公开(公告)号：US20060012864A1

公开(公告)日：2006-01-19

申请号：US10967316

申请日：2004-10-19

Applicant: Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

Inventor： Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

IPC: G02B21/06

CPC classification number: G02B21/002 ,  G02B21/0032

Abstract: Raster Scanning Light Microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.

Abstract translation: 光栅扫描光显微镜，其具有至少一个照明模块的线图案扫描，其中实现将激光可变分割成最少两个照明通道的手段，并且在相同或不同的区域发生样品的联合照明 的样品。

公开(公告)号：US20060011857A1

公开(公告)日：2006-01-19

申请号：US10967325

申请日：2004-10-19

Applicant: Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

Inventor： Joerg-Michael Funk ,  Ralf Wolleschensky ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Ralf Engelmann

IPC: G01N21/64

CPC classification number: G02B21/0032

Abstract: Raster Scanning Light Microscope with line pattern scanning with at least one illumination module, in which the means to achieve a variable partition of the laser light into least two illumination channels are envisioned and joint illumination of a sample takes place at the same or at different areas of the sample.

公开(公告)号：US20060011824A1

公开(公告)日：2006-01-19

申请号：US10967636

申请日：2004-10-19

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: H01J40/14 ,  H01J7/24

CPC classification number: G02B21/002 ,  G02B21/0044 ,  G02B21/0064 ,  G02B21/008 ,  G02B21/248

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein the illumination light illuminates the sample in parallel at several points or regions and several points or regions are detected simultaneously wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Abstract translation: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样本区域的过程，其中照明光平行照射样本 在多个点或区域处，同时检测多个点或区域，其中相对于相对运动的平面成一角度，优选垂直于其，第二扫描装置被移动，并且通过第一和第二扫描装置 被耦合，并且通过样品的照射来完成三维采样运动，其中第二扫描装置以这样的方式耦合到第一扫描装置的运动，使得直线和/或曲线和/或平面和/或 扫描沿着第一扫描线的至少一个扫描方向延伸的曲面 g装置以及沿着第二扫描装置的扫描方向。

公开(公告)号：US20060011804A1

公开(公告)日：2006-01-19

申请号：US10967341

申请日：2004-10-19

Applicant: Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

Inventor： Ralf Engelmann ,  Joerg-Michael Funk ,  Joerg Steinert ,  Bernhard Zimmermann ,  Stefan Wilhelm ,  Joerg Engel ,  Ulrich Meisel

IPC: G02B27/40

CPC classification number: G02B21/008 ,  G02B21/0036 ,  Y10S359/90

Abstract: Process for the observation of at least one sample region with a light raster microscope by a relative movement between the illumination light and sample via first scanning means along at least one scanning axis essentially perpendicular to the illumination axis wherein several illuminated sample points lie on a line and are detected simultaneously with a spatially resolving detector wherein at an angle to the plane of the relative movement, preferably perpendicular thereto, second scanning means are moved and an image acquisition takes place by the movement of the first and second scanning means being coupled and a three-dimensional sampling movement being done by the illumination of the sample wherein the second scanning means are coupled to the movement of the first scanning means in such a manner that straight and/or curved lines and/or plane and/or curved surfaces are scanned which are extended along at least one scanning direction of the first scanning means as well as along the scanning direction of the second scanning means.

Abstract translation: 用于通过第一扫描装置沿着基本上垂直于照明轴的至少一个扫描轴的照明光和样品之间的相对运动用光栅显微镜观察至少一个样品区的方法，其中几个照亮的样品点位于一条线上 并且与空间分辨检测器同时检测器，其中相对于相对运动的平面，优选地与其垂直的平面移动第二扫描装置，并且通过耦合的第一和第二扫描装置的运动和 三维采样运动通过样品的照射来完成，其中第二扫描装置以扫描直线和/或曲线和/或平面和/或曲面扫描的方式与第一扫描装置的运动耦合 其沿着第一扫描装置的至少一个扫描方向以及沿着第一扫描装置的至少一个扫描方向延伸 第二扫描装置的扫描方向。