EFFICIENT STATISTICAL TIMING ANALYSIS OF CIRCUITS
    11.
    发明申请
    EFFICIENT STATISTICAL TIMING ANALYSIS OF CIRCUITS 有权
    电路的有效统计时序分析

    公开(公告)号:US20070277134A1

    公开(公告)日:2007-11-29

    申请号:US11420322

    申请日:2006-05-25

    IPC分类号: G06F17/50

    摘要: Statistical timing analysis methods for circuits are described which compensate for circuit elements having correlated timing delays with a high degree of computational efficiency. An quadratic timing model is used to represent each delay element along a circuit path, wherein each element's delay has a first-order relationship to local variations and a second-order relationship to global variations. Propagation of the modeled delays through the circuit is efficiently done via straightforward ADD operations where an input propagates through another element in a circuit path, and via a MAX operation (or an approximation thereof) where two or more inputs merge at an intersection. The inputs to the MAX operator can be tested for gaussianity, and can be processed by the MAX operation (or its approximation) if they are substantially gaussian. Otherwise, they may be stored in a tuple for processing at later points along the circuit path.

    摘要翻译: 描述了用于补偿具有高计算效率的具有相关定时延迟的电路元件的电路的统计时序分析方法。 二次定时模型用于沿着电路路径表示每个延迟元件,其中每个元件的延迟与局部变化和与全局变化的二阶关系具有一级关系。 经由电路的建模延迟的传播通过简单的ADD操作有效地进行,其中输入传播通过电路路径中的另一元件,并且经由其中两个或多个输入在交叉点合并的MAX操作(或其近似)。 可以对MAX运算符的输入进行高斯测试,如果MAX操作基本为高斯,则可以通过MAX操作(或其近似)进行处理。 否则,它们可以存储在元组中,以便在沿着电路路径的稍后点进行处理。

    Efficient statistical timing analysis of circuits
    12.
    发明申请
    Efficient statistical timing analysis of circuits 有权
    电路的有效统计时序分析

    公开(公告)号:US20070113211A1

    公开(公告)日:2007-05-17

    申请号:US11282003

    申请日:2005-11-17

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5031

    摘要: Statistical timing analysis methods for circuits are described which compensate for circuit elements having correlated timing delays with a high degree of computational efficiency. An extended canonical timing model is used to represent each delay element along a circuit path, wherein the model bears information regarding any correlations that each element has to any other elements in the circuit (and/or to any external global factors, e.g., global temperature variations over the circuit, etc.). The model can be represented in a vectorized format which allows enhancement of computational efficiency, wherein the coefficients of the vectors allow an objective measure of element correlation (and wherein the vectors can be “pruned” by dropping insignificant coefficients to further enhance computational efficiency). A decomposition procedure can be used to decompose correlated elements into uncorrelated elements to allow delays to me more easily propagated through the timing diagram representing the circuit. Finally, a bounded approximation for the output of the MAX operator is described which provides a safely conservative approximation regardless of the linearity of the MAX output.

    摘要翻译: 描述了用于补偿具有高计算效率的具有相关定时延迟的电路元件的电路的统计时序分析方法。 扩展规范定时模型用于表示沿着电路路径的每个延迟元件,其中模型承载关于每个元件对电路中的任何其他元件(和/或任何外部全局因素,例如全局温度)的任何相关性的信息 电路上的变化等)。 该模型可以以允许增强计算效率的向量化格式表示,其中矢量的系数允许元素相关性的客观测量(并且其中可以通过丢弃不重要的系数来“修剪”矢量以进一步提高计算效率)。 分解过程可以用于将相关元素分解为不相关元素,以允许延迟通过表示电路的时序图更容易地传播。 最后,描述了MAX运算器的输出的有界近似,其提供了安全保守的近似,而与MAX输出的线性无关。

    Method, system, and program product for accommodating spatially-correlated variation in a process parameter
    13.
    发明授权
    Method, system, and program product for accommodating spatially-correlated variation in a process parameter 失效
    用于在过程参数中适应空间相关变化的方法,系统和程序产品

    公开(公告)号:US07212946B1

    公开(公告)日:2007-05-01

    申请号:US11272234

    申请日:2005-11-10

    IPC分类号: G06F17/18 G06F15/00 G06F19/00

    CPC分类号: G06F17/5031

    摘要: The invention provides a method, system, and program product for accommodating spatially-correlated variation in a process parameter during statistical timing of a circuit. In one embodiment, the method includes dividing an area of the circuit into a plurality of grid cells; associating an independent random variable with each of the plurality of grid cells; and expressing at least one spatially-correlated parameter of a first grid cell as a function of the random variables associated with the first grid cell and at least one neighboring grid cell.

    摘要翻译: 本发明提供一种用于在电路的统计定时期间适应处理参数的空间相关变化的方法,系统和程序产品。 在一个实施例中,该方法包括将电路的区域划分成多个网格单元; 将独立随机变量与所述多个网格单元中的每一个相关联; 以及将与第一网格单元和至少一个相邻网格单元相关联的随机变量的函数表达为第一网格单元的至少一个空间相关参数。

    METHOD AND APPARATUS FOR FORMATION TESTING AND SAMPLING WHEN PERFORMING SUBTERRANEAN OPERATIONS
    14.
    发明申请
    METHOD AND APPARATUS FOR FORMATION TESTING AND SAMPLING WHEN PERFORMING SUBTERRANEAN OPERATIONS 有权
    在执行地下工作时形成测试和采样的方法和装置

    公开(公告)号:US20150027216A1

    公开(公告)日:2015-01-29

    申请号:US14384991

    申请日:2012-03-29

    申请人: Lizheng Zhang

    发明人: Lizheng Zhang

    IPC分类号: E21B49/00 E21B47/09 E21B49/10

    摘要: Methods and systems for improving operations of a formation tester are disclosed. The formation tester (400) is placed in a wellbore at a location of interest. The formation tester comprises a first isolation pad (402) coupled to a pad carrier (410) and a second isolation pad (404). The first isolation is extendable to substantially seal a probe of the formation tester against a well bore wall. The first isolation pad is then replaced with the second isolation pad if it is determined that the first isolation pad should be replaced with the second isolation pad.

    摘要翻译: 公开了用于改善地层测试仪操作的方法和系统。 地层测试仪(400)置于感兴趣位置的井眼中。 地层测试仪包括耦合到衬垫载体(410)和第二隔离垫(404)的第一隔离垫(402)。 第一隔离是可扩展的,以基本上密封地层测试器的探针抵靠井眼壁。 如果确定第一隔离垫应该被第二隔离垫替代,则第一隔离垫被第二隔离垫替代。

    Statistical iterative timing analysis of circuits having latches and/or feedback loops
    15.
    发明授权
    Statistical iterative timing analysis of circuits having latches and/or feedback loops 有权
    具有锁存器和/或反馈回路的电路的统计迭代时序分析

    公开(公告)号:US07793245B2

    公开(公告)日:2010-09-07

    申请号:US11966265

    申请日:2007-12-28

    IPC分类号: G06F17/50 G06F9/45

    CPC分类号: G06F17/5031

    摘要: Statistical timing analysis methods for circuits having latches and feedback loops are described wherein the circuit yield, and/or the critical cycle mean (the largest cycle mean among all loops in the circuit), may be iteratively calculated with high speed and accuracy, thereby allowing their ready usage in the analysis and validation of proposed circuit designs.

    摘要翻译: 描述了具有锁存器和反馈回路的电路的统计时序分析方法,其中电路产量和/或临界循环平均值(电路中所有回路中的最大周期平均值)可以以高速度和精确度迭代地计算,从而允许 它们在拟议的电路设计的分析和验证中的准备使用。

    STATISTICAL ITERATIVE TIMING ANALYSIS OF CIRCUITS HAVING LATCHES AND/OR FEEDBACK LOOPS
    17.
    发明申请
    STATISTICAL ITERATIVE TIMING ANALYSIS OF CIRCUITS HAVING LATCHES AND/OR FEEDBACK LOOPS 有权
    具有锁存器和/或反馈灯的电路的统计迭代时序分析

    公开(公告)号:US20090055785A1

    公开(公告)日:2009-02-26

    申请号:US11966265

    申请日:2007-12-28

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5031

    摘要: Statistical timing analysis methods for circuits having latches and feedback loops are described wherein the circuit yield, and/or the critical cycle mean (the largest cycle mean among all loops in the circuit), may be iteratively calculated with high speed and accuracy, thereby allowing their ready usage in the analysis and validation of proposed circuit designs.

    摘要翻译: 描述了具有锁存器和反馈回路的电路的统计时序分析方法,其中电路产量和/或临界循环平均值(电路中所有回路中的最大周期平均值)可以以高速度和精确度迭代地计算,从而允许 它们在拟议的电路设计的分析和验证中的准备使用。

    Efficient statistical timing analysis of circuits
    18.
    发明授权
    Efficient statistical timing analysis of circuits 有权
    电路的有效统计时序分析

    公开(公告)号:US07350171B2

    公开(公告)日:2008-03-25

    申请号:US11282003

    申请日:2005-11-17

    IPC分类号: G06F17/50 G06F17/15 G06F17/18

    CPC分类号: G06F17/5031

    摘要: Statistical timing analysis methods for circuits are described which compensate for circuit elements having correlated timing delays with a high degree of computational efficiency. An extended canonical timing model is used to represent each delay element along a circuit path, wherein the model bears information regarding any correlations that each element has to any other elements in the circuit (and/or to any external global factors, e.g., global temperature variations over the circuit, etc.). The model can be represented in a vectorized format which allows enhancement of computational efficiency, wherein the coefficients of the vectors allow an objective measure of element correlation (and wherein the vectors can be “pruned” by dropping insignificant coefficients to further enhance computational efficiency). A decomposition procedure can be used to decompose correlated elements into uncorrelated elements to allow delays to me more easily propagated through the timing diagram representing the circuit. Finally, a bounded approximation for the output of the MAX operator is described which provides a safely conservative approximation regardless of the linearity of the MAX output.

    摘要翻译: 描述了用于补偿具有高计算效率的具有相关定时延迟的电路元件的电路的统计时序分析方法。 扩展规范定时模型用于表示沿着电路路径的每个延迟元件,其中模型承载关于每个元件对电路中的任何其他元件(和/或任何外部全局因素,例如全局温度)的任何相关性的信息 电路上的变化等)。 该模型可以以允许增强计算效率的向量化格式表示,其中矢量的系数允许元素相关性的客观测量(并且其中可以通过丢弃不重要的系数来“修剪”矢量以进一步提高计算效率)。 分解过程可以用于将相关元素分解为不相关元素,以允许延迟通过表示电路的时序图更容易地传播。 最后,描述了MAX运算器的输出的有界近似,其提供了安全保守的近似,而与MAX输出的线性无关。

    Inspection systems and methods
    19.
    发明申请
    Inspection systems and methods 失效
    检验系统和方法

    公开(公告)号:US20050225754A1

    公开(公告)日:2005-10-13

    申请号:US11086473

    申请日:2005-03-22

    IPC分类号: G01N21/88 G01N21/956

    CPC分类号: G01N21/95684 G01N21/95607

    摘要: Embodiments of inspection systems and methods are disclosed. One embodiment of an inspection system, among others, comprises logic configured to receive a reference signal and a target signal, the reference signal having first surface displacement information and the target signal having second surface displacement information, said logic configured to determine a correlation coefficient between the first surface displacement information and the second surface displacement information, the correlation coefficient indicating whether an inspected object exhibits a defect.

    摘要翻译: 公开了检查系统和方法的实施例。 检查系统的一个实施例包括被配置为接收参考信号和目标信号的逻辑,参考信号具有第一表面位移信息,并且目标信号具有第二表面位移信息,所述逻辑被配置为确定 第一表面位移信息和第二表面位移信息,指示被检查物体是否表现出缺陷的相关系数。

    Statistical iterative timing analysis of circuits having latches and/or feedback loops
    20.
    发明授权
    Statistical iterative timing analysis of circuits having latches and/or feedback loops 有权
    具有锁存器和/或反馈回路的电路的统计迭代时序分析

    公开(公告)号:US08341569B2

    公开(公告)日:2012-12-25

    申请号:US12842268

    申请日:2010-07-23

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5031

    摘要: Statistical timing analysis methods for circuits having latches and feedback loops are described wherein the circuit yield, and/or the critical cycle mean (the largest cycle mean among all loops in the circuit), may be iteratively calculated with high speed and accuracy, thereby allowing their ready usage in the analysis and validation of proposed circuit designs.

    摘要翻译: 描述了具有锁存器和反馈回路的电路的统计时序分析方法,其中电路产量和/或临界循环平均值(电路中所有回路中的最大周期平均值)可以以高速度和精确度迭代地计算,从而允许 它们在拟议的电路设计的分析和验证中的准备使用。