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    Three component x-ray bone densitometry
    1.
    发明申请
    Three component x-ray bone densitometry 失效
    三组分x射线骨密度测定

    公开(公告)号：US20040190679A1

    公开(公告)日：2004-09-30

    申请号：US10719783

    申请日：2003-11-20

    发明人： Robert G. Waggener ,  Elizabeth Wieckowska

    IPC分类号： G01B015/02 ,  G01N023/06

    CPC分类号： A61B6/505 ,  A61B6/4035 ,  A61B6/4241 ,  A61B6/482 ,  A61B6/583

    摘要： The in vivo three component areal density composition of a patient along a transmitted x-ray beam is derived by raster-scanning a collimated x-ray beam across a bony region of the patient, with each point scanned at different energies, and using matrix equations with a priori spectra information to solve for the relative areal density of soft tissue, fat and bone.

    摘要翻译： 沿着透射的X射线束的患者的体内三组分面积密度组成通过在患者的骨区域扫描准直的X射线束而得到，每个点以不同的能量扫描，并且使用矩阵方程 具有先验光谱信息，以解决软组织，脂肪和骨骼的相对面密度。

    Nondestructive characterization of thin films based on acquired spectrum
    2.
    发明申请
    Nondestructive characterization of thin films based on acquired spectrum 有权
    基于获得光谱的薄膜的非破坏性表征

    公开(公告)号：US20040125913A1

    公开(公告)日：2004-07-01

    申请号：US10330317

    申请日：2002-12-27

    申请人： Physical Electronics, Inc.

    发明人： Paul E. Larson ,  David G. Watson

    IPC分类号： G01B015/02

    CPC分类号： G01B15/02

    摘要： The present invention provides for characterization of a film (e.g., thickness determination for a silicon oxynitride film) using collected spectral data. For example, an acquired spectrum may be cumulatively integrated and the geometric properties of the integrated spectrum may be used to determine component concentration information. Thickness measurements for the film may be provided based on the component concentration information.

    摘要翻译： 本发明提供使用收集的光谱数据表征膜（例如，氮氧化硅膜的厚度测定）。 例如，获取的频谱可以被累积地整合，并且可以使用积分频谱的几何特性来确定分量浓度信息。 可以基于组分浓度信息提供膜的厚度测量。

    Density measurement method and apparatus therefor
    3.
    发明申请
    Density measurement method and apparatus therefor 有权
    密度测量方法及其装置

    公开(公告)号：US20030112920A1

    公开(公告)日：2003-06-19

    申请号：US10291792

    申请日：2002-11-12

    申请人： Imperial Chemical Industries PLC

    发明人： Lee M. Robins

    IPC分类号： G01B015/02

    CPC分类号： G01N23/06

    摘要： The density of a mass of material is determined by passing radiation from a source, such as Co-60, whose radiation spectrum has a characteristic energy level above 700 keV through the mass of material to a detector that can detect radiation at a energy level, or range of energy levels, within the range 80 to 700 keV. By determining the density of the mass of material at different locations, the density profile of the mass of material can be assessed.

    摘要翻译： 通过将来自诸如Co-60的源的辐射通过辐射光谱具有高于700keV的特征能量通过材料质量到能够检测能级的辐射的检测器来确定质量物质的密度， 或能量范围，在80至700keV的范围内。 通过确定不同位置处材料质量的密度，可以评估材料质量的密度分布。

    Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements
    4.
    发明申请
    Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements 失效

    公开(公告)号：US20030081725A1

    公开(公告)日：2003-05-01

    申请号：US10310593

    申请日：2002-12-04

    发明人： Jon Opsal ,  Allan Rosencwaig

    IPC分类号： G01B015/02

    CPC分类号： G01N23/20

    摘要： This invention provides a measurement device that includes both an X-ray reflectometer and a thermal or plasma wave measurement module for determining the characteristics of a sample. Preferably, these two measurement modules are combined into a unitary apparatus and arranged to be able to take measurements at the same location on the wafer. A processor will receive data from both modules and combine that data to resolve ambiguities about the characteristics of the sample. The processor can be part of the device or separate therefrom as long as the measurement data is transferred to the processor.

    Plain x-ray bone densitometry apparatus and method
    7.
    发明申请
    Plain x-ray bone densitometry apparatus and method 失效

    公开(公告)号：US20010004394A1

    公开(公告)日：2001-06-21

    申请号：US09726823

    申请日：2000-11-30

    申请人： CyberLogic, Inc.

    发明人： Robert S. Siffert ,  Jonathan J. Kaufman

    IPC分类号： G01B015/02

    CPC分类号： A61B6/505 ,  A61B6/482 ,  A61B6/583

    摘要： Non-invasive quantitative plain radiographic evaluation of bone in a bony locale of a body is performed by subjecting the bony locale to a broadband collimated x-ray beam having energy in the range of about 20 keV to 150 keV. Alongside the bony locale is a composite phantom. The composite phantom is comprised of at least two materials, superimposed on one another. An energy-selective multiple-film detector cassette containing at least two films is placed under the body and composite phantom to receive the transmitted x-ray beam. The films in the cassette are developed and digitally scanned to produce sets of composite phantom data and sets of bone data. The data sets are then numerically processed using interpolation whereby to generate the indicated estimate of bone status, namely, bone-mineral density. In an alternative embodiment, an independent measurement is made of the total tissue thickness, and the bone status is determined using interpolation based only on a single film.

    Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths
    8.
    发明申请
    Method and device for the determination of the thickness of the insulation of a flat ribbon cable in the region of the conductor paths 失效
    用于确定导体路径区域中扁平带状电缆的绝缘层的厚度的方法和装置

    公开(公告)号：US20040184575A1

    公开(公告)日：2004-09-23

    申请号：US10767667

    申请日：2004-01-29

    发明人： Harald Sikora

    IPC分类号： G01B015/02 ,  G01N023/223

    CPC分类号： G01N23/223 ,  G01B15/02 ,  G01N2223/076

    摘要： Method for the determination of the thickness of the insulation of a flat ribbon cable in the region of the metallic conductor paths, wherein one side of the flat ribbon cable is irradiated by means of an x-ray beam, and a detector on the same or on the opposing side of the flat ribbon cable measures the intensity of the x-ray luminescence radiation emitted by the respective conductor paths, the detector being shielded against the x-ray radiation.

    摘要翻译： 用于确定金属导体路径区域中的扁平带状电缆的绝缘层的厚度的方法，其中扁平带状电缆的一侧通过X射线束照射，以及在其上的检测器， 在扁平带状电缆的相对侧上测量由各个导体路径发射的x射线发光辐射的强度，检测器被屏蔽在x射线辐射上。

    DEVICE AND METHOD FOR TOMOGRAPHY AND DIGITAL X-RAY RADIOGRAPHY OF A FLEXIBLE RISER
    9.
    发明申请
    DEVICE AND METHOD FOR TOMOGRAPHY AND DIGITAL X-RAY RADIOGRAPHY OF A FLEXIBLE RISER 审中-公开
    灵活上升器的TOMOGRAPHY和数字X射线放射学的装置和方法

    公开(公告)号：US20030142783A1

    公开(公告)日：2003-07-31

    申请号：US10062565

    申请日：2002-02-05

    申请人： STATOIL ASA

    发明人： Alf Daaland ,  Charles R. Smith ,  Christian Frederik Otto Hagemann

    IPC分类号： G01B015/02 ,  G01N023/06

    CPC分类号： G01N23/046 ,  G01N23/06 ,  G01N2223/419

    摘要： An x-ray radiography tomography device for a flexible riser, particularly a riser end fitting on a riser hangoff block on a petroleum platform, the x-ray radiography device comprising the following features: a) an x-ray source (1) of about 6 to 9 MeV arranged for directing said x-rays generally through an adjacent and an opposite sidewall portion of said riser; b) a collimator (2) arranged between said x-ray source (1) and said sidewall of said riser pipe being adjacent to said source (1), said collimator (2) arranged for directing radiation said x-rays in a beam fan generally extending in a plane perpendicular to a long axis of the riser; c) a sensor array (3) for receiving said x-ray beam fan after passage throug said riser pipe, said array comprising a plurality of scintillation detectors (30), said sensor array (3) arranged generally opposite of said source (1) with respect to said riser tube, and extending along a line extending generally perpendicular to said axis of said riser; d) an internal frame (7) for rotating the x-ray source (1), the collimator (2) and the sensor array (3) generally about said axis of said riser, said framework arranged on a circular guide rail (10) mounted around said flexible riser hangoff block.

    摘要翻译： 一种用于柔性提升管的X射线摄影断层摄影装置，特别是在石油平台上的提升板悬挂块上的提升管端部配件，所述X射线摄影装置包括以下特征：a）约x的X射线源（1） 6至9MeV布置成用于将所述X射线通常通过所述提升管的相邻侧壁部分和相对侧壁部分引导; b）布置在所述x射线源（1）和所述提升管的所述侧壁之间的准直器（2），邻近所述源（1），所述准直器（2）被布置成用于将辐射所述x射线 通常在垂直于提升管的长轴的平面中延伸; c）传感器阵列（3），用于在通过所述提升管之后接收所述x射线束风扇，所述阵列包括多个闪烁检测器（30），所述传感器阵列（3）与所述源（1）大致相对地布置， 相对于所述提升管，并且沿着大致垂直于所述提升管的所述轴延伸的线延伸; d）用于通常围绕所述提升管的所述轴线旋转x射线源（1），准直器（2）和传感器阵列（3）的内部框架（7），所述框架布置在圆形导轨（10）上， 安装在所述柔性提升板悬挂块周围。

    Method and apparatus for measuring thickness of thin film
    10.
    发明申请
    Method and apparatus for measuring thickness of thin film 失效
    测量薄膜厚度的方法和装置

    公开(公告)号：US20030132381A1

    公开(公告)日：2003-07-17

    申请号：US10336766

    申请日：2003-01-06

    申请人： NEC Electronics Corporation

    发明人： Yosuke Itagaki ,  Keizo Yamada ,  Takeo Ushiki

    IPC分类号： G01B015/02 ,  H01J037/28

    CPC分类号： G01B15/02 ,  H01J2237/2815

    摘要： A film thickness measuring apparatus applies an electron beam to a thin film as a measurement object formed on a substrate, and measures a value of substrate current that flows in the substrate thereupon. The film thickness measuring apparatus corrects the substrate current value taking into account an influence of a charge distribution generated in the neighborhood of the thin film due to the application of the electron beam or an influence of a configuration of the surface of the substrate in the neighborhood of the thin film. The film thickness measuring apparatus acquires reference data representing a correlation between film thicknesses and substrate current values with respect to standard samples and calculates a thickness of the thin film from the corrected substrate current value taking into account the reference data.

    摘要翻译： 膜厚测量装置将电子束作为形成在基板上的测量对象的薄膜施加电子束，并测量在其中流过衬底的衬底电流的值。 考虑到由于施加电子束而导致在薄膜附近产生的电荷分布的影响或者邻近的基板表面的构成的影响，膜厚测量装置校正了衬底电流值 的薄膜。 膜厚测量装置获取表示相对于标准样品的膜厚度和衬底电流值之间的相关性的参考数据，并且从校正的衬底电流值考虑参考数据计算薄膜的厚度。