公开(公告)号：US20060112320A1

公开(公告)日：2006-05-25

申请号：US11095222

申请日：2005-03-31

Applicant: Kedarnath Balakrishnan ,  Seongmoon Wang ,  Srimat Chakradhar

Inventor： Kedarnath Balakrishnan ,  Seongmoon Wang ,  Srimat Chakradhar

IPC: G01R31/28 ,  G06F11/00

CPC classification number: G01R31/318335 ,  G01R31/318371

Abstract: The present invention is directed to a logic testing architecture with an improved decompression engine that compresses the seeds of a linear test pattern generator in a manner that is independent of the test pattern set.

Abstract translation: 本发明涉及具有改进的解压缩引擎的逻辑测试架构，其以独立于测试模式集的方式压缩线性测试模式发生器的种子。