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43 条记录 (耗时 0.02 秒)

    Surface detect test apparatus
    11.
    发明授权
    Surface detect test apparatus 失效
    表面检测试验装置

    公开(公告)号：US4162126A

    公开(公告)日：1979-07-24

    申请号：US859206

    申请日：1977-12-09

    申请人： Yasuo Nakagawa ,  Toshimitsu Hamada

    发明人： Yasuo Nakagawa ,  Toshimitsu Hamada

    IPC分类号： G01N21/952 ,  G01N21/48

    CPC分类号： G01N21/952

    摘要： Apparatus and method for testing surface defect on an object are disclosed, which comprise an illumination means for illuminating collimated lights onto a surface of the object obliquely to the surface and from two symmetrical directions, a sensor composed of a TV camera or a linear image sensor for sensing diffused reflected lights from the surface of the object in the direction perpendicular to the surface, a classification means for discriminating the sensed image signal by a threshold level which is higher than an average level of the image signal and a threshold level which is lower than the average level to determine the surface defect pattern as a broken cavity pattern or a pit or crack pattern by the discriminated signals, and a discrimination means for calculating L.sup.2 -4.pi.S, where S is an area of the defect and L is a length of the contour, when signal discriminated by the lower threshold level is produced to discriminate the pit pattern and the crack pattern by determining whether L.sup.2 -4.pi.S exceeds a predetermined value or not. In this manner, the defects that exist on the surface of the object can be classified and evaluated.

    摘要翻译： 公开了一种用于测试物体上的表面缺陷的装置和方法，该装置和方法包括用于将准直光照射到物体表面上的表面和两个对称方向的照明装置，由TV照相机或线性图像传感器 用于在垂直于表面的方向上感测来自物体表面的漫反射光;分类装置，用于将感测到的图像信号鉴别出高于图像信号的平均电平的阈值电平和较低的阈值电平 比通过鉴别信号确定表面缺陷图案为断裂图案或凹坑或裂纹图案的平均水平，以及用于计算L2-4 pi S的鉴别装置，其中S是缺陷的面积，L是 当产生由较低阈值电平鉴别的信号时，轮廓的长度可通过确定wh来区分凹坑图案和裂纹图案 醚L2-4 pi S超过预定值。 以这种方式，可以分类和评估存在于物体表面上的缺陷。

    Pattern defects detection method and apparatus
    12.
    发明授权
    Pattern defects detection method and apparatus 失效
    图案缺陷检测方法和装置

    公开(公告)号：US4953224A

    公开(公告)日：1990-08-28

    申请号：US158125

    申请日：1988-02-16

    申请人： Toshiaki Ichinose ,  Takanori Ninomiya ,  Yasuo Nakagawa

    发明人： Toshiaki Ichinose ,  Takanori Ninomiya ,  Yasuo Nakagawa

    IPC分类号： G06T7/00 ,  G06K9/00

    CPC分类号： G06T7/0006 ,  G06T2207/30141

    摘要： A pattern defect detecting method and apparatus are disclosed on a connectivity processor to input a binary picture signal pattern and a pad position coordinate and outputting connectivity data between pads. Here, the connectivity processing refers to a processing for giving the identical number to one aggregation of connected or linked pads for the pads given to a serial pattern. In the connectivity processor wherein a plane on which the drawn pattern to be inspected is scanned by a linear sensor, the connectivity processing can be releazed almost concurrently with the scanning by driving a temporary memory.Also, a pattern defect detecting apparatus the above-mentioned connectivity. The invention processing coping with the difficulties of a required inspection level, and also represents a processing time of each embodiment theoretically. A moving time of the bed on which an inspecting object is placed and others are added to the real processing time.

    摘要翻译： 在连接性处理器上公开了一种图案缺陷检测方法和装置，用于输入二进制图像信号模式和焊盘位置坐标，并在焊盘之间输出连接数据。 这里，连接处理是指给予给予串行模式的焊盘的连接或连接焊盘的一个聚合相同数量的处理。 在其中通过线性传感器扫描要检查的绘制图案的平面的连接处理器中，可以通过驱动临时存储器几乎与扫描同时地进行连接处理。 此外，图案缺陷检测装置具有上述连接性。 本发明处理应对所需检查水平的困难，并且也表示理论上各实施例的处理时间。 检查对象被放置的床的移动时间和其他被添加到实际处理时间。

    Inspection method and apparatus for joint junction states
    13.
    发明授权
    Inspection method and apparatus for joint junction states 失效
    连接状态检查方法及装置

    公开(公告)号：US4641527A

    公开(公告)日：1987-02-10

    申请号：US707501

    申请日：1985-03-04

    申请人： Takashi Hiroi ,  Takanori Ninomiya ,  Yasuo Nakagawa

    发明人： Takashi Hiroi ,  Takanori Ninomiya ,  Yasuo Nakagawa

    IPC分类号： G01N21/956 ,  G01R31/02 ,  G01N29/04

    CPC分类号： G01R31/026 ,  G01N21/956 ,  G01N2021/479

    摘要： An object to be inspected which is jointed to a circuit board is vibrated in a contactless manner by applying a gas jet or a magnetic force to the object, a laser beam is irradiated on the object, and a laser beam reflected from the object is detected by a linear sensor to observe a laser speckle pattern for the object. Quality of a joint junction state of the object is judged from the laser speckle pattern.

    摘要翻译： 通过对物体施加气体射流或磁力，将被检查物体接触电路板以非接触的方式振动，激光束被照射在物体上，检测从物体反射的激光束 通过线性传感器观察物体的激光散斑图案。 从激光斑纹图案判断物体的接合连接状态的质量。

    Robot vision system
    16.
    发明授权
    Robot vision system 失效
    机器人视觉系统

    公开(公告)号：US4611292A

    公开(公告)日：1986-09-09

    申请号：US537095

    申请日：1983-09-29

    申请人： Takanori Ninomiya ,  Yasuo Nakagawa

    发明人： Takanori Ninomiya ,  Yasuo Nakagawa

    IPC分类号： B25J19/02 ,  G01B11/00 ,  G01S17/06 ,  G06T1/00 ,  G01B11/24 ,  G01B11/03 ,  G01B11/22

    CPC分类号： G01B11/00 ,  B25J19/023 ,  G01S17/06 ,  G06T1/0014

    摘要： A method and an apparatus for detecting the position and posture of an object (5, 9, 10) are characterized by two planar light beams (3a, 3b) alternately projected on the object (5, 9, 10) to be handled and intersection lines (A, B) formed between the two planar light beams (3a, 3b) and the object (5, 9, 10) which are imaged by a single image pickup device (2) positioned between the two planar light beams (3a, 3b).A bright line occurring at a junction between an edge of the object and an intersection line is separated, extracted and transformed into an actual coordinate in a three dimensional coordinate system (x, y, z) by referring to corresponding relationships between the actual coordinate system (x, y, z) and a scanning coordinate system (i, j) so that the position and posture of the object (5, 9, 10) are detected in three dimensions.

    摘要翻译： 用于检测物体（5,9,10）的位置和姿势的方法和装置的特征在于交替地投射在被处理物体（5,9,10）上的两个平面光束（3a，3b）被处理和交叉 由位于两个平面光束（3a，3b）之间的单个图像拾取装置（2）成像的两个平面光束（3a，3b）和物体（5,9,10）之间形成的线（A，B） 3b）。 通过参照实际坐标系（X，Y，Z）之间的对应关系，在物体的边缘与交叉线之间的连接处发生的亮线被分离，提取并变换为三维坐标系（x，y，z）中的实际坐标 （x，y，z）和扫描坐标系（i，j），从而以三维检测物体（5,9,10）的位置和姿势。

    Thermoplastic resin composition
    17.
    发明授权
    Thermoplastic resin composition 失效
    热塑性树脂组合物

    公开(公告)号：US3959407A

    公开(公告)日：1976-05-25

    申请号：US450905

    申请日：1974-03-13

    申请人： Toshiro Koshida ,  Yasuo Nakagawa

    发明人： Toshiro Koshida ,  Yasuo Nakagawa

    IPC分类号： C08L27/06 ,  C08L33/20 ,  C08L55/02 ,  C08L51/04

    CPC分类号： C08L27/06 ,  C08L55/02 ,  C08L33/20 ,  Y10T428/31696

    摘要： A vinyl chloride polymer composition consisting essentially of 60 to 40 % by weight of a vinyl chloride-propylene copolymer and 40 to 60 % by weight of at least one interpolymer selected from the group consisting of acrylonitrile-butadiene-styrene terpolymers and acrylonitrile-methyl methacrylate-butadiene-styrene quadripolymers. This composition has a heat deformation temperature of 75.degree. to 90.degree.C and is capable of easily giving by injection molding an article having a good surface appearance, a good gloss due to its excellent moldability and excellent impact resistance.

    摘要翻译： 一种氯乙烯聚合物组合物，其基本上由60至40重量％的氯乙烯 - 丙烯共聚物和40至60重量％的至少一种选自丙烯腈 - 丁二烯 - 苯乙烯三元共聚物和丙烯腈 - 甲基丙烯酸甲酯 丁二烯 - 苯乙烯四元共聚物。 该组合物的热变形温度为75-90℃，并且由于其优异的成型性和优异的耐冲击性，能够通过注射成型具有良好的表面外观，良好的光泽度的产品而容易地得到。

    Spectroradiometer
    18.
    发明授权
    Spectroradiometer 失效
    光谱仪

    公开(公告)号：US5497230A

    公开(公告)日：1996-03-05

    申请号：US334066

    申请日：1994-11-04

    申请人： Kazuaki Ohkubo ,  Yasuo Nakagawa

    发明人： Kazuaki Ohkubo ,  Yasuo Nakagawa

    IPC分类号： G01J3/02 ,  G01J3/18 ,  G01J3/28

    CPC分类号： G01J3/28

    摘要： Light having a wavelength equal to or less than the cut-off wavelength of a sharp-cut filter is cut off so that an output of a photo-sensitive device corresponds to a stray light component when a wavelength control device sets the wavelength equal to or less than the cut-off wavelength of the sharp-cut filter. By subtracting the stray light component from the output of the photo-sensitive device when the photo-sensitive device is to be measured an intensity of light having a predetermined wavelength, the stray light component can be removed from dispersion outputs of the spectroradiometer.

    摘要翻译： 切断具有等于或小于锐利截止滤光器的截止波长的波长的光，当波长控制装置将波长等于或等于或等于或等于其波长时，光敏装置的输出对应于杂散光分量 小于截止滤波器的截止波长。 当要对感光装置测量具有预定波长的光的强度时，通过从感光装置的输出中减去杂散光分量，可以从分光辐射计的色散输出中去除杂散光分量。