SOLDER PRINTING INSPECTION DEVICE, SOLDER PRINTING INSPECTION METHOD AND METHOD OF MANUFACTURING SUBSTRATE

    公开(公告)号:US20190357361A1

    公开(公告)日:2019-11-21

    申请号:US16527947

    申请日:2019-07-31

    Abstract: A solder printing inspection device that is placed on an upstream side of a component mounting machine that mounts an electronic component on solder that is printed on a substrate by a solder printing machine, and that inspects the solder on the substrate on which a thermosetting adhesive is applied, the solder printing inspection device including: an irradiator that irradiates the solder with light; an imaging device that takes an image of the irradiated solder; a processor that: generates actual solder position information of a solder group that the electronic component is mounted on based on the image, wherein the solder group includes two or more solders; generates, based on design data or manufacturing data, ideal solder inspection reference information indicating a reference inspection position and/or a reference inspection range of the solder included in the solder group; outputs mounting position adjustment information to the component mounting machine.

    THREE-DIMENSIONAL MEASUREMENT DEVICE
    12.
    发明申请

    公开(公告)号:US20180313645A1

    公开(公告)日:2018-11-01

    申请号:US16014515

    申请日:2018-06-21

    CPC classification number: G01B11/2527 G01B11/02 G06T7/521 G06T7/55

    Abstract: A three-dimensional measurement device includes: a projector including: a light source that emits a predetermined light; a grid that converts the light from the light source into a predetermined striped pattern; and a driver that moves the grid, and the projector projecting the striped pattern onto a measurement object; an imaging device that takes an image of the measurement object on which the striped pattern is projected; and a controller that: controls the projector and the imaging device to obtain a plurality of image data having different light intensity distributions; executes three-dimensional measurement of the measurement object by phase shifting based on the image data having different light intensity distributions; and obtains each of the image data among the image data having different light intensity distributions.

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