公开(公告)号：US20230333148A1

公开(公告)日：2023-10-19

申请号：US18135066

申请日：2023-04-14

Applicant: Tektronix, Inc.

Inventor： Lance H. Forsberg ,  Keith D. Rule ,  David N. Wyban

IPC: G01R23/00 ,  G01R13/02 ,  G01R1/04 ,  G01R1/02

CPC classification number: G01R23/005 ,  G01R13/0227 ,  G01R13/0272 ,  G01R1/0416 ,  G01R1/025

Abstract: A test and measurement instrument includes an input for accepting an input signal from a Device Under Test (DUT), acquisition memory for storing a sampled waveform derived from the input signal, an output display, and one or more processors configured to accept a portion of the sampled waveform as a search portion, search the sampled waveform for portions similar to the search portion, and visually indicate, on the output display, portions of the sampled waveform that are similar to the search portion as matched portions. Methods of operation and description of storage media, the operation of which performs the above operations, are also described.