Dynamically Adjustable Semiconductor Metrology System
    11.
    发明申请
    Dynamically Adjustable Semiconductor Metrology System 有权
    动态可调半导体计量系统

    公开(公告)号:US20130114085A1

    公开(公告)日:2013-05-09

    申请号:US13661752

    申请日:2012-10-26

    CPC classification number: G01N21/55 G01N21/211 G01N2021/213 G01N2021/556

    Abstract: The present invention may include an illumination source, a detector, a selectably adjustable optical system including a dynamically adjustable illumination pupil of the illumination arm, a dynamically adjustable collection pupil of the collection arm, a dynamically adjustable illumination field stop of the illumination arm, a dynamically adjustable collection field stop of the collection arm, a sensor configured to measure one or more optical characteristics of one or more components of the optical system, and a control system configured to selectably dynamically adjust at least one of the illumination pupil, the collection pupil, the illumination field stop, the collection field stop, and a spectral radiance of the illumination source.

    Abstract translation: 本发明可以包括照明源,检测器,可选择地调节的光学系统,其包括照明臂的动态可调节照明光瞳,收集臂的动态可调收集光瞳,照明臂的动态可调照明场停止, 收集臂的可动态调整的收集场停止,被配置为测量所述光学系统的一个或多个部件的一个或多个光学特性的传感器,以及被配置为可选择地动态地调整所述照明瞳孔,所述收集瞳孔 照明场停止,收集场停止以及照明源的光谱。

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