中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

44 records (took 0.014 seconds)

    FORM MEASURING INSTRUMENT
    12.
    发明申请
    FORM MEASURING INSTRUMENT 有权
    形式测量仪器

    公开(公告)号：US20140237834A1

    公开(公告)日：2014-08-28

    申请号：US14190452

    申请日：2014-02-26

    Applicant: MITUTOYO CORPORATION

    Inventor： Sadayuki Matsumiya ,  Kazuhiko Hidaka

    IPC: G01B5/20

    CPC classification number: G01B5/20 ,  G01B3/008 ,  G01B5/28 ,  G01B7/28 ,  G01B7/34

    Abstract: A form measuring instrument includes: a body; a movable member including: a stylus holder being rotatably supported by the body; a stylus being held by the stylus holder; and a tip being provided at an end of the stylus and being contactable with a workpiece surface; a measurement-force-applying unit being adapted to generate a rotation force acting on the stylus holder to bring the tip of the stylus into contact with the workpiece surface; a displacement detector being provided to a portion of the stylus holder to detect a displacement of the stylus holder resulting from a rotation thereof; and a vibration generator being adapted to apply vibration to the stylus holder.

    Abstract translation: 一种形式测量仪器包括：身体; 可动构件，包括：由所述主体可旋转地支撑的触针座; 由触针座保持的触针; 并且尖端设置在触针的端部并且可与工件表面接触; 测量力施加单元，其适于产生作用在所述触针座上的旋转力，以使所述触针的尖端与所述工件表面接触; 位移检测器被提供到触针保持器的一部分以检测由其旋转引起的触针座的位移; 以及振动发生器，其适于对所述触针支架施加振动。

    Measuring probe and measuring probe system
    14.
    发明授权
    Measuring probe and measuring probe system 有权

    公开(公告)号：US10161743B2

    公开(公告)日：2018-12-25

    申请号：US15460994

    申请日：2017-03-16

    Applicant: MITUTOYO CORPORATION

    Inventor： Kazuhiko Hidaka ,  Sadayuki Matsumiya

    IPC: G01B11/24

    Abstract: A measuring probe for measuring a screw groove of a relatively movable ball screw includes a light source, an objective lens formed to correspond to the screw groove of the ball screw, arranged to be opposed to the screw groove of the ball screw in a non-contact manner, and configured to emit light from the light source to the screw groove of the ball screw, and a line sensor configured to detect an interference pattern generated by reflected light from the screw groove of the ball screw and reflected light on a surface of the objective lens. This enables high-accuracy measurement of a specified area of a shape of a side surface of a relatively movable work in a non-contact manner.

    CHROMATIC CONFOCAL SENSOR
    15.
    发明申请
    CHROMATIC CONFOCAL SENSOR 审中-公开

    公开(公告)号：US20180112966A1

    公开(公告)日：2018-04-26

    申请号：US15724328

    申请日：2017-10-04

    Applicant: Mitutoyo Corporation

    Inventor： Sadayuki Matsumiya ,  Kenji Okabe ,  Koji Kubo ,  Nobuya Kaneko

    IPC: G01B11/00 ,  G01J3/28 ,  G01J3/02

    CPC classification number: G01B11/002 ,  G01B11/0608 ,  G01B2210/50 ,  G01J3/0218 ,  G01J3/2823

    Abstract: A chromatic confocal sensor includes a light source portion that emits a plurality of light beams having different wavelengths; an objective lens that converges the plurality of light beams at different focal positions; an emission port from which measurement light reflected by an object to be measured at the focal positions out of the plurality of light beams is emitted; a position calculation portion that calculates a position of the object to be measured based on the emitted measurement light; an observation portion including an observation light source that emits observation light and an image sensor; and a beam splitter that emits at least a part of the measurement light that passes through the objective lens to the emission port and emits at least a part of the observation light that passes through the objective lens and is reflected by the object to be measured to the image sensor.

Patent Agency Ranking