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    Connected Epitaxial Optical Sensing Systems
    21.
    发明申请
    Connected Epitaxial Optical Sensing Systems 有权

    公开(公告)号：US20220011157A1

    公开(公告)日：2022-01-13

    申请号：US17484994

    申请日：2021-09-24

    Applicant: Apple Inc.

    Inventor： Alfredo Bismuto ,  David I. Simon ,  Jason Pelc

    IPC: G01J1/42 ,  G01J1/02 ,  G01J1/04

    Abstract: A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

    Image Capture Device Having Tilt And/Or Perspective Correction
    25.
    发明申请
    Image Capture Device Having Tilt And/Or Perspective Correction 审中-公开
    具有倾斜和/或透视校正的图像捕获设备

    公开(公告)号：US20150358551A1

    公开(公告)日：2015-12-10

    申请号：US14828448

    申请日：2015-08-17

    Applicant: Apple Inc.

    Inventor： Jason Hau-Ping Chen ,  Brandon Dean Slack ,  David I. Simon

    IPC: H04N5/232

    CPC classification number: H04N5/23261 ,  H04N5/23248 ,  H04N5/23293

    Abstract: Methods and apparatuses are disclosed to correct for tilt and/or perspective distortion in image capture devices. In some embodiments, the method may include reading an orientation measurement associated with a relative position of an image capture device with respect to an object, determining if the orientation measurement is less than a threshold, and in the event that the orientation measurement is less than the threshold, correcting an image obtained by the image capture device. In some embodiments, the apparatus may include an image sensor, a memory coupled to the image sensor, an orientation measurement device coupled to the image sensor, and a distance measurement device coupled to the image sensor, where the image data may be stored in the memory along with a measurement from the accelerometer and along with a measurement from the distance measurement device.

    Abstract translation: 公开了用于校正图像捕获装置中的倾斜和/或透视失真的方法和装置。 在一些实施例中，该方法可以包括读取与图像捕获装置相对于对象的相对位置相关联的取向测量，确定取向测量是否小于阈值，以及在取向测量小于 阈值，校正由图像捕获装置获得的图像。 在一些实施例中，该装置可以包括图像传感器，耦合到图像传感器的存储器，耦合到图像传感器的取向测量装置以及耦合到图像传感器的距离测量装置，其中可以将图像数据存储在 存储器以及来自加速度计的测量以及距离测量装置的测量值。

    Image Capture Device Having Tilt And/Or Perspective Correction
    26.
    发明申请
    Image Capture Device Having Tilt And/Or Perspective Correction 审中-公开
    具有倾斜和/或透视校正的图像捕获设备

    公开(公告)号：US20140152859A1

    公开(公告)日：2014-06-05

    申请号：US14175752

    申请日：2014-02-07

    Applicant: Apple Inc.

    Inventor： Jason Hau-Ping Chen ,  Brandon Dean Slack ,  David I. Simon

    IPC: H04N5/232

    CPC classification number: H04N5/23261 ,  H04N5/23248 ,  H04N5/23293

    Abstract: Methods and apparatuses are disclosed to correct for tilt and/or perspective distortion in image capture devices. In some embodiments, the method may include reading an orientation measurement associated with a relative position of an image capture device with respect to an object, determining if the orientation measurement is less than a threshold, and in the event that the orientation measurement is less than the threshold, correcting an image obtained by the image capture device. In some embodiments, the apparatus may include an image sensor, a memory coupled to the image sensor, an orientation measurement device coupled to the image sensor, and a distance measurement device coupled to the image sensor, where the image data may be stored in the memory along with a measurement from the accelerometer and along with a measurement from the distance measurement device.

    Abstract translation: 公开了用于校正图像捕获装置中的倾斜和/或透视失真的方法和装置。 在一些实施例中，该方法可以包括读取与图像捕获装置相对于对象的相对位置相关联的取向测量，确定取向测量是否小于阈值，以及在取向测量小于 阈值，校正由图像捕获装置获得的图像。 在一些实施例中，该装置可以包括图像传感器，耦合到图像传感器的存储器，耦合到图像传感器的取向测量装置以及耦合到图像传感器的距离测量装置，其中可以将图像数据存储在 存储器以及来自加速度计的测量以及距离测量装置的测量值。

    Multiplexing and Encoding for Reference Switching
    29.
    发明申请
    Multiplexing and Encoding for Reference Switching 有权

    公开(公告)号：US20210310867A1

    公开(公告)日：2021-10-07

    申请号：US17351067

    申请日：2021-06-17

    Applicant: Apple Inc.

    Inventor： Trent D. Ridder ,  Mark Alan Arbore ,  Gary Shambat ,  Robert Chen ,  David I. Simon ,  Miikka M. Kangas

    IPC: G01J3/427 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01N21/35

    Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.

    Connected Epitaxial Optical Sensing Systems
    30.
    发明申请
    Connected Epitaxial Optical Sensing Systems 审中-公开

    公开(公告)号：US20200309593A1

    公开(公告)日：2020-10-01

    申请号：US16651901

    申请日：2018-09-25

    Applicant: Apple Inc.

    Inventor： Alfredo Bismuto ,  David I. Simon ,  Jason Palc

    IPC: G01J1/42 ,  G01J1/02 ,  G01J1/04

    Abstract: A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

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