摘要:
Power regulator circuitry for programmable memory elements on programmable logic device integrated circuits is provided. The programmable memory elements may each include a storage element formed from cross-coupled inverters and an address transistor. Address drivers may be used to supply address signals to the address transistors. The power regulator circuitry may include an address power supply circuit that produces a time-varying address power supply voltage to the address drivers and storage element power supply circuits that provide time-varying storage element power supply voltages to the cross-coupled inverters in the storage elements. Unity gain buffers may be used to distribute a reference voltage from a bandgap voltage reference to the power supply circuits. The power supply circuits may use voltage dividers and p-channel metal-oxide-semiconductor control transistors.
摘要:
Power regulator circuitry is provided for powering loads such as memory element arrays on integrated circuits. The power regulator circuitry may have a regulated power supply circuit and a switch-based power supply circuit. Control circuitry can control the regulated power supply circuit and the switch-based power supply circuit. The control circuitry may include a power supply power-on-reset control circuit. The power supply power-on-reset control circuit may receive a system power-on-reset control signal from a system power-on-reset control circuit. Based on the system power-on-reset control signal and monitored power supply voltages, the power supply power-on-reset control circuit may apply power-on-reset control signals to depletion mode transistors in the power regulator circuitry to ensure that nodes within the power regulator circuitry have defined values during power-up operations.
摘要:
Power regulator circuitry for programmable memory elements on programmable logic device integrated circuits is provided. The programmable memory elements may each include a storage element formed from cross-coupled inverters and an address transistor. Address drivers may be used to supply address signals to the address transistors. The power regulator circuitry may include an address power supply circuit that produces a time-varying address power supply voltage to the address drivers and storage element power supply circuits that provide time-varying storage element power supply voltages to the cross-coupled inverters in the storage elements. Unity gain buffers may be used to distribute a reference voltage from a bandgap voltage reference to the power supply circuits. The power supply circuits may use voltage dividers and p-channel metal-oxide-semiconductor control transistors.
摘要:
Power regulator circuitry for programmable memory elements on programmable logic device integrated circuits is provided. The programmable memory elements may each include a storage element formed from cross-coupled inverters and an address transistor. Address drivers may be used to supply address signals to the address transistors. The power regulator circuitry may include an address power supply circuit that produces a time-varying address power supply voltage to the address drivers and storage element power supply circuits that provide time-varying storage element power supply voltages to the cross-coupled inverters in the storage elements. Unity gain buffers may be used to distribute a reference voltage from a bandgap voltage reference to the power supply circuits. The power supply circuits may use voltage dividers and p-channel metal-oxide-semiconductor control transistors.
摘要:
Voltage regulator circuitry is provided. The voltage regulator circuitry may contain a drive transistor that is controlled by the output of an operational amplifier. The drive transistor may supply a regulated voltage to a load. The operational amplifier may compare a reference voltage and a feedback signal at its inputs. The operational amplifier may include first and second stages. An adjustable resistor may be provided between the first and second stages. Control circuitry may control the resistance of the adjustable resistor based on the amount of current flowing through the load to ensure stable operation of the voltage regulator circuitry. Overshoot and undershoot detection and compensation circuitry may compensate for overshoot and undershoot in the regulated voltage. Voltage ramp control circuitry may be used to control the ramp rate of the regulated voltage.
摘要:
Voltage regulator circuitry is provided. The voltage regulator circuitry may contain a drive transistor that is controlled by the output of an operational amplifier. The drive transistor may supply a regulated voltage to a load. The operational amplifier may compare a reference voltage and a feedback signal at its inputs. The operational amplifier may include first and second stages. An adjustable resistor may be provided between the first and second stages. Control circuitry may control the resistance of the adjustable resistor based on the amount of current flowing through the load to ensure stable operation of the voltage regulator circuitry. Overshoot and undershoot detection and compensation circuitry may compensate for overshoot and undershoot in the regulated voltage. Voltage ramp control circuitry may be used to control the ramp rate of the regulated voltage.
摘要:
Disclosed are circuits and methods of identifying defective memory cells among rows and columns of memory cells. In one embodiment, all the memory cells in an array are programmed to conduct with a conventional read voltage applied and not to conduct with a conventional read-inhibit voltage applied. Any rows that conduct with the read-inhibit voltage applied are termed “leaky,” and are defective. Another read-inhibit voltage lower than the conventional level is selected to cause even leaky cells not to conduct. This test read-inhibit voltage is consecutively applied to each row under test. If one of the rows includes a leaky bit, that bit will conduct with the conventional read-inhibit voltage applied but will not conduct with the test read-inhibit voltage applied. The test flow therefore identifies a row as including a leaky bit when a leak is suppressed by application of the test read-inhibit voltage. A redundant row can be provided to replace a row having a leaky bit.