公开(公告)号：US20210341526A1

公开(公告)日：2021-11-04

申请号：US16863595

申请日：2020-04-30

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Gen Tokumoto ,  Yasuaki Komatsu

IPC: G01R27/28 ,  G01R35/00

Abstract: A measurement system and a method of removing effects of instability of the measurement system while measuring at least one S-parameter of a device under test (DUT) are provided. The method includes initially determining a characteristic of the measurement system, including identifying a location of an instability in the time domain of the measurement system; determining a change of the characteristic of the measurement system while connected to the DUT; and compensating for the determined change of the characteristic of the measurement system while connected to the DUT by removing effects of the determined change on measurements of the at least one S-parameter of the DUT.

公开(公告)号：US11121784B2

公开(公告)日：2021-09-14

申请号：US15592961

申请日：2017-05-11

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Jean-Pierre Teyssier

IPC: H04W24/08 ,  H04B17/318

Abstract: A method is provided for detecting power of a periodic signal in a band of interest of the periodic signal having a predetermined bandwidth. The method includes determining frequencies of multiple tones in the periodic signal, respectively; receiving the periodic signal at a signal analyzer; selectively measuring power values at the frequencies of the multiple tones; and determining a band power of the periodic signal over the predetermined bandwidth by summing the power values at the frequencies of the multiple tones.

公开(公告)号：US20180331770A1

公开(公告)日：2018-11-15

申请号：US15592961

申请日：2017-05-11

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Jean-Pierre Teyssier

IPC: H04B17/318 ,  H04W24/08

CPC classification number: H04B17/318 ,  H04W24/08

Abstract: A method is provided for detecting power of a periodic signal in a band of interest of the periodic signal having a predetermined bandwidth. The method includes determining frequencies of multiple tones in the periodic signal, respectively; receiving the periodic signal at a signal analyzer; selectively measuring power values at the frequencies of the multiple tones; and determining a band power of the periodic signal over the predetermined bandwidth by summing the power values at the frequencies of the multiple tones.

公开(公告)号：US20170047915A1

公开(公告)日：2017-02-16

申请号：US14823985

申请日：2015-08-11

Applicant: Keysight Technologies, Inc.

Inventor： Troels Studsgaard Nielsen ,  Jan Verspecht ,  Joel P. Dunsmore

IPC: H03K5/00 ,  G01R23/16

CPC classification number: H03K5/00006 ,  G01R23/18

Abstract: A system and method sequentially measure the amplitude and phase of an output signal of a device under test in each of two or more frequency ranges which together span the output signal spectrum, using a local oscillator (LO) signal whose frequency and phase change for each measurement. The measured phase of the output signal is adjusted for at least one of the frequency ranges to account for the change of phase in the LO signal from measurement of one frequency range to another frequency range, including applying to the measured phase a phase offset determined by measuring the phases of two pilot tones in the two or more frequency ranges, using the LO signal. The phase-adjusted measurements of the output signal in the two or more frequency ranges are stitched together to determine the amplitude and phase of the output signal across the output spectrum.

Abstract translation: 系统和方法使用本地振荡器（LO）信号顺序测量被测器件的输出信号的幅度和相位，其中两个或更多个频率范围中的每一个频率和相位变化一起跨越输出信号频谱，其中每个 测量。 对于至少一个频率范围调整输出信号的测量相位，以考虑从一个频率范围的测量到另一个频率范围的LO信号中的相位的变化，包括将所测量的相位施加到由 使用LO信号测量两个或更多个频率范围内的两个导频音的相位。 将两个或更多个频率范围内的输出信号的相位调整测量结合在一起以确定输出频谱上的输出信号的幅度和相位。

公开(公告)号：US20160337887A1

公开(公告)日：2016-11-17

申请号：US14710476

申请日：2015-05-12

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Jean-Pierre Teyssier ,  Jad Faraj ,  James B. Kerr

IPC: H04W24/08

CPC classification number: G01R23/16 ,  G01R23/163

Abstract: A radio frequency (RF) measurement system acting as a spectrum analyzer and a method of operating the same eliminates image signals from a detected input RF spectrum. The method includes determining at least three local oscillator (LO) frequencies; determining LO offsets between the LO frequencies; and mixing the LO frequencies with the input RF spectrum to provide corresponding intermediate frequency (IF) signals having an IF bandwidth, where at least one of the IF signals has the input RF spectrum mixed to a different portion of the IF bandwidth than at least one other of the IF signals, providing overlapping coverage. The method further includes acquiring ADC time records for the IF signals; performing Fourier transforms (FTs) on the ADC time records to provide IF spectrums; and detecting RF responses from the IF spectrums to determine an RF response trace corresponding to the input RF spectrum.

Abstract translation: 用作频谱分析仪的射频（RF）测量系统及其操作方法从检测到的输入RF频谱中消除图像信号。 该方法包括确定至少三个本地振荡器（LO）频率; 确定LO频率之间的LO偏移; 以及将所述LO频率与所述输入RF频谱混合以提供具有IF带宽的相应的中频（IF）信号，其中所述IF信号中的至少一个将所述输入RF频谱混合到所述IF带宽的不同部分， 其他IF信号，提供重叠覆盖。 该方法还包括获取IF信号的ADC时间记录; 在ADC时间记录上执行傅里叶变换（FTs）以提供IF频谱; 以及检测来自IF频谱的RF响应，以确定对应于输入RF频谱的RF响应迹线。

公开(公告)号：US20150198523A1

公开(公告)日：2015-07-16

申请号：US14156401

申请日：2014-01-15

Applicant: Keysight Technologies, Inc.

Inventor： Joel P. Dunsmore ,  Ning Cheng ,  Ya-Ping Zhang

IPC: G01N21/47

CPC classification number: G01N21/47 ,  G01R27/32 ,  G01R35/005

Abstract: Scattering parameters of a test fixture having a first port and a second port are measured by providing a test instrument; outputting a one-port reflection test signal from the test instrument to the first port with the second port terminated in a reflective termination having a known reflection coefficient, and receiving at the test instrument a one-port reflection measurement signal from the first port; subjecting the one-port reflection measurement signal to first time gating to generate a first time-gated measurement signal, the first time gating using a first gating function temporally disposed about the first port; subjecting the one-port reflection measurement signal to second time gating to generate a second time-gated measurement signal, the second time gating using a second gating function temporally disposed about the termination; and deriving the scattering parameters from the first time-gated measurement signal and the second time-gated measurement signal.

Abstract translation: 通过提供测试仪器来测量具有第一端口和第二端口的测试夹具的散射参数; 将来自所述测试仪器的单端口反射测试信号输出到所述第一端口，其中所述第二端口以具有已知反射系数的反射端接端接，并且在所述测试仪器处接收来自所述第一端口的单端口反射测量信号; 对所述单端口反射测量信号进行第一次门控以产生第一时间门控测量信号，所述第一时间门控使用临时设置在所述第一端口周围的第一选通功能; 对所述单端口反射测量信号进行第二时间选通以产生第二时间门控测量信号，所述第二时间选通使用临时设置在所述终端周围的第二选通功能; 并从第一时间门控测量信号和第二时间门控测量信号得出散射参数。