摘要:
A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.
摘要:
A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.
摘要:
A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.
摘要:
A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.
摘要:
A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.
摘要:
A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.
摘要:
A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.
摘要:
A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.
摘要:
A scanning unit for an optical position-measuring device includes a semiconductor light source and at least one downstream reflector element that has a defined optical effect on the beams of rays emitted by the semiconductor light source. The optically active surface of the reflector element is arranged in subregions to be reflection-preventive such that no beams of rays are reflected back from the reflector element into the semiconductor light source.
摘要:
In a position-measuring device for acquiring the relative position of a scanning unit and a reflection measuring graduation movable relative thereto in at least one measuring direction, the scanning unit includes a light source and a detector arrangement in a detection plane. In a first variant of the scanning unit, at least one optical reflector element is positioned in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between a virtual light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and the detector arrangement/detection plane on the other hand are identical. In a second variant, in the scanning unit at least one optical transmission element is disposed in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between the light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and a detector arrangement in a virtual detection plane on the other hand are identical.