公开(公告)号：US20030068008A1

公开(公告)日：2003-04-10

申请号：US10232192

申请日：2002-08-30

发明人： Thomas Schmitt

IPC分类号： G01B015/02

CPC分类号： A61B6/4464 ,  A61B6/548

摘要： An X-ray examination device for mounting at a ceiling of an examination room has a support mechanism for a patient to be examined, a first adjustment device attachable to the ceiling for holding and moving an X-ray radiator, and a second adjustment device attachable to the ceiling for holding and moving a radiation receiver. The adjustment devices are arranged and fashioned such that the X-ray radiator as well as the radiation receiver can be brought from one side with respect to the middle longitudinal axis of the support mechanism onto the opposite side. The adjustment devices each have guide rails at which transverse carriers are movable. The X-ray examination device allows an especially large number of examination techniques and transillumination perspectives.

摘要翻译： 用于安装在检查室的天花板处的X射线检查装置具有用于待检查的患者的支撑机构，可附接到用于保持和移动X射线辐射器的天花板的第一调节装置，以及可附接的第二调节装置 到达用于保持和移动辐射接收器的天花板。 调整装置的布置和形状使得X射线辐射器以及辐射接收器可以相对于支撑机构的中间纵向轴线从相对侧的一侧带入。 调整装置各自具有横向载体可移动的导轨。 X射线检查装置允许特别大量的检查技术和透照透视。

公开(公告)号：US20020114425A1

公开(公告)日：2002-08-22

申请号：US09977012

申请日：2001-10-11

发明人： Philipp Lang ,  Daniel Steines

IPC分类号： G01B015/02 ,  G01N023/06

CPC分类号： A61B6/505 ,  A61B6/14 ,  A61B6/4423 ,  A61B6/508 ,  A61B6/583 ,  G06T7/0012 ,  G06T7/41 ,  G06T2207/10116 ,  G06T2207/20036 ,  G06T2207/30008

摘要： The present invention relates to methods and devices for analyzing x-ray images. In particular, devices, methods and algorithms are provided that allow for the accurate and reliable evaluation of bone mineral density and bone structure from x-ray images.

摘要翻译： 本发明涉及用于分析X射线图像的方法和装置。 特别地，提供了允许从x射线图像准确和可靠地评估骨矿物质密度和骨结构的装置，方法和算法。

公开(公告)号：US20020025020A1

公开(公告)日：2002-02-28

申请号：US09903236

申请日：2001-07-12

发明人： Masao Sato

IPC分类号： G01B015/02 ,  G01N023/223

CPC分类号： G01N23/223 ,  G01B15/02 ,  G01N2223/076

摘要： In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, a collimator for focusing primary X-rays, and a sample observation optical system for positioning and observation of microscopic sections. As thickness testing means, as detectors for detecting X-ray fluorescence generated from the sample there is one sensor having low counting efficiency but excellent energy resolution used for low energy counting, and another sensor having poor energy resolution but excellent counting efficiency used for counting high energy, these two sensors being arranged next to each other, and in stages subsequent to the detector preamps there are separate linear amps and frequency analyzers with respective signals being subjected to processing as spectrums for qualitative and quantitative analysis in a common control and computing section.

摘要翻译： 为了使用特征在于非破坏性和非接触性的X射线荧光厚度测定仪来实现精确测量，系统包括X射线发生源，用于聚焦初级X射线的准直器和样品观察光学系统 用于微观切片的定位和观察。 作为厚度测定手段，作为用于检测从样品产生的X射线荧光的检测器，存在一种具有低计数效率的传感器，而用于低能量计数的优异的能量分辨率，另一种传感器具有较差的能量分辨率，但优异的计数效率用于计数高 能量，这两个传感器彼此相邻布置，并且在检测器前置放大器之后的阶段中，存在单独的线性放大器和频率分析器，其中各个信号作为用于在公共控制和计算部分中的定性和定量分析的频谱进行处理。

公开(公告)号：US20020012418A1

公开(公告)日：2002-01-31

申请号：US09916519

申请日：2001-07-27

发明人： Masao Sato

IPC分类号： G01B015/02 ,  G01N023/223

CPC分类号： G01N23/223 ,  G01B15/02 ,  G01N2223/076

摘要： In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, means for focusing primary X-rays, and a sample observation optical system for positioning and observation of microscopic sections. As thickness measuring means, as detectors for detecting X-ray fluorescence generated from the sample there is one sensor having a low rate but excellent energy resolution used for counting low energy X-rays, and another sensor having poor energy resolution but an excellent count rate used for counting high energy X-rays. These two sensors are arranged next to each other, and in stages subsequent to the detector preamps there are separate linear amps and frequency analyzers with respective signals being subjected to spectral processing for qualitative and quantitative analysis in a common control and computing section.

摘要翻译： 为了实现以非破坏性和非接触性的X射线荧光厚度测定仪的精确测量，系统包括X射线产生源，用于聚焦主X射线的装置和用于 微观切片的定位和观察。 作为厚度测量装置，作为用于检测从样品产生的X射线荧光的检测器，存在具有低速率但是用于计数低能量X射线的优异的能量分辨率的一个传感器，以及具有差的能量分辨率但是具有优异的计数率的另一个传感器 用于计算高能X射线。 这两个传感器彼此相邻地布置，并且在检测器前置放大器之后的阶段中，存在单独的线性放大器和频率分析器，其中相应的信号在公共控制和计算部分中进行定性和定量分析的频谱处理。

公开(公告)号：US20010002925A1

公开(公告)日：2001-06-07

申请号：US09727193

申请日：2000-11-30

申请人： CyberLogic, Inc.,

发明人： Robert S. Siffert ,  Jonathan J. Kaufman

IPC分类号： G01B015/02

CPC分类号： A61B6/505 ,  A61B6/482 ,  A61B6/583

摘要： Non-invasive quantitative plain radiographic evaluation of bone in a bony locale of a body is performed by subjecting the bony locale to a broadband collimated x-ray beam having energy in the range of about 20 keV to 150 keV. Alongside the bony locale is a composite phantom. The composite phantom is comprised of at least two materials, superimposed on one another. An energy-selective multiple-film detector cassette containing at least two films is placed under the body and composite phantom to receive the transmitted x-ray beam. The films in the cassette are developed and digitally scanned to produce sets of composite phantom data and sets of bone data. The data sets are then numerically processed using interpolation whereby to generate the indicated estimate of bone status, namely, bone-mineral density. In an alternative embodiment, an independent measurement is made of the total tissue thickness, and the bone status is determined using interpolation based only on a single film.

摘要翻译： 通过对骨骼区域进行能量在约20keV至150keV范围内的宽带准直X射线束进行身体的骨骼区域中的骨的非侵入性定量平片摄影评估。 除了骨骼之外，还有一个复合幻影。 复合体模包含至少两种彼此重叠的材料。 将包含至少两个膜的能量选择性多层膜检测器盒放置在身体和复合体模之下以接收透射的X射线束。 开发和数字扫描盒中的胶片以产生一组复合幻影数据和一组骨数据。 然后使用插值对数据集进行数字处理，从而产生指示的骨状态估计，即骨 - 矿物质密度。 在替代实施例中，对总组织厚度进行独立测量，并且使用仅基于单个膜的插值来确定骨骼状态。

公开(公告)号：US20040131148A1

公开(公告)日：2004-07-08

申请号：US10739673

申请日：2003-12-17

发明人： Helmut Fischer ,  Volker Robiger

IPC分类号： G01B015/02 ,  G01N023/223

CPC分类号： G01B15/02 ,  G01N23/223 ,  G01N2223/076

摘要： An apparatus for measurement of the thickness of thin layers by means of X-rays using an X-ray tube which emits X-rays which are directed at a layer to be measured, has at least one aperture apparatus arranged between the X-ray tube and the layer to be measured. The apparatus includes an area absorbing X-rays and an aperture opening. At least one aperture opening in the aperture apparatus has a geometric shape which, seen in the beam direction, projects an area which at least in places is matched to the geometry of the layer to be measured.

摘要翻译： 一种利用X射线管测量薄层厚度的装置，该X射线管发射指向被测层的X射线，具有至少一个孔径装置，其设置在X射线管 和要测量的层。 该装置包括吸收X射线和孔径开口的区域。 开口装置中的至少一个开口开口具有几何形状，其在波束方向上看到至少在与被测量层的几何形状匹配的区域上突出。

公开(公告)号：US20040109531A1

公开(公告)日：2004-06-10

申请号：US10313280

申请日：2002-12-06

发明人： Boris Yokhin ,  Isaac Mazor ,  David Berman

IPC分类号： G01B015/02

CPC分类号： G01B15/00 ,  G01N23/20

摘要： A method for testing a surface of a sample includes irradiating the surface at a grazing incidence with a beam of radiation having a focal region, whereby the radiation is reflected from the surface. At least one of the focal region and the sample is adjusted through a plurality of adjustment stages within an adjustment range so as to vary a location of the focal region relative to the surface. Respective angular profiles of the radiation reflected from the surface are measured at the plurality of adjustment stages, and the angular profiles are compared in order to select an adjustment within the range at which the surface is in a desired alignment with the beam.

摘要翻译： 用于测试样品表面的方法包括用具有聚焦区域的辐射束以掠入射照射表面，由此辐射从表面反射。 焦点区域和样本中的至少一个通过调整范围内的多个调节台进行调节，以便改变聚焦区域相对于表面的位置。 在多个调整阶段测量从表面反射的辐射的各个角度分布，并且比较角剖面，以便在表面与光束所期望的对准的范围内选择调节。

公开(公告)号：US20040047447A1

公开(公告)日：2004-03-11

申请号：US10225534

申请日：2002-08-21

发明人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin ,  Patrick W. Dehaven ,  Kenneth P. Rodbell ,  Sandra G. Malhotra

IPC分类号： G01B015/02

CPC分类号： G01N23/20 ,  G01B15/02

摘要： An apparatus and method for mapping film thickness of one or more textured polycrystalline thin films. Multiple sample films of known thickness are provided. Each sample film is irradiated by x-ray at a measurement point to generate a diffraction image that captures a plurality of diffraction arcs. Texture information (i.e., pole densities) of the sample film, is calculated based on incomplete pole figures collected on the diffraction image and used to correct the x-ray diffraction intensities from such sample. The corrected diffraction intensities are integrated for each sample film, and then used for constructing a calibration curve that correlates diffraction intensities with respective known film thickness of the sample films. The film thickness of a textured polycrystalline thin film of unknown thickness can therefore be mapped on such calibration curve, using a corrected and integrated diffraction intensity obtained for such thin film of unknown thickness.

摘要翻译： 一种用于映射一个或多个纹理多晶薄膜的膜厚度的装置和方法。 提供了已知厚度的多个样品膜。 每个样品膜在测量点用X射线照射，以产生捕获多个衍射弧的衍射图像。 基于在衍射图像上收集的不完全的极数计算样品膜的纹理信息（即极点密度），并用于校正这些样品的X射线衍射强度。 对每个样品膜整合校正的衍射强度，然后用于构建将衍射强度与样品膜的已知膜厚度相关联的校准曲线。 因此，可以使用未知厚度的薄膜获得的校正和积分的衍射强度，将这种具有未知厚度的纹理多晶薄膜的膜厚度映射到这种校准曲线上。

公开(公告)号：US20030215057A1

公开(公告)日：2003-11-20

申请号：US10063806

申请日：2002-05-15

申请人： GENERAL ELECTRIC COMPANY

发明人： Dinko Eduardo Gonzalez Trotter ,  Serge Louis Muller

IPC分类号： G01B015/02

CPC分类号： G06T11/005 ,  G01N23/046 ,  G01N2223/419

摘要： A method of estimating an asymmetrical scatter signal distribution wherein asymmetry is introduced by angular incidence of radiation, which has been emitted from a source and transmitted through an object to be imaged, on a detector, is disclosed. This method includes, in an embodiment, modifying scatter that would be derived wherein the radiation is directly incident on the detector with zero degrees of inclination, using an asymmetry factor which indicates the shape and magnitude of the scatter signal distribution and which varies with an angle at which the radiation is incident on the detector, a mean attenuation coefficient of the object, and a distance the radiation has traveled through the object. The estimated scatter provides for correction of scatter in a image.

摘要翻译： 公开了一种估计不对称散射信号分布的方法，其中不对称性是通过已经从源发射并通过待成像对象传输的辐射的角入射引入到检测器上的。 在一个实施例中，该方法包括修改将导出的散射，其中使用表示散射信号分布的形状和大小的不对称因子，其以辐射信号分布的形状和幅度直接入射到具有零倾角的检测器上，并且其以角度 辐射入射到检测器上的物体的平均衰减系数以及辐射已穿过物体的距离。 估计的散射提供了对图像中的散射的校正。

公开(公告)号：US20030112921A1

公开(公告)日：2003-06-19

申请号：US10225083

申请日：2002-08-20

发明人： Philipp Lang ,  Daniel Steines

IPC分类号： G01B015/02

CPC分类号： G06T7/0012 ,  A61B6/14 ,  A61B6/4423 ,  A61B6/505 ,  A61B6/508 ,  A61B6/583 ,  G06T2207/30008

摘要： The present invention relates to methods and devices for analyzing x-ray images. In particular, devices, methods and algorithms are provided that allow for the accurate and reliable evaluation of bone structure from x-ray images.

摘要翻译： 本发明涉及用于分析X射线图像的方法和装置。 特别地，提供了允许从x射线图像准确可靠地评估骨骼结构的装置，方法和算法。