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公开(公告)号：US20200233016A1
公开(公告)日：2020-07-23
申请号：US16734756
申请日：2020-01-06
Applicant: Tektronix, Inc.
Inventor： Keith D. Rule , Sean T. Marty
IPC: G01R13/28
Abstract: A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.
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公开(公告)号：US09329967B2
公开(公告)日：2016-05-03
申请号：US13675286
申请日：2012-11-13
Applicant: Tektronix, Inc.
Inventor： Keith D. Rule , Walter R. Strand , Keith A. Olson , Michael J. Wadzita , Steve M. Mishler
CPC classification number: G06F11/322 , G06F11/221 , G06F11/26 , G06F11/321 , G06F11/323
Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.
Abstract translation: 描述了用于浏览与信号的一个或多个层（诸如串行或并行总线）的状态有关的信息的方法和相关系统。 可以通过选择示波器或类似测量仪器上所示的视觉内的场来显示信息。 通过选择特定的领域和指标，可以分析层的不同方面，而不需要对测量仪器的操作有广泛的了解。
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公开(公告)号：US20150057978A1
公开(公告)日：2015-02-26
申请号：US14501750
申请日：2014-09-30
Applicant: Tektronix, Inc.
Inventor： Keith D. Rule , Edward F. Tanous , James Feist
IPC: G01R13/02
CPC classification number: G01R13/0254
Abstract: A test and measurement instrument includes a user interface and a controller. The controller is configured to receive a serial bit stream and apply a logic to the serial bit stream to identify states within the serial bit stream. The result of applying the logic to the serial bit stream is a combined state/bit stream. A regular expression can be applied to the combined state/bit stream: the regular expression can include state information. The controller is also configured to present output data through the user interface in response to the application of the regular expression to the combined state/bit stream.
Abstract translation: 测试和测量仪器包括用户界面和控制器。 控制器被配置为接收串行比特流并将逻辑应用于串行比特流以识别串行比特流内的状态。 将逻辑应用于串行比特流的结果是组合的状态/比特流。 正则表达式可以应用于组合状态/位流：正则表达式可以包括状态信息。 控制器还被配置为响应于正则表达式对组合的状态/位流的应用，通过用户界面呈现输出数据。
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公开(公告)号：US20230333148A1
公开(公告)日：2023-10-19
申请号：US18135066
申请日：2023-04-14
Applicant: Tektronix, Inc.
Inventor： Lance H. Forsberg , Keith D. Rule , David N. Wyban
CPC classification number: G01R23/005 , G01R13/0227 , G01R13/0272 , G01R1/0416 , G01R1/025
Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.
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Patent Agency Ranking
公开(公告)号：US20230012393A1
公开(公告)日：2023-01-12
申请号：US17859989
申请日：2022-07-07
Applicant: Tektronix, Inc.
Inventor： Keith D. Rule
IPC: G01R31/319 , G01R31/317 , G01R31/302
Abstract: A test and measurement instrument includes one or more ports including at least one test port configured to couple to one or more devices under test, a user interface to receive one or more user inputs, an acquisition memory to store waveform data acquired from the one or more devices under test, one or more processors configured to execute code that causes the one or more processors to: receive an input through the user interface; determine one or more requested data types based on the input; transform the waveform data into compressed data containing only data elements corresponding to the one or more requested data types; and transmit the compressed data to a client. A method of providing usage-aware compressed data from a test and measurement instrument includes acquiring waveform data from one or more devices under test, receiving a user input through a user interface, determining one or more requested data types based on the user input, transforming the waveform data into compressed data containing only data elements corresponding to the one or more requested data types, and transmitting the compressed data to a client.
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公开(公告)号：US20220268839A1
公开(公告)日：2022-08-25
申请号：US17681617
申请日：2022-02-25
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , Keith D. Rule , Mark Anderson Smith
IPC: G01R31/3183 , G01R31/317 , G01R31/319
Abstract: A test and measurement system includes a primary instrument having an input for receiving a test signal for measurement or analysis from a Device Under Test (DUT) and generating a test waveform from the test signal, and a duplicator for sending a copy of the test waveform to one or more secondary instruments. The one or more secondary instruments are each structured to access the copy of the test signal for analysis, and each of the one or more secondary instruments includes a receiver structured to receive a command related to measurement or analysis of the copy of the test waveform, one or more processes for executing the received command, and an output for sending results of the executed command to be displayed on a user interface that is separate from any user interface of the one or more secondary instruments.
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公开(公告)号：US20210081257A1
公开(公告)日：2021-03-18
申请号：US17019146
申请日：2020-09-11
Applicant: Tektronix, Inc.
Inventor： Timothy E. Sauerwein , Clinton M. Alter , Sean T. Marty , Jenny Yang , Keith D. Rule
IPC: G06F9/52
Abstract: A method of synchronizing tasks in a test and measurement system, includes receiving, at a client in the system, a task input, receiving, at a job manager running on a first device processor in the system, a call from the client to create a job associated with the task, returning to the client an action containing at least one job code block associated with the job, receiving a call for the action, executing the at least one job code block by at least one processor in the system, determining that the job has completed, and completing the task. A system of devices including at least one test and measurement device and a device controller, the device controller having at least one user input, a device controller processor configured to execute instructions, and at least one memory to store the data and to store instructions in the form of executable code, wherein the code causes the device controller processor to receive an input from a client, the input identifying a task, create a job associated with the task, return to the client an action containing at least one job code block associated with the task, receive a call for the action, determine that the job has completed, and notify the client that the job has completed.
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18.发明申请公开(公告)号：US20180356445A1
公开(公告)日：2018-12-13
申请号：US16003084
申请日：2018-06-07
Applicant: Tektronix, Inc.
Inventor： David C. Vollum , Seamus L. Brokaw , Byron T. Faber , Keith D. Rule
IPC: G01R13/02
CPC classification number: G01R13/0272
Abstract: A test and measurement instrument including an interface configured to receive one or more preconditions for data acquisition, the one or more preconditions defining one or more rules to which data received during the data acquisition is to conform, and one or more processors. The one or more processors are configured to receive the one or more preconditions for data acquisition, determine whether the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, configure the test and measurement instrument to implement the one or more preconditions for data acquisition when the test and measurement instrument can be configured to implement the one or more preconditions for data acquisition, and generate one or more alerts when the test and measurement instrument cannot be configured to implement the one or more preconditions for data acquisition.
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公开(公告)号：US20140136899A1
公开(公告)日：2014-05-15
申请号：US13675286
申请日：2012-11-13
Applicant: Tektronix, Inc.
Inventor： Keith D. Rule , Walter R. Strand , Keith A. Olson , Michael J. Wadzita , Steve M. Mishler
IPC: G06F11/26
CPC classification number: G06F11/322 , G06F11/221 , G06F11/26 , G06F11/321 , G06F11/323
Abstract: Method and related systems are described for navigating through information related to the status of one or more layers of a signal, such as a serial or parallel bus. Information may be displayed by selecting fields within a visual depicted on an oscilloscope or similar measuring instrument. By selecting particular fields, and indicators, different aspects of a layer may be analyzed without the need to have extensive knowledge of the operation of the measuring instrument.
Abstract translation: 描述了用于浏览与信号的一个或多个层（诸如串行或并行总线）的状态有关的信息的方法和相关系统。 可以通过选择示波器或类似测量仪器上所示的视觉内的场来显示信息。 通过选择特定的领域和指标，可以分析层的不同方面，而不需要对测量仪器的操作有广泛的了解。
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