Semiconductor memory device
    3.
    发明授权

    公开(公告)号:US12125528B2

    公开(公告)日:2024-10-22

    申请号:US17896929

    申请日:2022-08-26

    发明人: Naofumi Abiko

    摘要: A semiconductor memory device includes memory cell transistors and a control circuit. In a write operation, the control circuit executes multiple loops each including a program operation, a verify operation, and a bit scan operation. In the bit scan operation, the control circuit performs, a first process of generating verify result data in parallel for a group of memory cell transistors having different target threshold voltage states, the verify result data for each memory cell transistor in the group indicating whether the memory cell transistor has reached its target threshold voltage state, and a second process of calculating for each of the target threshold voltage states, the number of memory cell transistors that have not reached their target threshold voltage states.