PHOTORESIST COMPOSITION, METHOD FOR PRODUCING PHOTORESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN
    11.
    发明申请
    PHOTORESIST COMPOSITION, METHOD FOR PRODUCING PHOTORESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN 审中-公开
    光电组合物,生产光电组合物的方法和形成电阻图案的方法

    公开(公告)号:US20130078571A1

    公开(公告)日:2013-03-28

    申请号:US13628115

    申请日:2012-09-27

    CPC classification number: G03F7/0392 G03F7/0046 G03F7/0397 G03F7/11 G03F7/2041

    Abstract: A photoresist composition includes a first polymer, a second polymer and a third polymer. The first polymer has a fluorine atom and a first structural unit that includes a hydrophilic group. The second polymer has a fluorine atom a second structural unit that includes an alkali-dissociable group. The third polymer has an acid-dissociable group. The first polymer, the second polymer and the third polymer are different with one another. It is preferred that the first structural unit is represented by a following formula, and the second structural unit is represented by a following formula (2).

    Abstract translation: 光致抗蚀剂组合物包括第一聚合物,第二聚合物和第三聚合物。 第一聚合物具有氟原子和包含亲水基团的第一结构单元。 第二聚合物具有氟原子,包括碱解离基团的第二结构单元。 第三聚合物具有酸解离基团。 第一聚合物,第二聚合物和第三聚合物彼此不同。 优选第一结构单元由下式表示,第二结构单元由下式(2)表示。

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