摘要:
A silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) sense amplifier is provided with improved matching characteristics and sense point tolerance under no penalty of performance degradation. The sense amplifier includes a silicon-on-insulator (SOI) field effect transistor. A flooding field effect transistor is coupled to a body of the silicon-on-insulator (SOI) field effect transistor. The flooding field effect transistor is activated before the sense amplifier is set. The flooding field effect transistor has an opposite polarity of the silicon-on-insulator (SOI) field effect transistor. The flooding field effect transistor provides a charging path to a voltage supply rail. A pair of flooding field effect transistors serve as charging to voltage supply rail elements for silicon-on-insulator (SOI) field effect transistors on each side of complementary bitline structures of the sense amplifier. The flooding field effect transistor is substantially smaller than the silicon-on-insulator (SOI) field effect transistor.
摘要:
Methods and apparatus are provided for varying one or more of a supply voltage and reference voltage in an integrated circuit, using independent control of a diode voltage in an asymmetrical double-gate device. An integrated circuit is provided that is controlled by one or more of a supply voltage and a reference voltage. The integrated circuit comprises an independently controlled asymmetrical double-gate device to adjust one or more of the supply voltage and the reference voltage. The independent control may comprise, for example, a back gate bias. The independently controlled asymmetrical double-gate device may be employed in a number of applications, including voltage islands, static RAM, and to improve the power and performance of a processing unit.
摘要:
Methods and apparatus are provided to ensure functionality and timing robustness in silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) circuits. A select signal for the SOI CMOS circuit is received. A floating body charge monitoring circuit is coupled to the SOI CMOS circuit for monitoring excess body charges in at least one predefined SOI device and providing an output control signal. A select signal adjusting circuit is coupled to the floating body charge monitoring circuit receiving the output control signal and the select signal and providing a conditionally adjusted select signal responsive to the output control signal of the floating body charge monitor circuit. The conditionally adjusted select signal is applied to the SOI CMOS circuit. The conditionally adjusted select signal provided by the select signal adjusting circuit responsive to the output control signal of the floating body charge monitor circuit includes a predefined delay at the trailing edge of the select signal extending the select signal pulse width. The conditionally adjusted select signal includes a shortened select signal pulse having a predefined delay at the rising edge of the select signal. The conditionally adjusted select signal includes a substantially unchanged select signal pulse width with a predefined delay of the rising edge of the select signal.
摘要:
A silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) Schmitt trigger circuit with controllable hysteresis and a method are provided for adapting a CMOS Schmitt trigger circuit for deep sub-micrometer partially depleted SOI (PD/SOI) applications. A SOI CMOS Schmitt trigger circuit with controllable hysteresis includes a stack of a plurality of field effect transistors (FETs) connected in series between a voltage supply and ground. An input is applied to a gate of each of the stack of the plurality of field effect transistors (FETs). The stack of the plurality of field effect transistors (FETs) provides an output at a junction of a predetermined pair of the plurality of field effect transistors (FETs). At least one feedback field effect transistor (FET) has a source coupled a junction of a predefined pair of the stack of field effect transistors (FETs) and has a gate coupled to the output. A FET body of each of the stack of the plurality of field effect transistors (FETs) is connected to a voltage supply rail. The stack of the plurality of field effect transistors (FETs) includes a plurality of P-channel field effect transistors (PFETs) and a plurality of N-channel field effect transistors (NFETs). The FET body of each of the plurality of P-channel field effect transistors (PFETs) is connected to a positive voltage supply rail and the FET body of each of the plurality of N-channel field effect transistors (NFETs) is connected to a voltage supply ground rail. The FET body of a P-channel feedback field effect transistor (PFET) is connected to one of a positive voltage supply rail, the gate or the source of the feedback PFET. The FET body of a N-channel feedback field effect transistor (NFET) is connected to one of a voltage supply ground rail, the gate or the source of the feedback NFET. A successive switching threshold adjustment technique is provided. Additional successive switching threshold adjustment is achieved by successive tapping of NFET or PFET feedback devices for the V+ or the V− trigger edges, respectively. With this arrangement, higher V+ and lower V− are realized without using excessively wide NFET or PFET feedback devices.
摘要:
An apparatus for improving device matching and switching point tolerance in a silicon-on-insulator cross-coupled circuit is disclosed. The silicon-on-insulator circuit includes first and second sets of transistors, first and second rails, and first and second discharge transistors. The first set of transistors is cross-coupled with the second set of transistors. The first rail is connected to each gate of the transistors in the first set, and the second rail is connected to each gate of the transistors in the second set. The body of at least one transistor within the first set of transistors is connected to the first discharge transistor having the same channel type as the connected transistor. The body of at least one transistor within the second set of transistors is connected to the second discharge transistor having the same channel type as the connected transistor. The gate of the first discharge transistor is controlled by the second rail, and the gate of the second discharge transistor is controlled by the first rail.