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公开(公告)号：US09310496B2
公开(公告)日：2016-04-12
申请号：US13871576
申请日：2013-04-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung Hoon Kang , Dong Goo Kang , Sung Su Kim , Young Hun Sung , Hyun Hwa Oh
IPC: G01T7/00
CPC classification number: G01T7/005
Abstract: Provided are a calibration apparatus and method that may be used for setting a magnitude of an electric pulse based on a result obtained by imaging at least one imaging object, and that may be used for calibrating by mapping at least one photon energy corresponding to an absorption edge of at least one calibration object.
Abstract translation: 提供了一种校准装置和方法，其可以用于基于通过对至少一个成像对象进行成像而获得的结果来设置电脉冲的幅度，并且其可以用于通过映射至少一个对应于吸收的光子能量来进行校准 至少一个校准对象的边缘。
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Patent Agency Ranking
12.发明申请CALIBRATION METHOD OF RADIATION DETECTING APPARATUS, RADIATION IMAGING APPARATUS AND CONTROL METHOD OF RADIATION IMAGING APPARATUS 有权辐射检测装置的校准方法，放射成像装置和放射成像装置的控制方法公开(公告)号：US20130301798A1
公开(公告)日：2013-11-14
申请号：US13893456
申请日：2013-05-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung Hoon Kang , Dong Goo Kang , Young Hun Sung , Sang Wook Han
IPC: G01N23/04
Abstract: A calibration method of a radiation detecting apparatus, a control method of a radiation imaging apparatus and a radiation imaging apparatus are provided. The control method of the radiation imaging apparatus includes performing prior information acquisition by obtaining at least one correction threshold energy, at which a theoretical radiation intensity of at least one threshold energy is measured, and performing radiation image acquisition by obtaining at least one radiation image at the at least one threshold energy using the at least one correction threshold energy.
Abstract translation: 提供辐射检测装置的校准方法，放射线成像装置的控制方法和放射线成像装置。 放射线成像装置的控制方法包括：通过获得至少一个校正阈值能量来执行先验信息获取，在该校正阈值能量处测量至少一个阈值能量的理论辐射强度，并通过获得至少一个辐射图像 所述至少一个阈值能量使用所述至少一个校正阈值能量。
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公开(公告)号：US09730669B2
公开(公告)日：2017-08-15
申请号：US14313164
申请日：2014-06-24
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jong Ha Lee , Sung Hoon Kang , Young Hun Sung
CPC classification number: A61B6/545 , A61B6/025 , A61B6/0407 , A61B6/466 , A61B6/467 , A61B6/502 , A61B6/5294 , A61B6/544 , G06F19/00 , G06F19/321
Abstract: Disclosed herein are an X-ray imaging apparatus for optimizing radiography conditions upon radiography, and a control method thereof. The X-ray imaging apparatus includes: an input device configured to receive information about a patient; and a controller configured to conduct a search for a previously obtained X-ray image related to the information about the patient and a previously set radiography condition related to the information about the patient, and to set a radiography condition for a main-shot based on a result of the search.
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公开(公告)号：US09492133B2
公开(公告)日：2016-11-15
申请号：US13845742
申请日：2013-03-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Dong Goo Kang , Sung Hoon Kang , Sung Su Kim , Young Hun Sung , Hyun Hwa Oh , Seok Min Han
CPC classification number: A61B6/502 , A61B6/0414 , A61B6/405 , A61B6/481 , A61B6/482 , A61B6/486 , A61B6/5258 , A61B6/544 , A61B6/545 , A61B6/583
Abstract: An apparatus and method for acquiring an optimal MEX image may include an X-ray source to generate an X-ray and to irradiate the X-ray, an energy identification detector to acquire a MEX image that is generated when the irradiated X-ray penetrates an object, and an optimal MEX processor to generate an optimal MEX parameter based on a characteristic of the object and to control at least one of the X-ray source and the energy identification detector based on the generated optimal MEX parameter.
Abstract translation: 用于获取最佳MEX图像的装置和方法可以包括产生X射线并照射X射线的X射线源，能量识别检测器以获取当照射的X射线穿透时产生的MEX图像 物体和最佳MEX处理器，以基于物体的特性生成最佳MEX参数，并且基于所生成的最佳MEX参数来控制X射线源和能量识别检测器中的至少一个。
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公开(公告)号：US09456796B2
公开(公告)日：2016-10-04
申请号：US14452643
申请日：2014-08-06
Inventor： Seok Min Han , Dong Goo Kang , Sung Hoon Kang , Young Hun Sung , Myung Jin Chung
CPC classification number: A61B6/482 , A61B6/405 , A61B6/487 , A61B6/502 , A61B6/504 , A61B6/5235 , A61B6/583
Abstract: Disclosed herein are an X-ray imaging apparatus and a method for controlling the same. The X-ray imaging apparatus includes an X-ray generator configured to radiate first-energy X-rays toward an object, an X-ray detector configured to detect the first-energy X-rays which propagate through the object, an image processor configured to generate a first object image which correspond to the detected first-energy X-rays and to estimate a second object image which corresponds to second-energy X-rays based on the generated first object image, and a controller configured to control the image processor to repeatedly estimate the second object image by controlling the X-ray generator to repeatedly radiate the first-energy X-rays toward the object.
Abstract translation: 本文公开了一种X射线成像装置及其控制方法。 X射线成像装置包括被配置为朝向物体照射第一能量X射线的X射线发生器，被配置为检测通过物体传播的第一能量X射线的X射线检测器，被配置为 以产生与检测到的第一能量X射线相对应的第一对象图像，并且基于所生成的第一对象图像估计与第二能量X射线对应的第二对象图像，以及控制器，被配置为控制图像处理器 通过控制X射线发生器来重复地向物体辐射第一能量X射线来重复估计第二物体图像。
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公开(公告)号：US09254113B2
公开(公告)日：2016-02-09
申请号：US14100123
申请日：2013-12-09
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sung Su Kim , Hyun Hwa Oh , Dong Goo Kang , Sung Hoon Kang , Young Hun Sung , Kang Eui Lee , Seok Min Han
CPC classification number: A61B6/5294 , A61B6/0414 , A61B6/4241 , A61B6/482 , A61B6/502 , A61B6/5258 , A61B6/583
Abstract: The X-ray imaging apparatus includes an X-ray generator to generate and emit X-rays, an X-ray detector to detect the emitted X-rays and acquire X-ray data, and a controller to convert the X-ray data into X-ray characteristic coordinates and estimate a response characteristic function of the X-ray detector from a relationship between measurement data and reference data, the measurement data and the reference data being converted into the X-ray characteristic coordinates.
Abstract translation: X射线成像装置包括：X射线发生器，用于产生和发射X射线; X射线检测器，用于检测所发射的X射线，并获取X射线数据;以及控制器，将X射线数据转换为 X射线特征坐标并根据测量数据和参考数据之间的关系估计X射线检测器的响应特征函数，测量数据和参考数据被转换成X射线特征坐标。
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