摘要:
A method and system for instrumenting testcase execution processing of a hardware description language (HDL) model using a simulation control program. In accordance with the method of the present invention, a set name application program interface (API) entry point is called wherein the set name API entry point includes program instructions for naming a simulation control program in association with testcase execution of the HDL model. A create event API entry point is called, wherein the create event API entry point includes an event identifier input parameter which identifies a testcase execution event with respect to the named simulation control program. In response to executing a testcase simulation cycle, signal values are retrieved from the HDL model into an instrumentation code block, wherein the instrumentation code block includes program instructions for processing the retrieved signals to detect whether the testcase execution event has occurred during the testcase simulation cycle.
摘要:
According to a method of simulation processing, a simulation model is received that includes a plurality of design entity instances modeling a digital system and one or more instrumentation entity instances, separate from the plurality of design entity instances, that generate instances of instrumentation events for testing purposes during simulation. In response to receiving an exclusion list identifying at least one instance of one or more instrumentation events to be removed from the simulation model, at least one instance of the one or more instrumentation events and associated logic elements are removed from the one or more instrumentation entity instances of the simulation model prior to simulation, such that a more compact simulation model is obtained.
摘要:
In at least one hardware definition language (HDL) file, a design entity containing a functional portion of a digital system is specified. The design entity logically contains a plurality of configuration latches each having multiple different possible latch values. The latch values of the plurality of configuration latches collectively define at least a portion of a configuration of the functional portion of the digital system. With a statement in the at least one HDL file, a read-only Dial entity is associated with the plurality of configuration latches. The read-only Dial has at least one output and a mapping table indicating a mapping between each of a plurality of possible output values that can be present at the output and a respective corresponding setting of the read-only Dial. The setting of the read-only Dial indicates which of a plurality of different possible configurations is represented by the latch values of the plurality of configuration latches.
摘要:
A method and system for providing centralized access to instrumentation count event information generated by simulation testing of a hardware simulation model, in which simulation testing is performed within a batch simulation farm by multiple simulation clients communicating with an instrumentation server. An entitylist that includes an identifier for each design entity within said hardware simulation model that has at least one instantiated instrumentation count event is generated within a simulation client. The entitylist is delivered from the simulation client to the instrumentation server. Within the instrumentation server, the entitylist is associated with an identifier for the hardware simulation model such that instrumentation count event information is accessible from said instrumentation server by individual design entity information.
摘要:
A method and system for disabling an instrumentation event in a simulation model within a batch simulation farm in which a simulation client communicates with an instrumentation server to process simulation data with respect to the simulation model. An instrumentation event disable list is assembled within the instrumentation server. The assembly of the event disable list includes identifying an instrumentation event to be disabled during simulation processing of the simulation model, and delivering to the instrumentation server an instrumentation event name corresponding to the instrumentation event to be disabled. Prior to simulating the simulation model within the simulation client, the instrumentation event disable list is retrieved from the instrumentation server, and instrumentation events are disabled as specified within the instrumentation event disable list.
摘要:
In at least one hardware definition language (HDL) file, at least one design entity containing a functional portion of a digital system is specified. The design entity logically contains a latch having a respective plurality of different possible latch values. With one or more statements in one or more files, a configuration entity is associated with the latch. The configuration entity has a plurality of different settings and each setting reflects which of the plurality of different possible values is loaded in the associated latch. A controlling value set for at least one instance of the configuration entity is also defined in one or more files. The controlling value set indicates at least one controlling value for which presentation of a current setting of the configuration entity instance is restricted. Thereafter, in response to a request to present at least a partial state of the digital system, a current setting of the configuration entity instance is excluded from presentation by reference to a configuration database indicating the controlling value set.
摘要:
A method for fabricating a double-gate transistor including defining an active area on an SOI substrate, forming a first gate region on the SOI substrate, forming source/drain regions made of silicon-germanium in the active area, forming a channel region from the silicon layer of the SOI substrate, forming a layer having a planar surface above the SOI substrate, the source/drain regions, and the first gate region, bonding a second wafer to the planar surface, and forming a second gate region opposite the first gate region.
摘要:
A statement in at least one hardware definition language (HDL) file specifies a plurality of design entities representing a functional portion of a digital system. The plurality of design entities have an associated plurality of configuration latches each having a plurality of different possible latch values, where different sets of latch values for the plurality of configuration latches correspond to different configurations of the functional portion of the digital system. With a statement in the at least one HDL file, a Dial group entity is associated with one of the plurality of design entities. The Dial group entity has a Dial list listing a plurality of Dial entities whose settings collectively control which set of latch values is loaded into the plurality of configuration latches. Membership in the Dial group constrains all instances of the plurality of Dial entities belonging to a particular instance of the Dial group to be set as a group.
摘要:
The signal state that a signal of interest within a system under test has during each of a plurality of cycles of operation of the system under test is stored in a trace file. In association with the signal state, information regarding a requested access to the signal state by a control program during a particular cycle among the plurality of cycles is also stored. From the trace files a presentation is generated that presents, for at least a signal of interest within the system under test, a plurality of signal state indications, each indicating a respective state that the signal had during a one of a plurality of cycles of operation of the system under test. The presentation also indicates, in a graphically distinctive manner, at least one cycle of operation during which a control program requested access to a state of the signal, so that the influence of the control program on the state of the system under test is visually apparent.
摘要:
A method and system for tracking frequently occurring fail events that are detected during testcase simulation of a simulation model within a batch simulation farm in which testcases are executed within respect to a simulation model on one or more simulation clients. In accordance with the method of the present invention, the instrumentation server receives fail event packets from one or more simulation clients. The fail event packets contains an aggregate of detected occurrences of a specified fail event. The instrumentation server monitors the rate of occurrence of the specified fail event from received fail event packets to detect an excess rate of occurrence of the specified fail event.