Apparatus for Hardening a Static Random Access Memory Cell from Single Event Upsets
    11.
    发明申请
    Apparatus for Hardening a Static Random Access Memory Cell from Single Event Upsets 有权
    用于从单事件颠覆硬化静态随机存取存储器单元的装置

    公开(公告)号:US20080205112A1

    公开(公告)日:2008-08-28

    申请号:US11678097

    申请日:2007-02-23

    CPC classification number: G11C11/4125

    Abstract: A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.

    Abstract translation: 公开了在静态随机存取存储器中使用的单个事件镦粗(SEU)硬化存储单元。 SEU硬化存储单元包括以交叉耦合方式彼此连接的第一反相器和第二反相器。 SEU硬化存储单元还包括第一电阻器,第二电阻器和电容器。 第一电阻器连接在第一反相器的输入端和第二反相器的输出端之间。 第二电阻器连接在第二反相器的输入端和第一反相器的输出端之间。 电容器连接在第一反相器的输入端和第二反相器的输入端之间。

    Self-equalized low power precharge sense amp for high speed SRAMs
    13.
    发明授权
    Self-equalized low power precharge sense amp for high speed SRAMs 有权
    用于高速SRAM的自平衡低功率预充电检测放大器

    公开(公告)号:US06301179B1

    公开(公告)日:2001-10-09

    申请号:US09570064

    申请日:2000-05-12

    Inventor: David C. Lawson

    CPC classification number: G11C7/067 G11C11/419

    Abstract: In a sense amplifier for reading out memory cells of a memory comprising a set of P-FETs and N-FETs, complementary input signals received from the memory cell being read out are applied to input junctions connected to gates of N-FETs. The input junctions are charged to 0.8 volts by a precharging circuit comprising P-FETs connecting the input junctions to ground and an N-FET shunting the input junctions together. The P-FETs and N-FETs of the precharging circuit are rendered conductive between memory cells readouts to precharge the input junctions and are rendered nonconducting during memory cell readouts. A second precharging circuit precharges an output junction of the sense amplifier circuit. The output junction is connected to an output amplification stage including a CMOS circuit. Because of the low equalization voltage to which the input junctions are precharged, the time to precharge the input junctions is dramatically reduced and a reduction in the memory access time is achieved.

    Abstract translation: 在用于读出包含一组P-FET和N-FET的存储器的存储单元的读出放大器中,从读出的存储单元接收的互补输入信号被施加到与N-FET的栅极连接的输入结。 通过包括将输入结连接到地的P-FET的预充电电路将输入结充电到0.8伏,并将N-FET将输入结分流在一起。 预充电电路的P-FET和N-FET在存储器单元读出之前被导通,以对输入结进行预充电,并且在存储器单元读出期间变为非导通。 第二预充电电路对读出放大器电路的输出结进行预充电。 输出端连接到包括CMOS电路的输出放大级。 由于输入接点预充电的低均衡电压,大大降低了对输入接点进行预充电的时间,并且实现了存储器访问时间的减少。

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