公开(公告)号：US20090318810A1

公开(公告)日：2009-12-24

申请号：US12485836

申请日：2009-06-16

Applicant: Jong Min Park ,  Jin Yong Lee ,  Young Seuk Song

Inventor： Jong Min Park ,  Jin Yong Lee ,  Young Seuk Song

IPC: A61B8/14

CPC classification number: A61B8/00 ,  A61B8/467 ,  A61B8/54 ,  G01S7/52084 ,  G01S15/899

Abstract: There are disclosed embodiments for controlling an operation of an ultrasound system based on an impact applied thereto. In the ultrasound system designed to operate in a plurality of diagnostic modes, a user may be verified based on the impact pattern applied to the ultrasound system. Also, a desirable diagnostic mode of the ultrasound system may be selected and executed based on the impact pattern. The ultrasound system may include an ultrasound diagnostic unit to form ultrasound images based on ultrasound echo signals reflected from a target object. An impact detecting unit may detect impacts applied to the ultrasound diagnostic unit from a user to thereby output impact pattern information. A control unit may control an operation of the ultrasound diagnostic unit based on the impact pattern information so that the diagnostic mode corresponding to the impact pattern information may be executed.

Abstract translation: 公开了基于施加到其上的冲击来控制超声系统的操作的实施例。 在被设计为以多种诊断模式操作的超声系统中，可以基于施加到超声系统的冲击模式来验证用户。 此外，可以基于冲击模式来选择和执行超声系统的期望的诊断模式。 超声系统可以包括基于从目标对象反射的超声回波信号来形成超声图像的超声诊断单元。 撞击检测单元可以从用户检测施加到超声诊断单元的影响，从而输出冲击模式信息。 控制单元可以基于冲击模式信息来控制超声诊断单元的操作，从而可以执行与冲击模式信息相对应的诊断模式。

公开(公告)号：US20080276949A1

公开(公告)日：2008-11-13

申请号：US11806542

申请日：2007-06-01

Applicant: Jin Yong Lee

Inventor： Jin Yong Lee

IPC: A41G5/00

CPC classification number: A41G5/0066 ,  A41G5/008

Abstract: Disclosed is an ornamental hair piece. The ornamental hair piece includes hair strands with tips being connectively arranged in a row; an upper hair arranging band constituted by a base and securing loops, the base having a width and a height suitable for seating the tips of the hair strands thereon and the securing loops being successively formed on the top of the base in a lateral direction to pass through natural hair bundles therethrough; and a securing means for gathering and securing more than two bundles of natural hairs that passed through the securing loop, wherein, the base and the securing loops of the upper hair arranging band are made of flexible materials, and the securing means is positioned on the base.

Abstract translation: 公开了一种装饰性发饰。 装饰性发片包括具有连接排列成一列的尖端的发丝; 由基部和固定环组成的上部毛发排列带，该基部具有宽度和高度，适合于将发丝的顶端放置在其上，固定环在横向上依次形成在基部的顶部以通过 通过自然发束; 以及固定装置，用于收集和固定穿过固定环的多于两束的自然毛发，其中，上部毛发排列带的基部和固定环由柔性材料制成，并且固定装置位于 基础。

公开(公告)号：US07408371B2

公开(公告)日：2008-08-05

申请号：US11416374

申请日：2006-05-02

Applicant: Tak-Yung Kim ,  Jin-Yong Lee ,  Shin-Mo Kang

Inventor： Tak-Yung Kim ,  Jin-Yong Lee ,  Shin-Mo Kang

IPC: G01R31/26 ,  G01R31/28

CPC classification number: G01R31/31937

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal. The apparatus is configured to measure an on-chip delay using a period of the first oscillation, or to measure a timing margin of the semiconductor circuit using an output of the timing test unit, based on an output of the selection unit.

Abstract translation: 提供一种用于测量半导体电路中的片上特性的装置。 用于测量片上特性的装置包括振荡单元，定时测试单元和选择单元。 振荡单元被配置为响应于第一控制信号选择性地输出第一振荡信号。 定时测试单元被配置为使用输入时钟信号产生第二振荡信号，响应于第二控制信号从第二振荡信号产生脉冲，并且基于第二振荡的比较来确定是否发生了工作时间冲突 信号和脉冲。 选择单元被配置为响应于测试模式信号选择振荡单元的输出和定时测试单元的输出中的一个。 该装置被配置为使用第一振荡的周期来测量片上延迟，或者基于选择单元的输出，使用定时测试单元的输出来测量半导体电路的定时裕度。

公开(公告)号：US20130135292A1

公开(公告)日：2013-05-30

申请号：US13452232

申请日：2012-04-20

Applicant: Bong-heon LEE ,  Jin-yong LEE

Inventor： Bong-heon LEE ,  Jin-yong LEE

IPC: G06T17/00

CPC classification number: G06T19/00 ,  G06T2210/41

Abstract: A method and apparatus for combining a three-dimensional (3D) model with a plurality of two-dimensional (2D) images by adjusting degrees of transparency of the plurality of 2D images. The method includes: obtaining a plurality of 2D images; arranging the plurality of 2D images in a 3D space based on predetermined criteria;obtaining spatial coordinates of each of the plurality of 2D images arranged in the 3D space; generating a 3D model of the plurality of 2D images arranged in the 3D space based on the spatial coordinates; changing attribute information of the plurality of 2D images arranged in the 3D space; and displaying the 3D model and the plurality of 2D images whose attribute information is changed.

Abstract translation: 一种通过调整多个2D图像的透明度而将三维（3D）模型与多个二维（2D）图像组合的方法和装置。 该方法包括：获得多个2D图像; 基于预定标准在3D空间中排列多个2D图像; 获得排列在所述3D空间中的所述多个2D图像中的每一个的空间坐标; 基于空间坐标生成在3D空间中排列的多个2D图像的3D模型; 改变布置在3D空间中的多个2D图像的属性信息; 并显示属性信息被改变的3D模型和多个2D图像。

公开(公告)号：US08144961B2

公开(公告)日：2012-03-27

申请号：US11873903

申请日：2007-10-17

Applicant: Jin Yong Lee ,  Won Gee Oh

Inventor： Jin Yong Lee ,  Won Gee Oh

IPC: G06K9/00

CPC classification number: G01S7/52073 ,  G01S7/52084 ,  G06T7/0012 ,  G06T7/12 ,  G06T7/62 ,  G06T2207/10132 ,  G06T2207/20101 ,  G06T2207/30004

Abstract: An ultrasound diagnostic apparatus for providing on a display an ultrasound image including a target object and a pointer movable on the ultrasound image, comprises: an ultrasound image providing unit configured to provide an ultrasound image including a target object; a contour line extracting unit configured to extract a contour line of the target object in the ultrasound image; a coordinate recognizing unit configured to detect cross points while the pointer crosses the contour line and recognize the coordinates of the corner points; a user input unit configured to receive instructions from a user, said instructions including a selection instruction to select measure points among the cross points and a measure instruction to measure a size of the target object; a measuring unit configured to measure a size of the target object in response to the measure instruction based on coordinates of the measure points selected in response to the selection instruction; and an output unit configured to output the ultrasound image, the pointer, the contour line, the measure points and the size of the target object.

Abstract translation: 一种超声波诊断装置，用于在显示器上提供包括能够在超声波图像上移动的目标物体和指示物的超声波图像，其特征在于，包括：超声波图像提供部， 轮廓线提取单元，被配置为在所述超声波图像中提取所述目标对象的轮廓线; 坐标识别单元，被配置为在所述指针越过所述轮廓线并且识别所述角点的坐标时检测交叉点; 用户输入单元，被配置为从用户接收指令，所述指令包括用于选择交叉点之间的测量点的选择指令和用于测量目标对象的大小的测量指令; 测量单元，其被配置为响应于基于响应于所述选择指令而选择的所述测量点的坐标的所述测量指令来测量所述目标对象的大小; 以及输出单元，被配置为输出所述超声图像，所述指针，所述轮廓线，所述测量点和所述目标对象的大小。

公开(公告)号：US20110204164A1

公开(公告)日：2011-08-25

申请号：US12874314

申请日：2010-09-02

Applicant: In Seo PARK ,  Jin Yong LEE ,  Kwang Youn CHO

Inventor： In Seo PARK ,  Jin Yong LEE ,  Kwang Youn CHO

IPC: B02C11/08

CPC classification number: C04B35/83 ,  C04B35/6261 ,  C04B35/62655 ,  C04B35/6267 ,  C04B35/6269 ,  C04B2235/48 ,  C04B2235/5427 ,  C10C3/023

Abstract: The present invention discloses a method for preparing an impregnating pitch which is used for the manufacture of carbon-carbon composites having excellent mechanical properties at an ultra high temperature, abrasion resistance and the like, wherein the impregnating pitch having a low viscosity and an improved carbonization yield is provided by facilitating cross-linking reactions between the aromatic compounds in the pitch, while eliminating heat treatment.

Abstract translation: 本发明公开了一种制备浸渍沥青的方法，该浸渍沥青用于制造在超高温，耐磨性等方面具有优异的机械性能的碳 - 碳复合材料，其中浸渍沥青具有低粘度和改进的碳化作用 通过促进沥青中的芳族化合物之间的交联反应，同时消除热处理来提供产率。

公开(公告)号：US07677410B2

公开(公告)日：2010-03-16

申请号：US11662991

申请日：2005-09-13

Applicant: Jin Yong Lee

Inventor： Jin Yong Lee

IPC: B65H3/26

CPC classification number: B65H3/26 ,  A47K10/422 ,  A47K10/425 ,  A47K10/44 ,  A47K2010/3273 ,  A47K2010/3293 ,  B65H2301/33214 ,  B65H2405/51 ,  B65H2701/1924

Abstract: An apparatus for discharging tissue that is folded several times and stacked is provided. The apparatus includes a cartridge that holds stacked tissue and has a through hole at one end, and a holding member that is disposed adjacent to the through hole of the cartridge and pivots on an axis to grasp and remove tissues one at a time from the top of the stack through an arm. The inventive apparatus allows a user to easily replace tissue and check the amount of tissue used and the amount left to use through visual means. The apparatus virtually eliminates the problem of tissue dispensing failure, and has increased precision and reliability and reduced dispensing time over conventional apparatuses.

Abstract translation: 提供一种用于排出折叠多次并堆叠的组织的装置。 该装置包括一个保持堆叠的纸巾并且在一端具有一个通孔的盒，以及一个保持构件，该保持构件设置在与该盒的通孔相邻的位置，并且在一个轴线上枢转以从顶部一次一个地抓取和去除纸巾 的堆叠通过一个手臂。 本发明的装置允许用户容易地更换组织，并通过视觉方式检查使用的组织量和剩余的使用量。 该设备实际上消除了组织分配故障的问题，并且与常规设备相比，提高了精度和可靠性并减少了分配时间。

公开(公告)号：US20070080701A1

公开(公告)日：2007-04-12

申请号：US11416374

申请日：2006-05-02

Applicant: Tak-Yung Kim ,  Jin-Yong Lee ,  Shin-Mo Kang

Inventor： Tak-Yung Kim ,  Jin-Yong Lee ,  Shin-Mo Kang

IPC: G01R31/26

CPC classification number: G01R31/31937

Abstract: An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal. The apparatus is configured to measure an on-chip delay using a period of the first oscillation, or to measure a timing margin of the semiconductor circuit using an output of the timing test unit, based on an output of the selection unit.

Abstract translation: 提供一种用于测量半导体电路中的片上特性的装置。 用于测量片上特性的装置包括振荡单元，定时测试单元和选择单元。 振荡单元被配置为响应于第一控制信号选择性地输出第一振荡信号。 定时测试单元被配置为使用输入时钟信号产生第二振荡信号，响应于第二控制信号从第二振荡信号产生脉冲，并且基于第二振荡的比较来确定是否发生了工作时间冲突 信号和脉冲。 选择单元被配置为响应于测试模式信号选择振荡单元的输出和定时测试单元的输出中的一个。 该装置被配置为使用第一振荡的周期来测量片上延迟，或者基于选择单元的输出，使用定时测试单元的输出来测量半导体电路的定时裕度。