Abstract:
A signal processor includes a frequency generator that employs a direct digital synthesizer (DDS) to generate a first local oscillator (LO) signal with a variable first LO frequency. The signal processor also includes an oscillator generating a second LO signal having a second LO frequency. The DDS employs programmable frequency control word and a sampling clock signal having a variable sampling clock frequency that is derived from the second LO frequency, to generate a DDS output signal from which the first LO signal is produced. The variable sampling clock frequency and the programmable frequency control word are selected to avoid crossing spurs in the frequency spectrum of the DDS output signal.
Abstract:
A DDS system is disclosed that is configured to provide a variable clock delay that allows timing of data coming out of the ROM to be adjusted. In one example case, a DDS system is provided that includes a ROM for storing phase-to-amplitude conversion data and generating digital amplitude values corresponding to respective digital phase values, and delay circuitry for adjusting timing of data output by the ROM to compensate for propagation delay of the DDS system. The delay circuitry may include, for instance, delay elements that can be selected alone or in combination to adjust the timing. The timing can be adjusted, for example, by adjusting delay of a clock signal that clocks one or more ROM pipeline registers. The system may include a phase accumulator and DAC, and adjusting the timing may include adjusting delay of a clock signal that clocks one or more DAC pipeline registers.
Abstract:
A DDS system is disclosed that is configured to provide a variable clock delay that allows timing of data coming out of the ROM to be adjusted. In one example case, a DDS system is provided that includes a ROM for storing phase-to-amplitude conversion data and generating digital amplitude values corresponding to respective digital phase values, and delay circuitry for adjusting timing of data output by the ROM to compensate for propagation delay of the DDS system. The delay circuitry may include, for instance, delay elements that can be selected alone or in combination to adjust the timing. The timing can be adjusted, for example, by adjusting delay of a clock signal that clocks one or more ROM pipeline registers. The system may include a phase accumulator and DAC, and adjusting the timing may include adjusting delay of a clock signal that clocks one or more DAC pipeline registers.
Abstract:
An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator produces a series of digital values approximating a sine wave. These values are computed, avoiding the need for large memories to store tables representing sine waves. Inaccuracies in the representation of the sine waves do not impact the accuracy of the resultant sine wave because circuitry used to correct for non-linearity errors in a digital-to-analog converter is programmed to also correct for errors introduced by approximating a sine wave with a computed function. A simple parabolic function may be used to compute approximations of a sine wave.
Abstract:
A method for compensating NCO jitter by changing a step value used to increment an accumulator in the NCO to make up for inaccuracies, or jitters. In one approach, a remainder in the accumulator may be monitored and a compensated clock close to the current edge of an ideal clock may be generated. In another approach, a compensated clock close to the next edge of the ideal clock may be generated after the current edge of the ideal clock is missed. The step value may be stored in a memory, which may be a register. A jitter compensator may include a comparator for monitoring the remainder in the accumulator or a detector for detecting whether an ideal clock has been missed. The jitter compensator may also change the step value to a step value for a faster clock to compensate jitter.
Abstract:
A method for controlling a synthesized local oscillator (SLO) includes: receiving a control input specifying a desired SLO output; receiving reference clock signal; generating a predefined set of dynamic clock signals from the reference clock signal; selecting a dynamic clock signal from the predefined set of dynamic clock signals in response to the control input; using the dynamic clock signal as an input to a direct digital synthesizer (DDS) module to generate a DDS output signal; selecting a DDS output band in response to the control input, the DDS output band including one of a baseband and an alias band; and processing the DDS output band to generate the SLO output.
Abstract:
An automatic test system that includes low cost and accurate circuitry for generating sinusoidal signals. Each sinusoidal signal generator produces a series of digital values approximating a sine wave. These values are computed, avoiding the need for large memories to store tables representing sine waves. Inaccuracies in the representation of the sine waves do not impact the accuracy of the resultant sine wave because circuitry used to correct for non-linearity errors in a digital-to-analog converter is programmed to also correct for errors introduced by approximating a sine wave with a computed function. A simple parabolic function may be used to compute approximations of a sine wave.
Abstract:
A single chip digital frequency synthesiser (1) for synthesising a frequency swept synthesised output signal of a selectable frequency sweep comprises a direct digital synthesiser (5) which produces the frequency swept synthesised output signal on an output terminal (7) in response to values of a frequency control digital word applied to a frequency control input (8) thereof by an on-chip data processing circuit (25). An on-chip programmable data storing circuit (12) is programmable to store data indicative of a selected mode in which the digital frequency synthesiser (1) is to operate, and to store data indicative of selectable frequency and the time domains of the frequency swept synthesised output signal to be produced. The data processing circuit (25) reads the mode of operation and the frequency domain data and if appropriate the time domain data of a frequency swept synthesised output signal to be produced by the digital frequency synthesiser (1) from the data storing circuit (12), and computes the values of the frequency control digital word and the sequence in which the values of the frequency control digital word are to be applied to the direct digital synthesiser (5). Depending on the mode of operation, the data processing circuit (25) determines the rate at which the values of the frequency control digital word are to be applied to the direct digital synthesiser (5) in response to a logic control signal applied to a control terminal (20) or as a function of a number of clock cycles of a system clock signal applied on a system clock terminal (10) or a number of cycles of the frequency swept synthesised output signal. The frequency swept synthesised output signal may also be produced in frequency bursts.
Abstract:
An automatic test system using a DDS signal generator to create a signal with high spectral purity or a low jitter digital clock. The low jitter clock has variable frequency and is programmed to control other test functions, such as the generation of arbitrary waveforms. The DDS uses a high resolution, high sampling rate DAC to generate a sine wave that is converted to a digital clock. The architecture of the DDS signal generator allows low cost CMOS circuitry to be used to generate the data stream that feeds the high sample rate DAC.
Abstract:
A clock generation circuit for a dual system radio frequency station is provided. The station includes a digital synthesis circuit clocked by a first clock signal for a first RF system that is adapted to generate a base signal output of a predetermined frequency. A second clock signal is derived from the sum of the frequency of the base signal and the frequency of the first clock signal.