公开(公告)号：US06765667B2

公开(公告)日：2004-07-20

申请号：US09916181

申请日：2001-07-26

申请人： Noboru Higashi ,  Daisuke Nagai ,  Kenichi Kaida

发明人： Noboru Higashi ,  Daisuke Nagai ,  Kenichi Kaida

IPC分类号： G01N2100

CPC分类号： G01N21/956 ,  G01N2021/95638 ,  H05K13/08

摘要： A method for inspection of circuit boards is described which includes: a process of measuring surface-shape data of a circuit board on which inspection objects are placed; an approximated curved surface generation process for generating an approximated curved surface from the measured surface-shape data, which is an estimated surface-shape of the circuit board, on which no inspection object is placed; a process of subtracting said approximated curved surface from the measured surface-shape data; a region of interest determination process of determining regions which are different from the approximated curved surface in accordance with data obtained by said subtraction process; and a process of inspecting whether electronic parts placed on said circuit board and connecting materials for connecting the electronic parts are in a desired state or not.

摘要翻译： 一种检测电路板的方法，其特征在于包括：测量放置有检查对象的电路板的表面形状数据的处理; 近似曲面生成处理，用于根据测量的表面形状数据生成近似曲面，该表面形状数据是电路板的估计表面形状，其上没有放置检查对象; 从所测量的表面形状数据中减去所述近似曲面的处理; 根据由所述减法处理获得的数据确定与近似曲面不同的区域的感兴趣区域确定过程; 以及检查放置在所述电路板上的电子部件和用于连接电子部件的连接材料是否处于期望状态的处理。