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    Conductive components in an insulator layer of a touch sensor stackup
    13.
    发明授权
    Conductive components in an insulator layer of a touch sensor stackup 有权

    公开(公告)号：US11036341B1

    公开(公告)日：2021-06-15

    申请号：US16578206

    申请日：2019-09-20

    Applicant: Apple Inc.

    Inventor： Alexandre Gourevitch ,  Christophe Blondin ,  Christopher J. Butler

    IPC: G06F3/044

    Abstract: A plurality of metallic components (e.g., conductive rods) can be included within an insulator layer of a touch sensor panel. The metallic components included within the insulator layer can be electrically floating. The metallic components can increase a signal coupling strength across the thickness of the insulator layer. In some examples, the metallic components can have a uniform spacing and uniform physical dimensions. In some examples, the metallic components can provide increased signal coupling in areas directly above touch sensitive regions of underlying touch sensor electrodes. In some examples, the metallic components can pass through the insulator in a straight line that is normal to opposing surfaces of the insulator layer. In some examples, the metallic components can be flared or otherwise pass through the insulator along a path that is not straight and/or not orthogonal to opposing surfaces of the insulator layer.

    Self-calibration of force sensors and inertial compensation
    16.
    发明授权
    Self-calibration of force sensors and inertial compensation 有权

    公开(公告)号：US10139959B2

    公开(公告)日：2018-11-27

    申请号：US15038972

    申请日：2013-11-26

    Applicant: Apple Inc.

    Inventor： Christopher J. Butler ,  Martin P. Grunthaner ,  Peter W. Richards ,  Romain A. Teil ,  Sinan Filiz

    IPC: G06F3/041 ,  G01L1/14 ,  G06F1/16 ,  G06F3/044 ,  G01L25/00 ,  G06F3/0346

    Abstract: A method of calibrating a force sensor that includes an input surface and an array of sensing elements. The input has a number of test locations and is deformable under applied force. The force sensor is mounted in a predetermined test orientation. For each test location of the plurality of test locations on the input surface of the force sensor a predetermined test force to the test location. An element calibration value is measured for each sensing element of the array of sensing elements of the force sensor. An (x, y) deformation map of the input surface of the force sensor corresponding to the application of the predetermined test force to the test location is determined based on the measured element calibration values.

    Self-Calibration of Force Sensors and Inertial Compensation
    18.
    发明申请
    Self-Calibration of Force Sensors and Inertial Compensation 审中-公开
    力传感器的自校准和惯性补偿

    公开(公告)号：US20160378255A1

    公开(公告)日：2016-12-29

    申请号：US15038972

    申请日：2013-11-26

    Applicant: APPLE INC.

    Inventor： Christopher J. Butler ,  Martin P. Grunthaner ,  Peter W. Richards ,  Romain A. Teil ,  Sinan Filiz

    IPC: G06F3/041 ,  G06F3/044 ,  G06F3/0346 ,  G01L25/00 ,  G01L1/14

    CPC classification number: G06F3/0418 ,  G01L1/14 ,  G01L1/146 ,  G01L25/00 ,  G06F1/1694 ,  G06F3/0346 ,  G06F3/0412 ,  G06F3/0414 ,  G06F3/044

    Abstract: A method of calibrating a force sensor that includes an input surface and an array of sensing elements. The input has a number of test locations and is deformable under applied force. The force sensor is mounted in a predetermined test orientation. For each test location of the plurality of test locations on the input surface of the force sensor a predetermined test force to the test location. An element calibration value is measured for each sensing element of the array of sensing elements of the force sensor. An (x, y) deformation map of the input surface of the force sensor corresponding to the application of the predetermined test force to the test location is determined based on the measured element calibration values.

    Abstract translation: 一种校准包含输入表面和感测元件阵列的力传感器的方法。 输入具有多个测试位置，并且在施加的力下可变形。 力传感器以预定的测试方向安装。 对于力传感器的输入表面上的多个测试位置的每个测试位置，到测试位置的预定测试力。 测量力传感器的感测元件阵列的每个感测元件的元素校准值。 基于测量的元件校准值来确定对应于预定试验力施加到测试位置的力传感器的输入表面的（x，y）变形图。

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