公开(公告)号：US20140333654A1

公开(公告)日：2014-11-13

申请号：US14272511

申请日：2014-05-08

Applicant: Shan Li

Inventor： Shan Li

IPC: G09G5/02 ,  G06T11/00

CPC classification number: G09G5/02 ,  G06T11/001 ,  G09G2340/06

Abstract: An image color adjusting method and an electronic device thereof are provided. The image color adjusting method includes following steps: obtaining multiple groups of first pixel data of an image in a first color space, and performing a color space transforming process for the first pixel data to obtain multiple groups of second pixel data of the image in a CIELAB color space, wherein each of the second pixel data includes a luminance component L*, a first color component a* and a second color component b*; adjusting the first color component and the second color component of the second pixel data to obtain multiple groups of third pixel data, and performing a color space transforming process for the third pixel data to obtain multiple groups of fourth pixel data corresponding to the third pixel data in the first color space.

Abstract translation: 提供了图像颜色调整方法及其电子装置。 图像颜色调整方法包括以下步骤：获得第一颜色空间中的图像的多组第一像素数据，并且对第一像素数据执行颜色空间变换处理，以获得图像的多组第二像素数据 CIELAB颜色空间，其中每个第二像素数据包括亮度分量L *，第一颜色分量a *和第二颜色分量b *; 调整第二像素数据的第一颜色分量和第二颜色分量以获得多组第三像素数据，并且对第三像素数据执行颜色空间变换处理，以获得与第三像素数据相对应的多组第四像素数据 在第一个颜色空间。

公开(公告)号：US20130260318A1

公开(公告)日：2013-10-03

申请号：US13512869

申请日：2012-03-27

Applicant: Shan Li

Inventor： Shan Li

IPC: B23K26/38 ,  G03F7/20

CPC classification number: B23K26/18 ,  B23K26/0006 ,  B23K26/066 ,  B23K26/352 ,  B23K2103/50

Abstract: Provided is a repair machine based glass substrate re-marking method, including (1) providing a repair machine and a digital micro-mirror device, in which the repair machine includes a main body, a carrier panel, a control unit, a storage unit, and a laser head; (2) mounting the digital micro-mirror device to the laser head and electrically connecting the digital micro-mirror device to the control unit; (3) placing a glass substrate to be marked on the carrier panel, the glass substrate having a photo-resist layer; (4) operating the control unit to retrieve a corresponding template pattern document from the storage unit and transmitting a template pattern signal of the template pattern document to the digital micro-mirror device; and (5) operating the laser head to emit a laser beam, which is projected by the digital micro-mirror device to the glass substrate to effect exposure of the photo-resist layer on the glass substrate.

Abstract translation: 提供了一种基于修复机的玻璃基板重新标记方法，其包括（1）提供修理机和数字微镜装置，其中修理机包括主体，承载板，控制单元，存储单元 ，和激光头; （2）将数字微镜装置安装到激光头并将数字微镜装置电连接到控制单元; （3）将要标记的玻璃基板放置在载体板上，所述玻璃基板具有光致抗蚀剂层; （4）操作控制单元以从存储单元检索相应的模板图案文档，并将模板图案文档的模板图案信号发送到数字微镜设备; 和（5）操作激光头以发射激光束，该激光束由数字微镜装置投影到玻璃基板上，以使光致抗蚀剂层在玻璃基板上曝光。

公开(公告)号：US20060138326A1

公开(公告)日：2006-06-29

申请号：US11192199

申请日：2005-07-27

Applicant: Zhi Cheng Jiang ,  Shan Li ,  Yuen Kwan Kam ,  Yi Wei Liu

Inventor： Zhi Cheng Jiang ,  Shan Li ,  Yuen Kwan Kam ,  Yi Wei Liu

IPC: G21K7/00 ,  G01N23/00

CPC classification number: G01B15/02 ,  G01N23/2276

Abstract: A system and method for measuring the thickness of an ultra-thin multi-layer film on a substrate is disclosed. A physical model of an ultra-thin multilayer structure and Auger electron emission from the nano-multilayer structure is built. A mathematical model for the Auger Electron Spectroscopy (AES) measurement of the multilayer thin film thickness is derived according to the physical model. Auger electron spectroscopy (AES) is first performed on a series of calibration samples. The results are entered into the mathematical model to determine the parameters in the mathematical equation. The parameters may be calibrated by the correlation measurements of the alternate techniques. AES analysis is performed on the ultra-thin multi-layer film structure. The results are entered into the mathematical model and the thickness is calculated.