衰变值的差分增加和测量的峰值，用于初始施加场的暗衰变峰值的第一参考数据 ; 在顶点值建立最终施加场的暗衰变峰值的第二参考基准; 确定第一电摄影成像构件的第一参考基准和第二参考基准之间的暗衰减的差异增加; 将具有测量峰值的原始电子照相成像构件反复进行上述循环，直到暗衰减量达到保持基本恒定的原始电子照相成像的波峰值; 建立具有测量峰值的处理电子照相成像构件，用于暗衰变峰值的第三参考基准; 为原始电子照相成像构件建立暗衰变峰值的第四参考基准; 确定第三参考基准和第四参考基准之间的暗衰减的差异增加，以建立原始电子照相成像构件的暗衰减值的差异增加; 并将原始电子照相成像构件的暗衰减值的差异增加与暗衰变值的已知差分增加进行比较。

    Motionless scanner
    116.
    发明授权
    Motionless scanner 失效

    公开(公告)号：US5132627A

    公开(公告)日：1992-07-21

    申请号：US636045

    申请日：1990-12-28

    申请人： Zoran D. Popovic ,  Damodar M. Pai ,  Merlin E. Scharfe ,  Satchidanand Mishra ,  Edward A. Domm

    发明人： Zoran D. Popovic ,  Damodar M. Pai ,  Merlin E. Scharfe ,  Satchidanand Mishra ,  Edward A. Domm

    IPC分类号： G01R29/00 ,  G01R29/12 ,  G03G5/00 ,  G03G15/00 ,  G03G21/00

    CPC分类号： G03G15/75

    摘要： A process is disclosed for ascertaining electrical discharge properties of an electrophotographic imaging member including the steps of (a) providing at least one electrophotographic imaging member comprising an electrically conductive layer and at least one photoconductive layer, (b) contacting the surface of the electrophotographic imaging member with a substantially transparent electrode and applying an electric potential or an electric current to form an electric field across the photoconductive layer, (c) terminating the applying of the electric potential or the electric current, (d) exposing the photoconductive layer to activating radiation to discharge the electrophotographic imaging member, (e) repeating steps (b), (c) and (d), and (f) measuring the potential across the photoconductive layer during steps (b), (c) and (d) as a function of time by means of an electrostatic meter coupled to the electrode. Also, disclosed is apparatus for ascertaining electrical discharge properties of an electrophotographic imaging member including (a) means to support an electrophotographic imaging member comprising an electrically conductive layer and at least one photoconductive layer, (b) means for applying an electric potential or electric current to a substantially transparent electrode on the electrophotographic imaging member to form an electric field across the photoconductive layer, (c) means for terminating the applying of the electric potential or the electric current, (d) an electrostatic voltmeter probe coupled to the means for applying an electric current to the electrode, (e) means for exposing the photoconductive layer through the substantially transparent electrode to activating radiation to discharge the electrophotographic imaging member to a predetermined level, and (f) means for exposing the photoconductive layer to activating radiation to fully discharge the electrophotographic imaging member.