公开(公告)号：US20130320216A1

公开(公告)日：2013-12-05

申请号：US13984286

申请日：2012-02-01

申请人： Kenji Aiko ,  Shigeya Tanaka ,  Yasuko Aoki ,  Hiroshi Kawaguchi ,  Kei Shimura

发明人： Kenji Aiko ,  Shigeya Tanaka ,  Yasuko Aoki ,  Hiroshi Kawaguchi ,  Kei Shimura

IPC分类号： G01N21/88

CPC分类号： G01N21/88 ,  G01B11/303 ,  G01N21/3563 ,  G01N21/3581 ,  G01N21/8806 ,  G01N21/94 ,  H01M4/0404 ,  H01M4/139 ,  Y02E60/122

摘要： The present invention provides a device for detecting foreign matter and a method for detecting foreign matter to detect a foreign matter on a surface of an object such as a film of an electrode mixture etc. or a foreign matter contained in the object, thereby to improve the reliability of the object. By irradiating an object with a terahertz illumination light 100 (wavelength of 4 μm to 10 mm) and detecting a scattered light 660 from an electrode 10 as an example of the object by a scattered light detector 200, a foreign matter on a surface of the electrode 10 or contained in the electrode 10, for example, a metal foreign matter 720, is detected. The electrode 10 is one in which electrode mixture layers 700 each including an active material 701, conductive additive and a binder as components are coated on both surfaces of a collector 710. The scattered light 660 results from a part of a transmitted light 656 reflected by the metal foreign matter 720.

摘要翻译： 本发明提供一种检测异物的装置和检测异物以检测诸如电极混合物等的膜或物体中包含的异物的物体的表面上的异物的方法，从而改善 对象的可靠性。 通过用太赫兹照明光100（波长4μm至10mm）照射物体并通过散射光检测器200从作为物体的实例的电极10检测散射光660，在该表面上的异物 检测电极10中或容纳在电极10中的金属异物720。 电极10是其中各自包含活性材料701，导电添加剂和作为组分的粘合剂的电极混合物层700涂覆在集电体710的两个表面上的。散射光660由透射光656的一部分反射， 金属异物720。

公开(公告)号：US06333962B1

公开(公告)日：2001-12-25

申请号：US09326598

申请日：1999-06-07

申请人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

发明人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

IPC分类号： G01T100

CPC分类号： G01N23/046 ,  G01N23/043 ,  G01N2223/419

摘要： A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.

摘要翻译： 非破坏性检查装置具有辐射源，辐射检测器，辐射源潜水员，检测器驱动器，驱动控制器，延迟电路，辐射信号处理电路，存储器，计算机，显示设备和 输入设备。 放射线检测器由具有长准直器的一维或二维检测器阵列组成，其具有与辐射源以角度图案发射的辐射的辐射角平行的孔，由此具有大尺寸结构的透射图像 可以高速，高分辨率地获得。 此外，可以通过使用检查装置分析多个指定的发送图像来指定检查对象中的检测位置。

公开(公告)号：US6049586A

公开(公告)日：2000-04-11

申请号：US326593

申请日：1999-06-07

申请人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

发明人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

IPC分类号： G01N23/04

CPC分类号： G01N23/046 ,  G01N23/043 ,  G01N2223/419

摘要： A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.

摘要翻译： 非破坏性检查装置具有辐射源，辐射检测器，辐射源潜水员，检测器驱动器，驱动控制器，延迟电路，辐射信号处理电路，存储器，计算机，显示设备和 输入设备。 辐射检测器由具有长准直器的一维或二维检测器阵列组成，其长孔与辐射源以角度图案发射的辐射的辐射角平行，从而形成大尺寸结构的透射图像 可以高速，高分辨率地获得。 此外，可以通过使用检查装置分析多个指定的发送图像来指定检查对象中的检测位置。

公开(公告)号：US5933473A

公开(公告)日：1999-08-03

申请号：US832163

申请日：1997-04-02

申请人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

发明人： Hiroshi Kitaguchi ,  Shigeru Izumi ,  Hiroshi Miyai ,  Katsutoshi Sato ,  Yasuko Aoki ,  Yukiya Hattori

IPC分类号： G01N23/04 ,  G01T1/00

CPC分类号： G01N23/046 ,  G01N23/043 ,  G01N2223/419

摘要： A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.