公开(公告)号：US06642736B2

公开(公告)日：2003-11-04

申请号：US09904625

申请日：2001-07-16

申请人： Hisaya Mori ,  Shinji Yamada ,  Teruhiko Funakura

发明人： Hisaya Mori ,  Shinji Yamada ,  Teruhiko Funakura

IPC分类号： G01R3102

CPC分类号： G01R31/3167 ,  G01R31/31905 ,  G01R31/31926

摘要： To provide a tester for semiconductor integrated circuits that can test an A/D converter circuit and a D/A converter circuit in a mixed signal type semiconductor integrated circuit comprising an A/D converter circuit and a D/A converter circuit at high accuracy and at high speed. A test assisting device is provided in the vicinity of a testing circuit board on which a semiconductor integrated circuit to be tested is mounted. The test assisting device comprises a data circuit to supply analog test signals to the A/D converter circuit of the semiconductor integrated circuit to be tested, and digital test signals to the D/A converter circuit thereof, a measured data memory to store test outputs from the semiconductor integrated circuit to be tested, and an analyzer portion to analyze data stored in the measured data memory.

公开(公告)号：US06456102B1

公开(公告)日：2002-09-24

申请号：US09927469

申请日：2001-08-13

申请人： Hisaya Mori ,  Shinji Yamada ,  Teruhiko Funakura

发明人： Hisaya Mori ,  Shinji Yamada ,  Teruhiko Funakura

IPC分类号： G01R3126

CPC分类号： H03M1/1071 ,  G01R31/3167 ,  G01R31/31716

摘要： An external test ancillary device (BOST device) analyzes measured information output from a semiconductor integrated circuit and transmits a result of analysis to a semiconductor test apparatus. The external test ancillary device includes a DAC counter for generating input data; a digital-to-analog converter for converting the data output from the counter from a digital signal into an analog signal; an analog-to-digital converter which receives data output from the digital-to-analog converter by way of a loopback line and converts the data from an analog signal into a digital signal; a DSP analysis section for performing self-diagnostic operation on the basis of data output from the analog-to-digital converter; measured data memory, an address counter, and a data write control circuit.

摘要翻译： 外部测试辅助设备（BOST设备）分析从半导体集成电路输出的测量信息，并将分析结果发送到半导体测试设备。 外部测试辅助设备包括用于产生输入数据的DAC计数器; 数模转换器，用于将从计数器输出的数据从数字信号转换为模拟信号; 模数转换器，其通过回送线接收从数模转换器输出的数据，并将数据从模拟信号转换成数字信号; DSP分析部分，用于基于从模数转换器输出的数据执行自诊断操作; 测量数据存储器，地址计数器和数据写入控制电路。

公开(公告)号：US5485114A

公开(公告)日：1996-01-16

申请号：US453107

申请日：1995-05-30

申请人： Teruhiko Funakura ,  Naomi Higashino

发明人： Teruhiko Funakura ,  Naomi Higashino

IPC分类号： H01L27/118 ,  H01L21/82 ,  H01L21/822 ,  H01L27/04 ,  H03K3/03 ,  H03K5/19 ,  H03K19/003 ,  H03K19/173 ,  H03H11/26 ,  H03K17/04 ,  H03K17/28 ,  H03K17/296

CPC分类号： H03K5/19 ,  H03K19/00323 ,  H03K3/0315

摘要： A semiconductor integrated circuit detecting a change in the internal propagation delay and self-compensating such a change. A combination of semiconductor integrated circuits can self-compensate a change in the total propagation delay of the circuit. There is provided a ring oscillator composed of dummy device elements separate from an actually-used logic circuit portion. The oscillating pulses of the ring oscillator are counted relative to a reference pulse signal. The semiconductor integrated circuit has a delay time compensation control circuit block which generates control data used to compensate the change in the propagation delay based on the difference between the first-counted value and a subsequently counted value. In a combination of semiconductor integrated circuits, the delay time compensation control circuit block may be provided for each channel. Alternatively, the delay time compensation control circuit block may be provided for common use by many channels.

摘要翻译： 一种半导体集成电路检测内部传播延迟的变化和自补偿这种变化。 半导体集成电路的组合可以自我补偿电路的总传播延迟的变化。 提供了由与实际使用的逻辑电路部分分离的虚设装置元件组成的环形振荡器。 环形振荡器的振荡脉冲相对于参考脉冲信号进行计数。 半导体集成电路具有延迟时间补偿控制电路块，该延迟时间补偿控制电路块基于第一计数值与随后的计数值之间的差产生用于补偿传播延迟的变化的控制数据。 在半导体集成电路的组合中，可以为每个通道提供延迟时间补偿控制电路块。 或者，延迟时间补偿控制电路块可以被提供用于许多通道的共同使用。