Sensing Force and Press Location in Absence of Touch Information

    公开(公告)号:US20190102031A1

    公开(公告)日:2019-04-04

    申请号:US16143374

    申请日:2018-09-26

    Applicant: Apple Inc.

    Abstract: Disclosed are electronic devices and methods of their operation that use force sensors to detect user applied forces on an input surface and determine their locations on the input surface, using only force sensors. The locations may be determined using weighted averages of the positions of the force sensors and their values. The methods may compare dynamically updated baseline force values to received force sensor values to distinguish user applied forces from changes in the force sensor values caused other sources. After detection of a user applied force, the baseline force values are frozen, and the force sensor values used to find the location on the input surface where the user applied the force. The electronic device can operate according to a state space model, with a first state in which there is no user applied force, and a second state in which there is user applied force.

    Wireless Charging System With Machine-Learning-Based Foreign Object Detection

    公开(公告)号:US20190074730A1

    公开(公告)日:2019-03-07

    申请号:US15875287

    申请日:2018-01-19

    Applicant: Apple Inc.

    Abstract: A wireless power transmission system has a wireless power receiving device with a wireless power receiving coil that is located on a charging surface of a wireless power transmitting device with a wireless power transmitting coil array. Control circuitry in the wireless power transmitting device may use inverter circuitry to supply alternating-current signals to coils in the coil array, thereby transmitting wireless power signals. The control circuitry may also be used to detect foreign objects on the coil array such as metallic objects without wireless power receiving coils. For example, control circuitry may use inductance measurements from the coils in the coil array to determine a probability value indicative of whether a foreign object is present on the charging surface. The control circuitry may compare the probability value to a threshold and take suitable action in response to the comparison.

    Drift compensation for force sensing devices

    公开(公告)号:US09885627B2

    公开(公告)日:2018-02-06

    申请号:US14696043

    申请日:2015-04-24

    Applicant: Apple Inc.

    CPC classification number: G01L25/00

    Abstract: Disclosed herein are methods and systems for compensating for drift that may be present in a force sensing device. In some embodiments, the force sensing device may be calibrated to compensate for the drift. The calibration may include receiving an input waveform associated with a received amount of force on the force sensing device. A system model that approximates a transfer function that provides an output waveform associated with the input waveform is then determined. Using the system model, an inverse transfer function associated with the system model is also determined. The inverse transfer function may then be applied to the output waveform which compensates for the drift.

    Spatial phase estimation for optical encoders

    公开(公告)号:US09797753B1

    公开(公告)日:2017-10-24

    申请号:US14601153

    申请日:2015-01-20

    Applicant: Apple Inc.

    CPC classification number: G01D5/3473 G01B11/26 G01D5/34715

    Abstract: Rotary encoders suitable for inclusion within small form factor devices (e.g., as input devices to small form factor electronic devices) are disclosed. In one aspect, a light source can illuminate a pattern on a rotatable shaft in order to reflect the pattern onto an array of optical sensors. Each optical sensor from the array of optical sensors can be polled at the same time to yield a snapshot vector. The snapshot vector can be projected onto a subspace spanned by two vectors selected in part on the pattern of the rotatable shaft and the distance separating the shaft and array. The resulting projection can be used to determine error and phase of the reflected pattern across the array of optical sensors. The phase of the reflected pattern can correlate to rotation of the shaft.

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