摘要:
A writing operation selecting circuit is provided for selecting a temporary writing operation having a prescribed writing time for a memory cell transistor element and an additional writing operation for the memory cell transistor element. A writing time control circuit is provided for controlling an additional writing operation time by an output signal of the writing operation selecting circuit.
摘要:
A flatness detector has a fixed shaft and a plurality of rotary rings loosely fitted over the shaft and adjacent to each other along an axis of the shaft, a pneumatic bearing being defined by a gap between the rings and the shaft. The shaft is provided with heating means for heating the shaft to prevent shrinkage of a rolled strip due to temperature variations of the strip as well as bending means at opposite ends of the shaft for bending the shaft in a predetermined direction so as to prevent formation of lengthwise wrinkles on the rolled strip.
摘要:
A memory controller outputs an additional writing instruction to one of a plurality of non-volatile memories arbitrarily selected via a writing instruction output unit when a signal which rejects a writing operation is not outputted from writing controllers of the plurality of non-volatile memories for a certain period of time, and outputs a temporary writing instruction to another non-volatile memory at least once via the writing instruction output unit by the time when the additional writing operation is completed in the arbitrary non-volatile memory.
摘要:
In a nonvolatile memory cell having a trap layer, programming or erasing is made in a sequence of first charge injection with a given wait time being secured and second charge injection executed after the first charge injection. Surrounding charge that deteriorates the data retention characteristic is reduced by use of initial variation occurring immediately after programming (charge loss phenomenon due to binding of injected charge with the surrounding charge in an extremely short time), and then the charge loss due to the initial variation is compensated, to thereby improve the data retention characteristic.
摘要:
Even when the number of rewrite operations varies among erase unit areas, the number of rewrite operations is improved for all of the erase unit areas. A flash EEPROM 100 comprises a trimming value storing area 130 of storing a trimming value corresponding to each erase unit area 120 included in a memory cell array 110. When an erase operation and a write operation are performed with respect to a certain erase unit area 120, a regulator circuit 150 converts a voltage boosted by a booster circuit 140 to a level corresponding to the trimming value for the erase unit area 120. When a read determination circuit 170 detects an abnormality as the number of rewrite operations is increased, the trimming value is updated to a value which causes the regulator circuit 150 to increase the output voltage.