摘要:
Provided is an RPR ring network system including: a plurality of RPR station devices; and a ring for interconnecting the plurality of RPR station devices, in which a section between adjacent RPR station devices is defined as a section of the ring, a bandwidth different from bandwidths of other sections are allocated to at least one section, and each of the RPR station devices transmits a frame, in the case of transmitting the frame to the other RPR station device through the ring, by a transmission bandwidth with a minimum value of a bandwidth allocated to a section through which the frame flows set as an upper limit.
摘要:
An ATM switching system concentrates cell streams, which are output by respective ones of a plurality of line interfaces, by a concentrator, enters a resulting cell stream into an ATM switch unit, deconcentrates cells, which have been switched by the ATM switch unit, by a deconcentrator on a per line interface basis and sends the cells to lines. Each line interface converts a VPI/VCI included in the header of a cell that has entered from a line to an internal cell address having a number of bits smaller than the number of bits of the VPI/VCI. Each unit in the ATM switching system performs management of various data and controls cell switching based upon a converted cell address without relying upon the VPI/VCI. The line interface restores an internal cell address, which is included in the header of a cell that enters from the side of the ATM switch, to the VPI/VCI and sends the cell to a line.
摘要:
The present invention provides the method of manufacturing a dual-gate CMOS device which has high transconductance and improved breakdown voltage, in which depletion in the interface between a gate oxide and a gate electrode is prevented without the increase of the steps of process.A gate oxide film (5) formed on a semiconductor substrate (1) is washed with an aqueous solution, or exposed to a gas atomosphere containing hydrogen, and an amorphous silicon film (3) is formed on the whole surface of the gate oxide film (5). The amorphous silicon film (3) is then crystallized. Alternatively, after a silicon oxide film (53) or a silicon nitrided film is formed on the amorphous silicon film (3), the amorhpous silicon film (3) is crystallized.
摘要:
An overglaze color for pottery. Pigment is added to a colorless frit which has the composition (wt %):(1) silicon dioxide 30 to 70(2) alumina 0.1 to 15(3) boron oxide 20 to 40(4) alkali metal oxide 2 to 17(5) one or more oxide selected from lanthanum oxide, niobium oxide, tantalum oxide, hafnium oxide, scandium oxide, samarium oxide, europium oxide, gadolinium oxide, thulium oxide, ytterbium oxide, lutetium oxide, terbium oxide, or dysprosium oxide 0.1 to 15and having a thermal expansion coefficient of 5.0.times.10.sup.-6 /.degree. C. to 7.0.times.10.sup.-6 /.degree. C. at 50.degree. to 350.degree. C. and a thermal softeningpVperature of 500.degree. to 640.degree. C. The overglaze color according to the invention causes no cracking, increases the color developing property of the pigment and has high chemical durability.