Abstract:
Disclosed herein are apparatuses and methods for measuring electrostatic charge on a surface of a substrate. The apparatuses comprise a substrate mounting platform, a substrate contacting component, and at least one voltage sensor, wherein the apparatus is programmed to independently control the rotational and translation velocity of a roller and/or to measure a voltage of the substrate at multiple points to produce a two-dimensional map of voltage for at least a portion of the substrate.
Abstract:
According to embodiments disclosed herein, an apparatus may hold and retain glass articles during processing. The apparatus may define a plurality of receiving volumes for holding glass articles. The apparatus may include a bottom support floor, a glassware-securing member positioned above the bottom support floor, and a cover plate positioned above the glassware-securing member. The bottom support floor may include a plurality of fluid passages, the glassware-securing member may include a plurality of glassware-retaining openings, and the cover plate may include a plurality of fluid passages. Methods for the use of such apparatuses are also disclosed herein.
Abstract:
According to embodiments disclosed herein, an apparatus may hold and retain glass articles during processing. The apparatus may define a plurality of receiving volumes for holding glass articles. The apparatus may include a bottom support floor, a glassware-securing member positioned above the bottom support floor, and a cover plate positioned above the glassware-securing member. The bottom support floor may include a plurality of fluid passages, the glassware-securing member may include a plurality of glassware-retaining openings, and the cover plate may include a plurality of fluid passages.