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公开(公告)号：US20220229020A1
公开(公告)日：2022-07-21
申请号：US17614527
申请日：2020-04-13
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA , Yoshihaya IMAMURA
Abstract: The method for examining a clinched portion of a tubular body includes the steps of: giving an elastic vibration to a clinched body 90 formed by clinching a tubular body 91 with a clinch-target member 92; and acquiring, for each of a plurality of view areas 95 which differ from each other in the position in the circumferential direction of the tubular body 91, a vibration distribution optically and simultaneously measured within the view area 95 including a clinched portion 93 of the tubular body 91 and the clinch-target member 92, to determine whether or not the state of clinching is satisfactory over the entire clinched portion 93.
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公开(公告)号：US20210096085A1
公开(公告)日：2021-04-01
申请号：US17044571
申请日：2018-12-13
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Yuya NAGATA , Kenji TAKUBO
Abstract: A vibration measurement device 10 includes an excitation unit (signal generator 11 and vibrator 12) for exciting an elastic wave to an inspection target S, an illumination unit (wavelength stabilized laser beam source 13 and illumination light lens 14) for performing stroboscopic illumination to a measurement region of a surface of the inspection target S using a wavelength stabilized laser beam source 13, a displacement measurement unit (speckle-sharing interferometer 15) for collectively measuring a displacement of each point of the measurement region in the back-and-forth direction by speckle interferometry or speckle-sharing interferometer. By using the wavelength stabilized laser beam source 13, an interference image can be obtained even when the inspection target S has large surface irregularities.
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公开(公告)号：US20210080399A1
公开(公告)日：2021-03-18
申请号：US16920148
申请日：2020-07-02
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA
Abstract: A defect inspection apparatus generates a surface layer inspection image which is an image representing displacement of an inspection target in a measurement region based on an intensity pattern of interfered laser light. The defect inspection apparatus is configured to generate an appearance inspection image which is an image of an outer surface of the measurement region based on an intensity pattern of incoherent light.
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公开(公告)号：US20170350690A1
公开(公告)日：2017-12-07
申请号：US15611254
申请日：2017-06-01
Applicant: SHIMADZU CORPORATION
Inventor： Takahide HATAHORI , Kenji TAKUBO
CPC classification number: G01B9/02095 , G01B9/02096 , G01B9/02098 , G01B17/00 , G01M5/0033 , G01M5/0066 , G01M5/0091 , G01M7/00 , G01N21/1702 , G01N21/8806 , G01N29/043 , G01N29/045 , G01N29/2418 , G01N2021/1706 , G01N2021/8838 , G01N2201/06113 , G01N2201/0697 , G01N2291/0232 , G01N2291/0234
Abstract: A defect detection apparatus is provided that can inspect a measurement region of a target object at one time and without inconsistencies arising within the measurement region. A defect detection apparatus 10 includes: a generation unit (signal generator 11 and vibrator 12) for generating an elastic wave in a target object S; an illumination unit (pulsed laser light source 13 and illumination light lens 14) for performing stroboscopic illumination onto a measurement region of a surface of the target object S; and a displacement measurement unit (speckle shearing interferometer 15) for collectively measuring displacements in a normal direction at each point of the measurement region with respect to at least three mutually-different phases of the elastic wave by controlling a phase of the elastic wave and a timing of the stroboscopic illumination. Defects in the measurement region are detected based on the displacements in the normal direction at each point of the measurement region with respect to at least three phases that are obtained by the displacement measurement unit.
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公开(公告)号：US20240319081A1
公开(公告)日：2024-09-26
申请号：US18607867
申请日：2024-03-18
Applicant: SHIMADZU CORPORATION , Kyoto University
Inventor： Hideaki KATSU , Koji TOJO , Kenji TAKUBO , Yuya NAGATA , Shigeki TAKEUCHI , Ryo OKAMOTO
IPC: G01N21/31
CPC classification number: G01N21/31
Abstract: The quantum optical system changes a phase of quantum interference occurring between a plurality of physical processes, in each of which a quantum entangled photon pair of a signal photon and an idler photon is generated. Each of a plurality of pixels outputs a detection signal of the signal photon in a state where a sample is arranged in an optical path of the idler photon. A processor calculates an absorption spectroscopy characteristic based on an interferogram indicating a variation in a signal intensity acquired from each of the plurality of pixels in accordance with the change in the phase of the quantum interference. The processor: applies a processing to reduce phase difference of the interferogram among the plurality of pixels; spatially integrates, over the plurality of pixels, the interferogram having gone through the processing to reduce phase differences; and calculates the absorption spectroscopy characteristic based on the integrated interferogram.
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Patent Agency Ranking
公开(公告)号：US20240076596A1
公开(公告)日：2024-03-07
申请号：US18268670
申请日：2021-10-14
Applicant: Shimadzu Corporation
Inventor： Tsunehiro INOUE , Toyoyuki HASHIMOTO , Yasuko YONEDA , Kenji TAKUBO , Yoichi FUJIYAMA , Tomoki OHKUBO , Eiichi OZEKI , Ryogo TAKAI , Hiroomi GOTO , Sadamu TOMITA
Abstract: A cell culture container includes: an insert member having a membrane on which a cell is seeded, the insert member defining a first inner space that functions as an anaerobic chamber; a container having an attachment/detachment portion to and from which the insert member is attachable and detachable, the container defining a second inner space that functions as an aerobic chamber; a sealing member that closes an opening of the aerobic chamber between the attachment/detachment portion and the insert member with the insert member being attached to the attachment/detachment portion; and a transfer mechanism that transfers force to the sealing member. The sealing member closes the opening in response to an input of the force from the transfer mechanism.
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公开(公告)号：US20230251204A1
公开(公告)日：2023-08-10
申请号：US18013401
申请日：2020-07-02
Applicant: Shimadzu Corporation
Inventor： Hiroshi HORIKAWA , Kenji TAKUBO
IPC: G01N21/88 , G01N29/04 , G01B9/02 , G01B9/02098
CPC classification number: G01N21/8806 , G01N29/045 , G01B9/02095 , G01B9/02098 , G01N2201/06113 , G01N2021/1765
Abstract: This defect inspection apparatus (100) is provided with an excitation unit (1), a laser illumination unit (2), an interference unit (30), an imaging unit (31), a holding member (4) for holding the imaging unit at a position spaced apart from an inspection target (90) by a predetermined distance, a connecting member (5) for connecting the holding member or the imaging unit and the excitation unit, and a controller (6) for generating an image (61) related to the propagation of an elastic wave on an inspection target.
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公开(公告)号：US20230236111A1
公开(公告)日：2023-07-27
申请号：US18077213
申请日：2022-12-07
Applicant: SHIMADZU CORPORATION
Inventor： Takahide HATAHORI , Kenji TAKUBO , Tomotaka NAGASHIMA
CPC classification number: G01N21/1702 , G01N21/88 , G01N2021/1706
Abstract: In a defect detection device (10), an input receiver (161) receives an input, by a user, of information concerning the kind and size of a defect expected to be present in or on a test object. An exciter (11, 12) induces an elastic wave in the test object, with the frequency of the elastic wave being variable. A measurer (15) optically measures a vibration state of the surface of the test object caused by the elastic wave. A wavelength determiner (164) determines the wavelength of the elastic wave induced in the test object, based on the vibration state obtained by the measurer. A frequency selector (165) selects an appropriate frequency from a plurality of frequencies, based on the kind and size of the expected defect as well as the wavelength acquired for each of the plurality of frequencies by the wavelength determiner by varying the frequency of the elastic wave.
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公开(公告)号：US20230220323A1
公开(公告)日：2023-07-13
申请号：US18014876
申请日：2021-06-23
Applicant: SHIMADZU CORPORATION
Inventor： Toyoyuki HASHIMOTO , Kenji TAKUBO , Tsunehiro INOUE , Yasuko YONEDA , Tomoki OHKUBO
Abstract: A cell culture system includes: a first pump; and a first cell culture container and a second cell culture container. The first cell culture container has a first culture medium circulation flow path. The second cell culture container has a second culture medium circulation flow path independent of the first culture medium circulation flow path. The first culture medium circulation flow path and the second culture medium circulation flow path are fluidly connected to the first pump.
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公开(公告)号：US20230085940A1
公开(公告)日：2023-03-23
申请号：US17793649
申请日：2020-10-09
Applicant: Shimadzu Corporation
Inventor： Takahide HATAHORI , Kenji TAKUBO , Koki YOSHIDA
Abstract: A defect inspection apparatus (100) is configured to approximate a difference value or an absolute value (Ia) of the difference value between a pixel value in at least three captured images (A) captured by an imager in at least three different phases of an elastic wave and a pixel value in a reference image (Aave) separate from the captured images (A) so as to acquire an approximate value for defect inspection corresponding to an amount of change in the pixel value in the captured images (A).
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