Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit
    11.
    发明申请
    Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit 有权
    扫描单元,用于使用这种扫描单元的刻度和位置测量系统的光学扫描的位置测量系统

    公开(公告)号:US20060227341A1

    公开(公告)日:2006-10-12

    申请号:US11391885

    申请日:2006-03-29

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/34715

    摘要: A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.

    摘要翻译: 一种扫描单元,用于对刻度进行光学扫描的位置测量系统,所述扫描单元包括用于沿朝向刻度的部分的方向透射光的光源和用于接收由所述刻度尺改变的光的检测器。 放置在检测器前面的透镜装置,透镜装置具有多个光学透镜,并用于在检测器上的图像场中产生扫描扫描区域的确定的图像,其中透镜装置将扫描区域减少 在检测器上的图像场中。

    Optical position measuring device
    12.
    发明授权
    Optical position measuring device 有权
    光学位置测量装置

    公开(公告)号:US08537370B2

    公开(公告)日:2013-09-17

    申请号:US12995070

    申请日:2009-03-31

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38 G01D5/34715

    摘要: A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.

    摘要翻译: 一种用于检测相对位置的测量装置,所述测量装置包括可在至少一个测量方向上移动的测量刻度和用于确定所述测量刻度相对于所述扫描单元的相对位置的扫描单元。 扫描单元包括光源,设置在位于扫描光束路径中的透明载体元件的第一侧上的扫描光栅和检测器装置。 扫描单元还包括以限定的方式调节检测器装置上的光强度的衰减结构,其中1)衰减结构设置在透明载体元件的第二侧上,与第一侧相对,或者2) 衰减结构具有至少沿着一个方向作为位置的函数变化的磁导率,使得至少在该一个方向上均匀的光强导致检测器布置。

    ROTARY POSITION MEASURING INSTRUMENT
    13.
    发明申请
    ROTARY POSITION MEASURING INSTRUMENT 有权
    旋转位置测量仪器

    公开(公告)号:US20130063732A1

    公开(公告)日:2013-03-14

    申请号:US13603846

    申请日:2012-09-05

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38

    摘要: A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.

    摘要翻译: 一种旋转位置测量仪器,包括光源和具有测量标准的刻度盘。 所述旋转位置测量仪器包括光电检测器组件,其中所述刻度盘相对于所述光源和所述检测器组件围绕旋转轴线可旋转,其中通过所述检测器组件可检测旋转角度相关位置信号。 光源与测量标准间隔开第一距离,并且检测器组件设置在与测量标准物隔开的第二距离处,其中第二距离不同于第一距离。 刻度盘包括具有光学效果的光学元件,其导致将光源的图像投射到距离测量标准具有第三距离的位置,其中第三距离不同于第一距离。

    OPTICAL POSITION MEASURING DEVICE
    14.
    发明申请
    OPTICAL POSITION MEASURING DEVICE 有权
    光学位置测量装置

    公开(公告)号:US20110109917A1

    公开(公告)日:2011-05-12

    申请号:US12995070

    申请日:2009-03-31

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/38 G01D5/34715

    摘要: A measuring device for detecting a relative position, the measuring device including a measurement graduation movable in at least one measurement direction and a scanning unit for determining a relative position of the measurement graduation with respect to the scanning unit. The scanning unit includes a light source, a scanning grating disposed on a first side of a transparent carrier element that is positioned in a scanning beam path and a detector arrangement. The scanning unit further includes an attenuation structure that adjusts a light intensity on the detector arrangement in a defined manner, wherein either 1) the attenuation structure is disposed on a second side, opposite the first side, of the transparent carrier element or 2) the attenuation structure has a permeability that varies as a function of location at least along one direction so that a light intensity which is uniform at least in that one direction results on the detector arrangement.

    摘要翻译: 一种用于检测相对位置的测量装置,所述测量装置包括可在至少一个测量方向上移动的测量刻度和用于确定所述测量刻度相对于所述扫描单元的相对位置的扫描单元。 扫描单元包括光源,设置在位于扫描光束路径中的透明载体元件的第一侧上的扫描光栅和检测器装置。 扫描单元还包括以限定的方式调节检测器装置上的光强度的衰减结构,其中1)衰减结构设置在透明载体元件的第二侧上,与第一侧相对,或者2) 衰减结构具有至少沿着一个方向作为位置的函数变化的磁导率,使得至少在该一个方向上均匀的光强导致检测器布置。

    Rotary position measuring instrument
    15.
    发明授权
    Rotary position measuring instrument 有权
    旋转位置测量仪

    公开(公告)号:US08937726B2

    公开(公告)日:2015-01-20

    申请号:US13603846

    申请日:2012-09-05

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14 G01D5/38

    CPC分类号: G01D5/38

    摘要: A rotary position measuring instrument that includes a light source and a graduated disk having a measuring standard. The rotary position measuring instrument including an optoelectronic detector assembly, wherein the graduated disk is rotatable relative to the light source and the detector assembly about an axis of rotation, wherein rotary-angle-dependent position signals are detectable via the detector assembly. The light source is spaced apart from the measuring standard by a first distance, and the detector assembly is disposed at a second distance from the measuring standard, wherein the second distance is different than the first distance. The graduated disk includes an optical element, which has an optical effect that results in a projecting an image of the light source into a position which has a third distance from the measuring standard, wherein the third distance is different than the first distance.

    摘要翻译: 一种旋转位置测量仪器,包括光源和具有测量标准的刻度盘。 所述旋转位置测量仪器包括光电检测器组件,其中所述刻度盘相对于所述光源和所述检测器组件围绕旋转轴线可旋转,其中通过所述检测器组件可检测旋转角度相关位置信号。 光源与测量标准间隔开第一距离,并且检测器组件设置在与测量标准物隔开的第二距离处,其中第二距离不同于第一距离。 刻度盘包括具有光学效果的光学元件,其导致将光源的图像投射到距离测量标准具有第三距离的位置,其中第三距离不同于第一距离。

    Position-measuring device
    16.
    发明授权
    Position-measuring device 有权
    位置测量装置

    公开(公告)号:US08854630B2

    公开(公告)日:2014-10-07

    申请号:US13203688

    申请日:2010-02-03

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14 G01B11/00 G01D5/347

    CPC分类号: G01B11/00 G01D5/34715

    摘要: A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.

    摘要翻译: 位置测量装置适合于在至少一个测量方向上检测扫描单元和可相对于其移动的反射测量光栅的相对位置。 扫描单元包括主光源以及检测平面中的至少一个检测器组件。 能够在来自主光源的检测平面中产生点光源的周期性配置。 主光源设置在检测平面上方。

    Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit
    17.
    发明授权
    Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit 有权
    扫描单元,用于使用这种扫描单元的刻度和位置测量系统的光学扫描的位置测量系统

    公开(公告)号:US07423768B2

    公开(公告)日:2008-09-09

    申请号:US11391885

    申请日:2006-03-29

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01D5/34715

    摘要: A scanning unit for a position measuring system for the optical scanning of a scale, the scanning unit including a light source for transmitting light in a direction toward a section of a scale and a detector for receiving light modified by the scale. A lens arrangement placed in front of the detector, the lens arrangement having a plurality of optical lenses and is used for generating a definite image of a scanned scanning area in an image field on the detector, wherein the lens arrangement optically images the scanning area reduced in surface in the image field on the detector.

    摘要翻译: 一种扫描单元,用于对刻度进行光学扫描的位置测量系统,所述扫描单元包括用于沿朝向刻度的部分的方向透射光的光源和用于接收由所述刻度尺改变的光的检测器。 放置在检测器前面的透镜装置,透镜装置具有多个光学透镜,并用于在检测器上的图像场中产生扫描扫描区域的确定的图像,其中透镜装置将扫描区域减少 在检测器上的图像场中。

    Position-Measuring Device
    18.
    发明申请
    Position-Measuring Device 有权
    位置测量装置

    公开(公告)号:US20120081711A1

    公开(公告)日:2012-04-05

    申请号:US13203688

    申请日:2010-02-03

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01B11/14

    CPC分类号: G01B11/00 G01D5/34715

    摘要: A position-measuring device is suited for detecting the relative position of a scanning unit and a reflection measuring grating movable relative thereto in at least one measuring direction. The scanning unit includes a primary light source as well as at least one detector assembly in a detection plane. A periodic configuration of point light sources is able to be generated in the detection plane from the primary light source. The primary light source is disposed above the detection plane.

    摘要翻译: 位置测量装置适合于在至少一个测量方向上检测扫描单元和可相对于其移动的反射测量光栅的相对位置。 扫描单元包括主光源以及检测平面中的至少一个检测器组件。 能够在来自主光源的检测平面中产生点光源的周期性配置。 主光源设置在检测平面上方。

    Scanning unit for an optical position-measuring device
    19.
    发明授权
    Scanning unit for an optical position-measuring device 有权
    光学位置测量装置的扫描装置

    公开(公告)号:US07705289B2

    公开(公告)日:2010-04-27

    申请号:US12142567

    申请日:2008-06-19

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01D5/34

    CPC分类号: G01D5/34723 G01D5/34746

    摘要: A scanning unit for an optical position-measuring device includes a semiconductor light source and at least one downstream reflector element that has a defined optical effect on the beams of rays emitted by the semiconductor light source. The optically active surface of the reflector element is arranged in subregions to be reflection-preventive such that no beams of rays are reflected back from the reflector element into the semiconductor light source.

    摘要翻译: 用于光学位置测量装置的扫描单元包括半导体光源和对由半导体光源发射的光束具有限定的光学效应的至少一个下游反射器元件。 反射器元件的光学活性表面被布置在子区域中以防反射,使得光束不会从反射器元件反射回到半导体光源中。

    Position-measuring device
    20.
    发明申请
    Position-measuring device 有权
    位置测量装置

    公开(公告)号:US20070262250A1

    公开(公告)日:2007-11-15

    申请号:US11801057

    申请日:2007-05-07

    申请人: Ulrich Benner

    发明人: Ulrich Benner

    IPC分类号: G01D5/34

    CPC分类号: G01D5/347

    摘要: In a position-measuring device for acquiring the relative position of a scanning unit and a reflection measuring graduation movable relative thereto in at least one measuring direction, the scanning unit includes a light source and a detector arrangement in a detection plane. In a first variant of the scanning unit, at least one optical reflector element is positioned in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between a virtual light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and the detector arrangement/detection plane on the other hand are identical. In a second variant, in the scanning unit at least one optical transmission element is disposed in the scanning beam path which has an optical effect on the scanning beam path to the effect that the distance between the light source and the reflection measuring graduation on one hand, and the distance between the reflection measuring graduation and a detector arrangement in a virtual detection plane on the other hand are identical.

    摘要翻译: 在用于获取扫描单元的相对位置的位置测量装置和在至少一个测量方向上可相对于其移动的反射测量刻度,扫描单元包括检测平面中的光源和检测器装置。 在扫描单元的第一变型中,至少一个光学反射器元件位于扫描光束路径中,其对扫描光束路径具有光学效应,使得虚拟光源与反射测量刻度之间的距离在一个 另一方面,反射测量刻度与检测器布置/检测平面之间的距离是相同的。 在第二种变型中,在扫描单元中,至少一个光传输元件被设置在扫描光束路径中,其具有对扫描光束路径的光学效应,使得一方面光源与反射测量刻度之间的距离 另一方面,虚拟检测平面中的反射测量刻度与检测器配置之间的距离相同。