公开(公告)号：US4562345A

公开(公告)日：1985-12-31

申请号：US448038

申请日：1982-12-08

申请人： Masahiro Aoki ,  Junichi Nakamura ,  Masatoshi Ida ,  Kenichi Oinoue ,  Asao Hayashi

发明人： Masahiro Aoki ,  Junichi Nakamura ,  Masatoshi Ida ,  Kenichi Oinoue ,  Asao Hayashi

IPC分类号： G03B3/10 ,  G01J1/20

CPC分类号： G03B3/10

摘要： A method and apparatus for detecting focus conditions of a photographic optical system is disclosed. The invention comprises a member for dividing the wavefront of a light beam from a photographic optical system in an image space thereof, a first light receiving device including two photocell arrays provided in the front and the rear of a surface conjugated to a predetermined focal plane of the optical system, and a second light receiving device including at least one photocell array provided at a surface conjugated to one of the photocell arrays in the first light receiving device. A first signal representing horizontal shift of an optical image is detected based on outputs of at least one photocell array in the second light receiving device and one photocell array in the first light receiving device having a relation conjugated to the photocell array in the second light receiving device. A second signal representing defocused amount of the image is detected based on outputs of two photocell arrays in the first light receiving device thereby detecting focus conditions by the first and the second signals.

摘要翻译： 公开了一种用于检测照相光学系统的聚焦条件的方法和装置。 本发明包括用于在其图像空间中分离来自照相光学系统的光束的波前的部件，第一光接收装置，其包括设置在与预定焦平面共轭的表面的前后的两个光电管阵列 光学系统和第二光接收装置，其包括设置在与第一光接收装置中的光电池阵列之一共轭的表面处的至少一个光电池阵列。 基于第二光接收装置中的至少一个光电管阵列的输出和第一光接收装置中的第一光接收装置中具有与第二光接收中的光电管阵列共轭的关系的光电管阵列，检测表示光学图像的水平移动的第一信号 设备。 基于第一光接收装置中的两个光电管阵列的输出检测表示散焦量的图像的第二信号，从而通过第一和第二信号检测对焦条件。

公开(公告)号：US4540881A

公开(公告)日：1985-09-10

申请号：US361435

申请日：1982-03-24

申请人： Asao Hayashi ,  Masahiro Aoki ,  Kenichi Oinoue ,  Masatoshi Ida

发明人： Asao Hayashi ,  Masahiro Aoki ,  Kenichi Oinoue ,  Masatoshi Ida

IPC分类号： G02B7/36 ,  G02B7/38 ,  G01J1/20

CPC分类号： G02B7/38

摘要： A method of detecting focusing conditions used for optical machinery is disclosed. The focusing conditions of an optical image projected onto photodetector arrays arranged on both sides of the focal plane with a certain optical distance are detected based on an evaluation function representing a sum of absolute values of differences between output signals of adjacent photodetectors. When a value of a first evaluation function represented by the largest absolute value is less than a predetermined threshold a second evaluation function represented by a sum of the maximum and next largest absolute values is used thereby detecting the focusing conditions for a graded image.

摘要翻译： 公开了一种检测用于光学机械的聚焦条件的方法。 基于表示相邻光电检测器的输出信号之间的差的绝对值之和的评估函数，检测投影到具有特定光学距离的焦平面两侧的光电检测器阵列上的光学图像的聚焦条件。 当由最大绝对值表示的第一评估函数的值小于预定阈值时，使用由最大和最大绝对值的和表示的第二评估函数，从而检测分级图像的聚焦条件。

公开(公告)号：US4492449A

公开(公告)日：1985-01-08

申请号：US499491

申请日：1983-05-31

申请人： Kenichi Oinoue ,  Asao Hayashi ,  Junichi Nakamura ,  Masatoshi Ida ,  Masahiro Aoki ,  Kenji Fukuoka

发明人： Kenichi Oinoue ,  Asao Hayashi ,  Junichi Nakamura ,  Masatoshi Ida ,  Masahiro Aoki ,  Kenji Fukuoka

IPC分类号： G03B13/36 ,  G02B7/34 ,  G02B7/38 ,  G11B7/09 ,  G03B7/099

CPC分类号： G02B7/38

摘要： In a method and apparatus for detecting focus condition of an imaging optical system, the focus condition is detected in accordance with a combination of two different detection methods such as an image sharpness detection and an image lateral shift detection by using first and second light receiving element arrays for the image sharpness detection and a third light receiving element array for the image lateral shift detection. For making the construction of the apparatus compact and simple, these light receiving element arrays are formed on the same semiconductor substrate. Further a light flux dividing prism and a lenticular lens array are formed integrally with each other. According to the focus detection method of the present invention, it is possible to detect the focus condition for various kinds of subjects accurately over a wide range by using both the image sharpness detection and image lateral shift detection even in a range near an in-focus position.

摘要翻译： 在用于检测成像光学系统的聚焦条件的方法和装置中，根据两种不同的检测方法（诸如图像清晰度检测和图像横向偏移检测）的组合，通过使用第一和第二光接收元件 用于图像锐度检测的阵列和用于图像横向移位检测的第三光接收元件阵列。 为了使设备的结构紧凑且简单，这些光接收元件阵列形成在相同的半导体衬底上。 此外，光束分割棱镜和双凸透镜阵列彼此一体地形成。 根据本发明的焦点检测方法，即使在接近焦点的范围内也可以通过使用图像锐度检测和图像横向偏移检测两者在宽范围内精确地检测各种被摄体的聚焦条件 位置。

公开(公告)号：US4443079A

公开(公告)日：1984-04-17

申请号：US426898

申请日：1982-09-29

申请人： Kenichi Oinoue ,  Asao Hayashi ,  Masatoshi Ida ,  Masahiro Aoki ,  Junichi Nakamura ,  Kenji Fukuoka

发明人： Kenichi Oinoue ,  Asao Hayashi ,  Masatoshi Ida ,  Masahiro Aoki ,  Junichi Nakamura ,  Kenji Fukuoka

IPC分类号： G03B13/36 ,  G02B7/34 ,  G02B27/10 ,  G03B3/00

CPC分类号： G02B27/1066 ,  G02B27/126 ,  G02B7/343

摘要： A focus condition of an objective lens is detected on the basis of a lateral shift of two images formed by first and second light fluxes which are transmitted through right- and left-hand halves of the lens, respectively. In order to separate the first and second light fluxes, there is arranged an array of triangle prisms each having first and second surfaces which are inclined symmetrically with respect to the optical axis of lens by a critical angle so that one of the light fluxes is transmitted through the one of the surfaces, but is totally reflected by the other surface of each prism. The first and second light fluxes transmitted through the prisms are received by an array of light receiving elements in such a manner that the first and second light fluxes are selectively received by odd and even numbered light receiving elements, respectively.

摘要翻译： 基于通过透镜的右半部和左半部分分别透射的第一和第二光束形成的两个图像的横向偏移来检测物镜的聚焦条件。 为了分离第一和第二光束，布置有三角形棱镜阵列，每个棱镜具有相对于透镜的光轴对称地倾斜临界角度的第一和第二表面，使得光束中的一个被透射 通过一个表面，但是被每个棱镜的另一个表面全部反射。 通过棱镜透射的第一和第二光束被光接收元件阵列接收，使得第一和第二光束分别被奇数和偶数编号的光接收元件选择性地接收。

公开(公告)号：US4381941A

公开(公告)日：1983-05-03

申请号：US246859

申请日：1981-03-23

申请人： Naoya Ito ,  Takeshi Yoshida ,  Masahiro Aoki ,  Masao Okubo ,  Masayoshi Miki

发明人： Naoya Ito ,  Takeshi Yoshida ,  Masahiro Aoki ,  Masao Okubo ,  Masayoshi Miki

IPC分类号： C21C7/04 ,  C21C7/00 ,  C22C38/48 ,  C22C38/50 ,  C22C38/58 ,  C22C33/00

CPC分类号： C22C38/50 ,  C21C7/0006 ,  C22C38/48 ,  C22C38/58

摘要： A method for improving surface defect of specific steel resistant to concentrated nitric acid, wherein the specific steel in a molten state, either a stainless steel comprising C.ltoreq.0.1 wt %, 2.5.ltoreq.Si.ltoreq.5 wt %, Mn.ltoreq.2 wt %,15.ltoreq.Cr.ltoreq.20 wt %, 10.ltoreq.Ni.ltoreq.22 wt %,C.times.10.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2.5 wt %,the balance being iron and inevitable impurities,or a high-silicon-nickel-chromium steel comprisingC.ltoreq.0.03 wt %, 5.ltoreq.Si.ltoreq.7 wt %, Mn.ltoreq.10 wt %,7.ltoreq.Cr.ltoreq.16 wt %, 10.ltoreq.Ni.ltoreq.19 wt %,C.times.4.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2 wt %,the balance being iron and inevitable impurities,is admixed with titanium (0.05.ltoreq.Ti.ltoreq.0.2 wt %) when producing said steel.

摘要翻译： 一种改善对浓硝酸耐腐蚀的特种钢的表面缺陷的方法，其中熔融状态的特定钢，包括C≤0.1重量％，2.5≤Si≤5重量％的不锈钢，Mn Nb，Ta和Zr中的至少一种2.5重量％，25重量％，15重量％，20重量％，10重量％ ，余量为铁和不可避免的杂质，或包含C <0.03重量％，5≤Si≤7重量％，Mn <10重量％，7重量％ / = Cr <16wt％，10≤Ni≤19wt％，Cx4 = Nb，Ta和Zr中的至少一种2wt％，余量为铁和不可避免的杂质， 在制造所述钢时与钛（0.05≤Ti≤0.2wt％）混合。