公开(公告)号：US20160284117A1

公开(公告)日：2016-09-29

申请号：US14997028

申请日：2016-01-15

Applicant: Samsung Electronics Co., Ltd.

Inventor： Youngsam SHIN ,  Wonjong LEE ,  Seokjoong HWANG

IPC: G06T15/06 ,  G06T15/00 ,  G06T15/40 ,  G06T15/50 ,  G06T15/55

CPC classification number: G06T15/06

Abstract: A ray tracing apparatus includes a ray generator and a traversal (TRV)/intersection test (IST) integrator. The ray generator is configured to generate a ray. The TRV/IST integrator is configured to receive the ray, determine one of a ray-node intersection test, an intersection distance test, and a hit point test to be performed based on a state of the ray input thereto, and perform the determined test with respect to the ray. The ray-node intersection test, the intersection distance test, and the hit point test are performed with respect to the ray through same pipeline.

Abstract translation: 射线跟踪装置包括射线发生器和穿越（TRV）/交叉测试（IST）积分器。 射线发生器被配置为产生射线。 TRV / IST积分器被配置为基于输入的射线的状态来接收射线，确定要执行的射线 - 节点交叉测试，交叉点距离测试和命中点测试之一，并且执行所确定的测试 相对于射线。 相对于通过同一流水线的射线进行射线 - 节点交点测试，交点距离测试和点测试。

公开(公告)号：US20160085510A1

公开(公告)日：2016-03-24

申请号：US14690708

申请日：2015-04-20

Applicant: SAMSUNG ELECTRONICS CO., LTD

Inventor： Seokjoong HWANG ,  Youngsam SHIN ,  Wonjong LEE ,  Jaedon LEE

IPC: G06F7/487 ,  G06F5/01

CPC classification number: G06T15/06

Abstract: A method and apparatus to perform a ray-node intersection test are provided. The method includes receiving an input representing coordinates of a bounding box and an origin coordinate of a ray as fixed-point numbers, obtaining difference values between the input coordinates of the bounding box and the origin coordinate, and obtaining multiplication values between the obtained difference values and a reciprocal number of a direction vector of the ray, where the reciprocal number is a floating-point number.

Abstract translation: 提供了执行光线 - 节点交叉测试的方法和装置。 该方法包括接收表示边界的坐标的输入和作为定点数的射线的原点坐标，获得边界框的输入坐标与原点坐标之间的差值，并获得所获得的差值之间的乘积值 以及光线的方向矢量的倒数，其中互数是浮点数。

公开(公告)号：US20150348307A1

公开(公告)日：2015-12-03

申请号：US14722771

申请日：2015-05-27

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jaedon LEE ,  Youngsam SHIN ,  Wonjong LEE ,  Seokjoong HWANG

IPC: G06T15/06

CPC classification number: G06T15/06

Abstract: Provided is an apparatus and method of traversing an acceleration structure (AS) in a ray tracing. The method includes determining whether each child node of a target node that is included in the AS intersects a ray, determining a type of a child node that intersects the ray; and performing an operation corresponding to a leaf node, in response to the child node being the leaf node, thereby reducing a time taken to traverse the AS.

Abstract translation: 提供了一种在光线跟踪中横穿加速结构（AS）的装置和方法。 该方法包括确定包括在AS中的目标节点的每个子节点是否与射线相交，确定与射线相交的子节点的类型; 并且响应于子节点是叶节点执行与叶节点相对应的操作，从而减少遍历AS所花费的时间。