公开(公告)号：US20150058656A1

公开(公告)日：2015-02-26

申请号：US14505740

申请日：2014-10-03

Applicant: Micron Technology, Inc.

Inventor： Kang-Yong Kim ,  Jacob Robert Anderson ,  Huy Vo

IPC: G06F12/06 ,  G06F1/08

CPC classification number: G11C7/20 ,  G11C29/003 ,  G11C29/32 ,  G11C29/50012 ,  G11C2029/0407 ,  H01L25/0657

Abstract: Apparatuses, master-slave detect circuits, memories, and methods are disclosed. One such method includes performing a master detect phase during which a memory unit in a memory group is determined to be a master memory unit, determining at each memory unit its location relative to other memory units, and determining at each memory unit its location in the memory group based on a total number of slave memory units and its location relative to other memory units.

Abstract translation: 公开了设备，主 - 从检测电路，存储器和方法。 一种这样的方法包括执行主检测阶段，在此期间，将存储器组中的存储器单元确定为主存储器单元，在每个存储器单元处确定其相对于其他存储器单元的位置，以及在每个存储器单元处确定其位于 存储器组基于从属存储器单元的总数及其相对于其他存储器单元的位置。