公开(公告)号：US20160054267A1

公开(公告)日：2016-02-25

申请号：US14734229

申请日：2015-06-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jooho LEE ,  Changseung LEE ,  Jeoyoung SHIM ,  Sunghee LEE ,  Woosung JEON

IPC: G01N29/12 ,  G01N29/24 ,  G01R31/36

CPC classification number: G01N29/12 ,  G01N29/2437 ,  G01N2291/0256 ,  G01N2291/2697

Abstract: An apparatus for analyzing an active material of a secondary battery may include: a first electrode; a piezoelectric layer on the first electrode; a second electrode on the piezoelectric layer, configured to provide a voltage having a polarity opposite to a polarity of the first electrode; and/or an insulating layer on the second electrode and including a through hole exposing a portion of the second electrode. A method of analyzing an active material of a secondary battery may include: disposing an active material in a through hole of a bulk acoustic resonator, in which a first electrode, a piezoelectric layer, a second electrode, and an insulating layer are stacked; measuring a resonance frequency of the resonator by applying an electric signal to the first and second electrodes of the resonator; and/or measuring a weight of the active material in the through hole, based on the measured resonance frequency.

Abstract translation: 用于分析二次电池的活性材料的装置可以包括：第一电极; 第一电极上的压电层; 压电层上的第二电极，被配置为提供具有与第一电极的极性相反的极性的电压; 和/或第二电极上的绝缘层，并且包括暴露第二电极的一部分的通孔。 分析二次电池的活性物质的方法可以包括：将活性物质设置在堆叠有第一电极，压电层，第二电极和绝缘层的体声波谐振器的通孔中; 通过向谐振器的第一和第二电极施加电信号来测量谐振器的谐振频率; 和/或基于测量的共振频率来测量通孔中的活性材料的重量。

公开(公告)号：US20240402619A1

公开(公告)日：2024-12-05

申请号：US18404626

申请日：2024-01-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Minkyu KIM ,  QHwan KIM ,  Ami MA ,  Sunghee LEE ,  Kyu-Baik CHANG ,  Jaehoon JEONG ,  Wanju CHO ,  Hanlim CHOI

IPC: G03F7/00

Abstract: An apparatus for predicting a structure of a semiconductor device, the apparatus includes: at least one processor; a storage configured to store a learned model configured to predict the structure of the semiconductor device; and a memory configured to store at least one code, and at least one processor operatively connected to the memory and configured to execute the at least one code to: input non-destructive metrology data measured from the semiconductor device into the learned model, and predict the structure of the semiconductor device, based on the learned model, wherein the learned model is trained with training data including first data which is non-destructive metrology data and second data which is structural metrology data as reference data of the first data, and wherein the training data is refined based on a similarity of the training data in a space having a first axis corresponding to the first data and a second axis corresponding to the second data as reference axes.

公开(公告)号：US20240056878A1

公开(公告)日：2024-02-15

申请号：US18447756

申请日：2023-08-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Madhan Raj KANAGARATHINAM ,  Irlanki SANDEEP ,  Kavin Kumar THANGADORAI ,  Srihari KUNCHA ,  Dronamraju Siva SABAREESH ,  Srihari SRIRAM ,  Sukhdeep SINGH ,  Sri Vinod PALACHARLA ,  Jayendra Reddy KOVVURI ,  Mohan Rao GOLI ,  Sunghee LEE

IPC: H04W28/02

CPC classification number: H04W28/0268

Abstract: Embodiments herein provide a method for managing Quality of Service (QoS) of applications in a wireless network. Detecting a plurality of data traffic of plurality of applications based on current activities of a user equipment (UE), hardware components of UE, a plurality traffic parameter, a QoS report received from an access point (AP) associated with UE in a wireless network. Detecting an enhanced distributed channel access (EDCA) function based on plurality of data traffic. The EDCA function includes current mapping between access category of each data structure and traffic category of plurality of data traffic based on association. Classifying plurality of data traffic of the plurality of applications into priority data traffic category and non-priority data traffic category based on current mapping of the EDCA function. Modifying current mapping of EDCA function based on priority data traffic category, non-priority data traffic category, and access category of each data structure of plurality of data structures.

公开(公告)号：US20230070312A1

公开(公告)日：2023-03-09

申请号：US17740838

申请日：2022-05-10

Applicant: Samsung Electronics Co., Ltd. ,  INCHEON NATIONAL UNIVERSITY RESEARCH & BUSINESS FOUNDATION

Inventor： Eunhyoung CHO ,  Sunghee LEE ,  Jeongyub LEE ,  Han-Bo-Ram LEE

IPC: C23C16/455 ,  H01L21/02 ,  C23C16/40

Abstract: A method and an apparatus for filling a gap by using an atomic layer deposition (ALD) method are provided. The method includes forming a first reaction inhibition layer on a side wall of the gap; forming a first precursor layer by adsorbing a first reactant into a bottom of the gap and the side wall of the gap around the bottom of the gap; and forming a first atomic layer on the bottom of the gap and the side wall of the gap around the bottom of the gap by adsorbing a second reactant into the first precursor layer. The forming of the first reaction inhibition layer may include adsorbing a first reaction inhibitor into the side wall of the gap; and forming a second reaction inhibitor by removing a specific ligand from the first reaction inhibitor.

公开(公告)号：US20210297978A1

公开(公告)日：2021-09-23

申请号：US17258507

申请日：2019-07-11

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sunghee LEE ,  Junhak LIM ,  Taehun LIM

IPC: H04W60/00

Abstract: An electronic device comprises: at least one communication circuit configured to provide communication with a first external electronic device or a second external electronic device; at least one processor operatively connected to the at least one communication circuit; and a memory including device registration request information and operatively connected to the at least one processor, wherein the memory may store instructions configured to cause, when executed, at least one processor to: transmit, to the first external electronic device, a device registration request including at least device registration request information for registering the electronic device to the second external electronic device when a first communication is connected with the first external electronic device through the at least one communication circuit; receive a response to the device registration request from the first external electronic device; receive, from the second external electronic device, device registration update information that is updated on the basis of the registration request of the electronic device, based on the response, when a second communication is connected with the second external electronic device through the at least one communication circuit; and store the received device registration update information in the memory.