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32 条记录 (耗时 0.043 秒)

    Inspecting method, inspecting apparatus, and defect correcting method
    11.
    发明授权
    Inspecting method, inspecting apparatus, and defect correcting method 失效
    检查方法，检查装置和缺陷修正方法

    公开(公告)号：US5532615A

    公开(公告)日：1996-07-02

    申请号：US158843

    申请日：1993-11-24

    申请人： Naofumi Kondo ,  Mikio Katayama ,  Masaya Okamoto ,  Makoto Miyago ,  Kiyoshi Nakazawa ,  Yuzuru Kanemori ,  Makoto Tachibana

    发明人： Naofumi Kondo ,  Mikio Katayama ,  Masaya Okamoto ,  Makoto Miyago ,  Kiyoshi Nakazawa ,  Yuzuru Kanemori ,  Makoto Tachibana

    IPC分类号： G09G3/00 ,  G01R31/02

    CPC分类号： G09G3/006 ,  G09G2330/10

    摘要： This invention provides an inspecting method, an inspecting apparatus, and a defect correcting method, for an active matrix substrate including: a gate bus line; a source bus line; a pixel electrode; a switching element for driving the pixel electrode; and a pair of electrodes constituting an auxiliary capacitance. The inspecting method includes: a step of disposing a counter substrate having a face on which a counter electrode is formed so that the face faces the active matrix substrate with a liquid crystal layer interposed therebetween, and connecting signal supplying terminals to gate bus lines and source bus lines and the counter electrode; and a detection step of detecting a defect on the active matrix substrate by performing at least one of a first signal generating step, a second signal generating step, and a third signal generating step. The first, second, and third signal generating steps all include alternately applying an ON signal for turning on the switching element and an OFF signal for turning off the switching element to the gate bus line. The first signal generating step includes applying a first detecting signal having a voltage which changes before the ON signal is applied to the source bus line. The second signal generating step includes applying a second detecting signal having a voltage which changes before and after the ON signal is applied. The third signal generating step includes applying a third detecting signal having a voltage which changes after the ON signal is applied.

    摘要翻译： 本发明提供了一种用于有源矩阵基板的检查方法，检查装置和缺陷校正方法，包括：栅极总线; 源总线; 像素电极; 用于驱动像素电极的开关元件; 以及构成辅助电容的一对电极。 检查方法包括：将具有面对面的对置基板设置在其上形成有相对电极的步骤，使得面向有源矩阵基板的面朝向液晶层，并将信号提供端子连接到栅极总线和源极 总线和对电极; 以及检测步骤，通过执行第一信号产生步骤，第二信号产生步骤和第三信号产生步骤中的至少一个来检测有源矩阵衬底上的缺陷。 第一，第二和第三信号产生步骤都包括交替地施加用于接通开关元件的ON信号和用于将开关元件截止到栅极总线的OFF信号。 第一信号产生步骤包括将具有在ON信号被施加之前改变的电压的第一检测信号施加到源总线上。 第二信号产生步骤包括施加具有在ON信号被施加之前和之后变化的电压的第二检测信号。 第三信号产生步骤包括施加在施加ON信号之后改变的电压的第三检测信号。

    Active matrix display device
    16.
    发明授权
    Active matrix display device 失效
    主动矩阵显示装置

    公开(公告)号：US5434686A

    公开(公告)日：1995-07-18

    申请号：US123847

    申请日：1993-09-09

    申请人： Yuzuru Kanemori ,  Akihiko Imaya ,  Hiroaki Kato ,  Kozo Yano ,  Katsumi Irie

    发明人： Yuzuru Kanemori ,  Akihiko Imaya ,  Hiroaki Kato ,  Kozo Yano ,  Katsumi Irie

    IPC分类号： G02F1/133 ,  G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09F9/30 ,  H01L29/786 ,  G02F1/1343

    CPC分类号： G02F1/13624 ,  G02F2001/136263

    摘要： An active matrix display device comprising two pixel electrodes in each rectangular area defined by adjacent signal lines and adjacent scanning lines. The pixel electrodes disposed across each signal line are connected with respective switching elements, which are connected to the common scanning line and the common signal line. In this way, each pixel electrode has only one signal line formed on one side thereof. As a result, a line defect conventionally produced by a leakage between adjacent signal lines through a pixel electrode is prevented. Further, a defective pixel can be easily corrected by short-circuiting the pixel electrode with the adjacent signal line.

    摘要翻译： 一种有源矩阵显示装置，包括由相邻信号线和相邻的扫描线限定的每个矩形区域中的两个像素电极。 每个信号线上设置的像素电极与连接到公共扫描线和公共信号线的各个开关元件连接。 以这种方式，每个像素电极在其一侧上仅形成一条信号线。 结果，防止了通过像素电极的相邻信号线之间的泄漏常规地产生的线缺陷。 此外，通过用相邻信号线短路像素电极，可以容易地校正有缺陷的像素。

    Display electrode substrate
    19.
    发明授权
    Display electrode substrate 失效
    显示电极基板

    公开(公告)号：US5410164A

    公开(公告)日：1995-04-25

    申请号：US816856

    申请日：1992-01-02

    申请人： Mikio Katayama ,  Yuzuru Kanemori ,  Hirohisa Tanaka ,  Hiroshi Morimoto ,  Hidenori Negoto

    发明人： Mikio Katayama ,  Yuzuru Kanemori ,  Hirohisa Tanaka ,  Hiroshi Morimoto ,  Hidenori Negoto

    IPC分类号： G02F1/136 ,  G02F1/1362 ,  G02F1/1368 ,  G09F9/30 ,  G09F9/35 ,  H01L27/12 ,  H01L29/78 ,  H01L29/786 ,  H01L27/01 ,  H01L27/13

    CPC分类号： H01L27/12 ,  G02F1/13624

    摘要： A display elect:rode substrate comprising at least two, first and second, TFTs connected in series to each picture element, wherein the first and second thin film transistors are Juxtaposed on the same one of the gate bus lines, part of the gate bus line functions as gate electrodes of the first and second thin film transistors, a source electrode of the first thin film transistor is connected to the source bus line, a drain electrode of the first thin film transistor is connected to a source electrode of the second thin film transistor, and a drain electrode of the second thin film transistor is connected to the picture element electrode, whereby a picture element defect caused by a short-circuit defect of the TFTs can be reduced.

    摘要翻译： 一种显示器电极，包括至少两个与每个像素串联连接的第一和第二TFT，其中第一和第二薄膜晶体管并置在同一个栅极总线上，栅极总线的一部分 用作第一和第二薄膜晶体管的栅电极，第一薄膜晶体管的源电极连接到源极总线，第一薄膜晶体管的漏电极连接到第二薄膜的源电极 晶体管，并且第二薄膜晶体管的漏电极连接到像素电极，由此可以减少由TFT的短路缺陷引起的像素缺陷。