Abstract:
An EEPROM device and a method of fabricating same. In one aspect, an EEPROM device comprises: a memory transistor including a tunnel insulating layer, first conductive layer patterns, and second conductive layer patterns stacked on a first portion of a semiconductor substrate, and common source regions and floating junction regions arranged at opposite sides of the second conductive layer patterns; and a selection transistor, which is connected to the floating junction regions, and includes a gate insulating layer, the first conductive layer patterns, and the second conductive layer patterns stacked on a second portion of the semiconductor substrate, and drain regions arranged at one side of the second conductive layer patterns opposite the floating junction regions. The first conductive layer patterns in the memory transistor are separated by cell unit and floated, and the insulating layer and the second conductive layer patterns stacked on the first conductive layer patterns are connected to a cell and an adjacent cell, and the first conductive layer patterns and the second conductive layer patterns of the selection transistor are etched and connected by metal plugs. The EEPROM is fabricated using a simplified process which combines a floating gate mask and ion implantation mask into one mask, and which provides reduced resistance by connecting word lines using the metal plugs.
Abstract:
A method of manufacturing a nonvolatile memory device is provided. The method includes forming an isolation layer in a semiconductor substrate defining an active region and forming a molding pattern on the isolation layer. A first conductive layer is formed on a sidewall and a top surface of the molding pattern and on the semiconductor substrate. The first conductive layer on the top surface of the molding pattern is selectively removed forming a conductive pattern. The conductive pattern includes a body plate disposed on the active region and a protrusion which extends from an edge of the body plate onto the sidewall of the molding pattern. The molding pattern is then removed. An inter-gate dielectric layer is formed on the isolation layer and the conductive pattern. Nonvolatile memory devices manufactured using the method are also provided.
Abstract:
A method of forming a tunneling insulating layer having a size smaller than the size obtained by the resolution of a photolithography process is provided. The method includes the steps of forming a first insulating layer and a second insulating layer on a substrate, forming a re-flowable material layer pattern to re-flow the re-flowable material layer pattern, removing the second insulating layer and the first insulating layer to expose the substrate, and forming a tunneling insulating layer.