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公开(公告)号:US20210054283A1
公开(公告)日:2021-02-25
申请号:US17093654
申请日:2020-11-10
Applicant: SOULBRAIN CO., LTD.
Inventor: Jung Hun LIM , Jin Uk LEE , Jae Wan PARK
IPC: C09K13/06 , H01L21/306 , H01L21/311
Abstract: A composition for etching and a method of manufacturing a semiconductor device, the method including an etching process of using the composition for etching, are provided. The composition for etching includes a first inorganic acid; any one first additive selected from the group consisting of phosphorous acid, an organic phosphite, a hypophosphite, and mixtures thereof; and a solvent. The composition for etching is a high-selectivity composition for etching that can selectively remove a nitride film while minimizing the etch rate for an oxide film and does not have a problem such as particle generation, which adversely affects device characteristics.
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公开(公告)号:US20210054282A1
公开(公告)日:2021-02-25
申请号:US17093652
申请日:2020-11-10
Applicant: SOULBRAIN CO., LTD.
Inventor: Jung Hun LIM , Jin Uk LEE , Jae Wan PARK
IPC: C09K13/06 , H01L21/306 , H01L21/311
Abstract: A composition for etching and a method of manufacturing a semiconductor device, the method including an etching process of using the composition for etching, are provided. The composition for etching includes a first inorganic acid; any one first additive selected from the group consisting of phosphorous acid, an organic phosphite, a hypophosphite, and mixtures thereof; and a solvent. The composition for etching is a high-selectivity composition for etching that can selectively remove a nitride film while minimizing the etch rate for an oxide film and does not have a problem such as particle generation, which adversely affects device characteristics.
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公开(公告)号:US20210047564A1
公开(公告)日:2021-02-18
申请号:US17087623
申请日:2020-11-03
Applicant: SOULBRAIN CO., LTD.
Inventor: Jin Uk LEE , Jae Wan PARK , Jung Hun LIM
IPC: C09K13/06 , H01L21/02 , H01L29/66 , H01L27/11556 , H01L21/311
Abstract: The disclosure is related to a composition for etching, a method for manufacturing the composition, and a method for fabricating a semiconductor using the same. The composition may include a first inorganic acid, at least one of silane inorganic acid salts produced by reaction between a second inorganic acid and a silane compound, and a solvent. The second inorganic acid may be at least one selected from the group consisting of a sulfuric acid, a fuming sulfuric acid, a nitric acid, a phosphoric acid, and a combination thereof.
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