摘要:
Herein, an improved technique for processing a substrate is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for processing a substrate. The method may comprise directing an ion beam comprising a plurality of ions along an ion beam path, from an ion source to the substrate; disposing at least a portion of a mask in the ion beam path, between the ion source and the substrate; and translating one of the substrate and the mask relative to other one of the substrate and the mask.
摘要:
A method and system can align a robot arm with a payload station. A probe and a contact detector may be positioned on the robot arm and three pins may be placed on the payload station. A controller may move the robot arm in a pattern over the payload station until contact may be made between the probe and one of the pins. A search about the contact location may be performed to obtain additional contacts. The search may be interrupted when contact is made between the probe and one of the pins. The position of the pin may be calculated from three such contacts on the spherical portion of the pin. The location of the probe at the time of contact may be stored and a localized search about the pin location may be performed. If the position of the pin cannot be resolved from three contacts, additional contacts may be made until a combination of three contacts does provide a solution. Three such pins may be so located such that the robot arm may learn the position of the payload station without operator intervention.