公开(公告)号：US20160314229A1

公开(公告)日：2016-10-27

申请号：US14695091

申请日：2015-04-24

Applicant: International Business Machines Corporation

Inventor： Jeanne P. Bickford ,  Eric A. Foreman ,  Mark W. Kuemerle ,  Susan K. Lichtensteiger

IPC: G06F17/50 ,  G06F1/10

CPC classification number: G06F17/5031 ,  G06F1/206 ,  G06F1/3206 ,  G06F1/324 ,  Y02D10/126 ,  Y02D10/16

Abstract: Disclosed are a system and method that control integrated circuit chip temperature using frequency scaling based on predetermined temperature-frequency settings. During integrated circuit chip operation, a controller causes a variable clock signal generator to adjust the frequency of a clock signal that coordinates operations of an integrated circuit chip based on the temperature of the integrated circuit chip and on predetermined temperature-frequency settings. The temperature-frequency settings are predetermined in order to ensure that the frequency of the clock signal, as adjusted, remains sufficiently high to meet a chip performance specification, but sufficiently low to prevent the temperature from rising above a predetermined maximum temperature in order to limit power consumption. Also disclosed is a method of generating such temperature-frequency settings during timing analysis.

Abstract translation: 公开了一种基于预定温度 - 频率设置使用频率缩放来控制集成电路芯片温度的系统和方法。 在集成电路芯片操作期间，控制器使可变时钟信号发生器基于集成电路芯片的温度和预定的温度 - 频率设置来调整协调集成电路芯片的操作的时钟信号的频率。 温度 - 频率设置是预先确定的，以确保调整后的时钟信号的频率保持足够高以满足芯片性能规格，但足够低以防止温度升高到高于预定最大温度以限制 能量消耗。 还公开了一种在定时分析期间产生这种温度 - 频率设置的方法。

公开(公告)号：US08963620B2

公开(公告)日：2015-02-24

申请号：US13948912

申请日：2013-07-23

Applicant: International Business Machines Corporation

Inventor： Jeanne P. S. Bickford ,  Eric A. Foreman ,  David J. Hathaway ,  Mark W. Kuemerle ,  Susan K. Lichtensteiger

IPC: H03L7/00 ,  G05F1/46

CPC classification number: G05F1/463 ,  H03L1/02

Abstract: Various embodiments include approaches for controlling a supply voltage or a clock frequency to an integrated circuit (IC). Various additional embodiments include circuitry for controlling a supply voltage or a clock frequency of an IC. In some cases, a method includes: locating a set of temperature sensors on bin locations in an IC; determining temperature bounds of the bin locations in the IC as a function of a determined temperature at the set of temperature sensors; determining timing constraints as a function of supply voltages at the bin locations and the determined temperature at the set of temperature sensors; and determining operational voltage bounds for the IC as a function of the determined temperature at the set of temperature sensors.

Abstract translation: 各种实施例包括用于控制集成电路（IC）的电源电压或时钟频率的方法。 各种附加实施例包括用于控制IC的电源电压或时钟频率的电路。 在一些情况下，一种方法包括：在IC中的仓位置上定位一组温度传感器; 确定IC中的仓位置的温度范围作为温度传感器组上确定的温度的函数; 确定作为所述仓位置处的供应电压的函数的时间约束和所述一组温度传感器处的确定的温度; 以及根据所述一组温度传感器上确定的温度确定所述IC的工作电压范围。