Buried local interconnect in finfet structure and method of fabricating same
    201.
    发明授权
    Buried local interconnect in finfet structure and method of fabricating same 有权
    在finfet结构中埋置局部互连及其制造方法

    公开(公告)号:US09324842B2

    公开(公告)日:2016-04-26

    申请号:US14135716

    申请日:2013-12-20

    CPC classification number: H01L29/66795 H01L21/30604 H01L29/41791 H01L29/785

    Abstract: A method for fabricating a finfet with a buried local interconnect and the resulting device are disclosed. Embodiments include forming a silicon fin on a BOX layer, forming a gate electrode perpendicular to the silicon fin over a portion of the silicon fin, forming a spacer on each of opposite sides of the gate electrode, forming source/drain regions on the silicon fin at opposite sides of the gate electrode, recessing the BOX layer, undercutting the silicon fin and source/drain regions, at opposite sides of the gate electrode, and forming a local interconnect on a recessed portion of the BOX layer.

    Abstract translation: 公开了一种用于制造具有埋入局部互连的鳍片的方法,以及所得到的器件。 实施例包括在BOX层上形成硅翅片,在硅鳍片的一部分上形成垂直于硅鳍片的栅电极,在栅电极的每个相对侧上形成间隔物,在硅片上形成源极/漏极区域 在栅电极的相对侧,使BOX层凹陷,在栅电极的相对侧处切割硅鳍和源极/漏极区,并在BOX层的凹陷部分上形成局部互连。

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