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11.发明授权公开(公告)号：US10319651B2
公开(公告)日：2019-06-11
申请号：US15680328
申请日：2017-08-18
Inventor： Yong Wang , Jaeyoung Joo , Hongyan Guo , Yang Yu , Cheong Yo Seop , Zongtian Xie , Zengyang Jiang , Cundui Tang , Huailiang Wu
Abstract: The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.
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12.发明申请公开(公告)号：US20180197798A1
公开(公告)日：2018-07-12
申请号：US15680328
申请日：2017-08-18
Inventor： Yong Wang , Jaeyoung Joo , Hongyan Guo , Yang Yu , Cheong Yo Seop , Zongtian Xie , Zengyang Jiang , Cundui Tang , Huailiang Wu
CPC classification number: H01L22/32 , H01L22/14 , H01L27/124
Abstract: The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.
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公开(公告)号：US12190800B2
公开(公告)日：2025-01-07
申请号：US18246047
申请日：2022-05-31
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Baoyun Wu , Yang Yu , Yuanzhang Zhu , Xuesong Tian , Xinbin Han , Shiming Shi , Hui Zhao , Hualing Yang
IPC: G09G3/3225 , G09G3/20 , G09G3/3266
Abstract: A display controller, a display device, a display system, and a control method are provided. The display controller includes: a flag-signal circuit configured to send a flag-signal to an application processor; an image processing circuit configured to obtain second current image data in response to receiving first current image data from the application processor, wherein the first current image data is sent by the application processor in response to receiving the flag-signal sent from the flag-signal circuit; and a drive circuit configured to generate a first drive control signal in response to receiving the second current image data from the image processing circuit.
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公开(公告)号：US20240414944A1
公开(公告)日：2024-12-12
申请号：US18810259
申请日：2024-08-20
Inventor： Bingqiang Gui , Yang Yu , Peng Huang , Tao Gao , Wenqiang Li , Ke Liu
IPC: H10K59/121 , H10K50/86 , H10K59/12
Abstract: A display substrate is provided, including: a base substrate, and a first semiconductor layer, a first conductive layer, a second semiconductor layer and a fourth conductive layer sequentially arranged on the base substrate. The display substrate includes first and third transistors. The first transistor includes a first active layer in the second semiconductor layer, and first bottom and top gate electrodes respectively on opposite sides of the first active layer. The third transistor includes a third active layer in the first semiconductor layer and a third gate electrode, the third active layer containing a polysilicon semiconductor material. The fourth conductive layer is on a side of the first top gate electrode away from the base substrate, and includes second and third conductive components. The first transistor is electrically connected to the third gate electrode of the third transistor through the second and third conductive components.
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公开(公告)号：US12112700B2
公开(公告)日：2024-10-08
申请号：US18273788
申请日：2022-07-29
Inventor： Tianyi Cheng , Haigang Qing , Hongda Cui , Sifei Ai , Guowei Zhao , Yang Yu , Li Wang , Baoyun Wu
IPC: G09G3/3233
CPC classification number: G09G3/3233 , G09G2310/061 , G09G2310/08
Abstract: Disclosed is a pixel circuit arranged in a display substrate, which comprises a first driving mode and a second driving mode. Content displayed in the display substrate comprises multiple display frames. In the first driving mode and the second driving mode, the display frames comprise refresh frames. A signal of a second scanning line is the same as that of a third scanning line. The time of which the signal of the second scanning line is an active level signal comprises a first refresh time period, a second refresh time period and a third refresh time period, which sequentially occur at intervals. During the second refresh time period, a signal of a first scanning line is an inactive level signal. The voltage of a signal at a reset voltage end is a positive voltage, and the voltage of a signal at a first initial voltage end is a negative voltage.
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Patent Agency Ranking
公开(公告)号：US11532252B2
公开(公告)日：2022-12-20
申请号：US17512494
申请日：2021-10-27
Inventor： Wenjin Cheng , Yang Yu , Zongtian Xie , Huoying Fu , Huailiang Wu
IPC: G09G3/00
Abstract: Disclosed are a test signal access board and a lighting jig, including: a substrate layer; and a data signal access part arranged on the substrate layer and including at least two rows of conductive contacts, where the conductive contacts are configured to be electrically connected with data signal test leads of a display panel; the conductive contacts in adjacent rows are arranged in a staggered manner; and a staggered pitch between the conductive contacts in adjacent rows is less than a pitch between the data signal test leads of the display panel.
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公开(公告)号：US10908467B2
公开(公告)日：2021-02-02
申请号：US16522854
申请日：2019-07-26
Inventor： Lang Hu , Kaiqiang Li , Yang Yu , Chaolei Wang , Nannan Rong , Yaohua Jiang , Qiulin Wu , Baohao Zhang
IPC: G02F1/1362 , G02F1/1368
Abstract: The present disclosure provides an array substrate and a method for repairing the same, and a display panel. The array substrate includes gate lines extending in a first direction, and data lines and common electrode lines extending in a second direction. The gate lines intersect with the common electrode lines and the data lines to define pixel units. Every two adjacent pixel units at two sides of a common electrode line constitute a pixel unit group. Common electrodes of two pixel units in a pixel unit group are each connected to a common electrode line therebetween. The array substrate further includes a repairing structure including a first repairing line, a second repairing line at two sides of a data line, respectively, and a middle line intersecting with the data line and connecting a first point of the first repairing line and a second point of the second repairing line.
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公开(公告)号：US09966699B1
公开(公告)日：2018-05-08
申请号：US15679120
申请日：2017-08-16
Inventor： Shaoning Liu , Guofeng Hu , Guoqiang Liu , Weidong Lin , Xiaowen Xu , Yunxiang Jiao , Mingda Zhang , Yang Liu , Feng Wang , Weihua Cao , Liangliang Hu , Yantao Li , Dahai Liu , Jian Ma , Shijie Wang , Xiaobo Wang , Zhuangzhuang Wu , Zhenguo Xing , Yang Yu , Xing Zhang
IPC: H01R13/64 , H01R13/631 , H01R13/629 , H01F7/02
CPC classification number: H01R13/6315 , H01F7/02 , H01R13/62933 , H01R2201/20
Abstract: Embodiments of the present invention provide a press tool and an electronic product detecting apparatus including the press tool. The press tool includes: a connector soft-contact member including: a first base plate; a floating plate mounted to the first base plate; and a buffer member mounted between the first base plate and the floating plate and configured such that when receiving a pressing force, the buffer member generates a repulsive force, so that the floating plate is floatable; and a press member connected with the connector soft-contact member such that they are openable and closable relative to each other. The press member includes a second base plate and a connector bearing piece which is mounted to the second base plate and which is positioned just opposite to the floating plate when the connector soft-contact member and the press member are closed.
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公开(公告)号：US12027114B2
公开(公告)日：2024-07-02
申请号：US17763364
申请日：2021-04-15
Applicant: BOE Technology Group Co., Ltd.
Inventor： Yang Yu
IPC: G09G3/32 , G09G3/3225 , G09G3/36 , G11C19/28
CPC classification number: G09G3/3225 , G11C19/28 , G09G2300/0408 , G09G2300/0426 , G09G2300/0819 , G09G2300/0842 , G09G2310/0286 , G09G2310/0297 , G09G2310/061 , G09G2310/08 , G09G2320/0233 , G09G2330/021
Abstract: The present disclosure provides a pixel driving circuit, a driving method thereof, and a display device. In the pixel driving circuit, a first terminal of a first storage sub-circuit is connected to a control terminal; a power control sub-circuit is connected to a light-emitting control signal line, a first power line and a first terminal of the driving sub-circuit; a compensation sub-circuit is connected to a first gate line, a control terminal and a first terminal of the driving sub-circuit; a data writing-in sub-circuit is connected to a second terminal of the first storage sub-circuit; a first reset sub-circuit is connected to a reset signal line, a first power line and the control terminal of the driving sub-circuit; a first control sub-circuit is connected to the first gate line, an initialization signal line and the second terminal of the driving sub-circuit.
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20.发明授权公开(公告)号：US11961433B2
公开(公告)日：2024-04-16
申请号：US17406264
申请日：2021-08-19
Inventor： Xin Fang , Duosi Tang , Yang Yu , Wenchao Wang
IPC: G09G3/00 , G02F1/1362 , G09G3/36
CPC classification number: G09G3/006 , G02F1/136254 , G02F1/136286 , G09G3/3688 , G09G2330/12
Abstract: A detection structure, a display panel, a detection device and a detection system, the detection structure is located in display panel, and the detection structure includes test units and groups of first connecting lines; each of the test units includes chip bonding part, test pin parts located at chip bonding part, and groups of second connecting lines; in each test units, first end of each group in groups of second connecting lines is connected with test pin parts, and second end of each group of second connecting lines is connected with chip bonding part; in two adjacent test units in test units, two adjacent test pin parts are respectively connected with first end and second end of one group of first connecting lines; and when detection structure is used in lightening test, at least two test units arranged at intervals are configured for being electrically connected with detection device respectively.
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