RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD, ACID GENERATOR AND COMPOUND
    5.
    发明申请
    RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD, ACID GENERATOR AND COMPOUND 有权
    辐射敏感性树脂组合物,抗蚀剂图案形成方法,酸发生器和化合物

    公开(公告)号:US20140342288A1

    公开(公告)日:2014-11-20

    申请号:US14282270

    申请日:2014-05-20

    Abstract: The present invention provides a radiation-sensitive resin composition that contains a polymer having a structural unit that includes an acid-labile group; and an acid generator, wherein the acid generator includes a compound including a sulfonate anion having SO3−, wherein a hydrogen atom or an electron-donating group bonds to an α carbon atom with respect to SO3−, and an electron-withdrawing group bonds to a β carbon atom with respect to SO3−; and a radiation-degradable onium cation. The compound preferably has a group represented by the following formula (1-1) or (1-2). In the following formulae (1-1) and (1-2), R1 and R2 each independently represent a hydrogen atom or a monovalent electron-donating group. R3 represent a monovalent electron-withdrawing group. R4 represents a hydrogen atom or a monovalent hydrocarbon group.

    Abstract translation: 本发明提供了含有具有包含酸不稳定基团的结构单元的聚合物的辐射敏感性树脂组合物, 和酸发生剂,其中酸产生剂包括包含具有SO 3 - 的磺酸根阴离子的化合物,其中氢原子或给电子基团相对于SO 3键与α碳原子键合,并且吸电子基团与 一个 碳原子相对于SO3-; 和辐射可降解的鎓阳离子。 该化合物优选具有下式(1-1)或(1-2)表示的基团。 在下式(1-1)和(1-2)中,R 1和R 2各自独立地表示氢原子或一价给电子基团。 R3表示一价吸电子基团。 R4表示氢原子或一价烃基。

    RADIATION-SENSITIVE COMPOSITION AND RESIST PATTERN-FORMING METHOD

    公开(公告)号:US20200041898A1

    公开(公告)日:2020-02-06

    申请号:US16595884

    申请日:2019-10-08

    Abstract: A radiation-sensitive composition includes particles and a solvent. The particles include a first component and a second component. The first component is a hydrolyzation product or a hydrolytic condensation product of a metal compound including a hydrolyzable group, or a combination thereof; and the second component is an organic acid, an anion of the organic acid, a first compound represented by formula (1), or a combination thereof. The organic acid and the first compound each have a molecular weight of no less than 120. In the formula (1), R1 represents an organic group having a valency of n; X represents an alcoholic hydroxyl group, —NCO or —NHRa, wherein Ra represents a hydrogen atom or a monovalent organic group; and n is an integer of 2 to 4.

    RESIST COMPOSITION, RESIST PATTERN-FORMING METHOD, AND RESIST SOLVENT
    8.
    发明申请
    RESIST COMPOSITION, RESIST PATTERN-FORMING METHOD, AND RESIST SOLVENT 有权
    耐蚀组合物,抗蚀图案形成方法和耐溶剂

    公开(公告)号:US20140302438A1

    公开(公告)日:2014-10-09

    申请号:US14247449

    申请日:2014-04-08

    CPC classification number: G03F7/038 G03F7/0045 G03F7/0048 G03F7/039 G03F7/0397

    Abstract: A resist composition includes a polymer that includes an acid-labile group-containing structural unit, a photoacid generator, and a solvent. The solvent includes a compound that includes a ketonic carbonyl group and an alcoholic hydroxyl group. The alcoholic hydroxyl group is preferably a tertiary alcoholic hydroxyl group. The solvent preferably further includes an alkylene glycol monoalkyl ether carboxylate.

    Abstract translation: 抗蚀剂组合物包括含有酸不稳定基团的结构单元,光致酸发生剂和溶剂的聚合物。 溶剂包括包含酮羰基和醇羟基的化合物。 醇羟基优选为叔醇羟基。 溶剂优选还包括亚烷基二醇单烷基醚羧酸酯。

    PHOTORESIST COMPOSITION, METHOD FOR PRODUCING PHOTORESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN
    9.
    发明申请
    PHOTORESIST COMPOSITION, METHOD FOR PRODUCING PHOTORESIST COMPOSITION, AND METHOD FOR FORMING RESIST PATTERN 审中-公开
    光电组合物,生产光电组合物的方法和形成电阻图案的方法

    公开(公告)号:US20130078571A1

    公开(公告)日:2013-03-28

    申请号:US13628115

    申请日:2012-09-27

    CPC classification number: G03F7/0392 G03F7/0046 G03F7/0397 G03F7/11 G03F7/2041

    Abstract: A photoresist composition includes a first polymer, a second polymer and a third polymer. The first polymer has a fluorine atom and a first structural unit that includes a hydrophilic group. The second polymer has a fluorine atom a second structural unit that includes an alkali-dissociable group. The third polymer has an acid-dissociable group. The first polymer, the second polymer and the third polymer are different with one another. It is preferred that the first structural unit is represented by a following formula, and the second structural unit is represented by a following formula (2).

    Abstract translation: 光致抗蚀剂组合物包括第一聚合物,第二聚合物和第三聚合物。 第一聚合物具有氟原子和包含亲水基团的第一结构单元。 第二聚合物具有氟原子,包括碱解离基团的第二结构单元。 第三聚合物具有酸解离基团。 第一聚合物,第二聚合物和第三聚合物彼此不同。 优选第一结构单元由下式表示,第二结构单元由下式(2)表示。

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