公开(公告)号：US20050243194A1

公开(公告)日：2005-11-03

申请号：US10836884

申请日：2004-04-30

Applicant: Weize Xu

Inventor： Weize Xu

IPC: H04N5/357 ,  H04N5/374 ,  H04N5/378 ,  H04N5/217

CPC classification number: H04N5/361 ,  H04N5/3575 ,  H04N5/3742

Abstract: An image sensor includes a plurality of pixels for capturing incident light that is converted to a signal representing an image; wherein noise is combined with a signal representing both the image and a reset level; a plurality of dark reference pixels that generate noise that substantially correspond or equally correspond to the noise in the image and reset level; and a sample and hold circuit that reads out the image signal and cancels or substantially cancels out the noise from the image signal and reset level by canceling the noise from image and reset level with the noise generated from the dark reference pixels.

Abstract translation: 图像传感器包括用于捕获被转换成表示图像的信号的入射光的多个像素; 其中噪声与表示图像和复位电平的信号组合; 多个暗参考像素，其产生基本上对应于或等同地对应于图像中的噪声和复位电平的噪声; 以及采样保持电路，通过从暗参考像素产生的噪声消除来自图像的噪声和复位电平，读出图像信号并且抵消或基本上消除来自图像信号和复位电平的噪声。

公开(公告)号：US06421085B1

公开(公告)日：2002-07-16

申请号：US09059814

申请日：1998-04-14

Applicant: Weize Xu

Inventor： Weize Xu

IPC: H04N314

CPC classification number: H04N5/3745 ,  H04N5/3575 ,  H04N5/3658

Abstract: A correlated double sampling unit within a CMOS imager employs an image sensor having a plurality of photodetectors arranged in a series of rows and columns with a row addressing circuit, a column addressing circuit, a first sample and hold circuit allocated for each of the columns, a transfer circuit operatively connecting each of the columns to the first sample and hold circuit for each of the columns, and a plurality of second sample and hold circuits, each of the second sample and hold circuits being operatively connected to a subset of the first sample and hold circuits.

Abstract translation: CMOS成像器内的相关双采样单元采用图像传感器，该图像传感器具有布置成一系列行和列的多个光电检测器，具有行寻址电路，列寻址电路，为每个列分配的第一采样和保持电路， 将每个列操作地连接到每个列的第一采样和保持电路的传输电路和多个第二采样和保持电路，每个第二采样和保持电路可操作地连接到第一采样的子集 并保持电路。