SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATION THEREOF WITH MIXED METAL TYPES
    14.
    发明申请
    SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATION THEREOF WITH MIXED METAL TYPES 有权
    半导体结构及其与混合金属类型的制备方法

    公开(公告)号:US20110309450A1

    公开(公告)日:2011-12-22

    申请号:US12960266

    申请日:2010-12-03

    IPC分类号: H01L27/092 H01L21/8238

    摘要: A semiconductor structure includes a first PMOS transistor element having a gate region with a first gate metal associated with a PMOS work function and a first NMOS transistor element having a gate region with a second metal associated with a NMOS work function. The first PMOS transistor element and the first NMOS transistor element form a first CMOS device. The semiconductor structure also includes a second PMOS transistor that is formed in part by concurrent deposition with the first NMOS transistor element of the second metal associated with a NMOS work function to form a second CMOS device with different operating characteristics than the first CMOS device.

    摘要翻译: 半导体结构包括具有栅极区域的第一PMOS晶体管元件,栅极区域与PMOS功能相关联的第一栅极金属和具有与NMOS功能相关联的第二金属的栅极区域的第一NMOS晶体管元件。 第一PMOS晶体管元件和第一NMOS晶体管元件形成第一CMOS器件。 该半导体结构还包括第二PMOS晶体管,该第二PMOS晶体管部分地通过与NMOS功能相关联的第二金属的第一NMOS晶体管元件并行形成,以形成具有与第一CMOS器件不同的工作特性的第二CMOS器件。