Parabolic focusing apparatus for optical spectroscopy
    21.
    发明授权
    Parabolic focusing apparatus for optical spectroscopy 失效
    用于光谱的抛物面聚焦装置

    公开(公告)号:US4591266A

    公开(公告)日:1986-05-27

    申请号:US580120

    申请日:1984-02-14

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/02 G01J3/0208 G01N21/552 G01J3/453

    Abstract: An accessory for use in the sample region of a spectrometer is disclosed which combines a matched pair of off-axis paraboloid reflectors having their focii optically imaged on the sample (either imaged at a common point or at two points which are optically imaged on each other) and having relative locations and orientations such that each ray of radiation strikes the two reflectors at points on the reflectors having approximately the same focal lengths. This arrangement involves the use of collimated optical beams into and out of the accessory. The accessory may function as a transmission-type accessory, in which the radiation passes through the sample, or as an internal reflectance accessory, in which the radiation passes through the sample holder but is reflected by the sample. The focal length relationship set forth is accomplished by having "back-to-back" paraboloid reflectors, i.e., their reflecting surfaces face in substantially different, preferably opposite, directions. A further aspect is the incorporation of means for adjusting the position of at least one of the paraboloid reflectors along a first line parallel to, and along a second line perpendicular to, the axis of the collimated optical beam reflected by the position-adjustable reflector.

    Abstract translation: 公开了一种用于光谱仪的样品区域的附件,其结合了一对离轴抛物面反射器,其具有在样品上光学成像的焦点(在共同点上成像或在彼此光学成像的两个点成像 )并且具有相对位置和取向,使得每个辐射射线在具有大致相同焦距的反射器上的点处撞击两个反射器。 这种布置涉及使用准直光束进入和离开附件。 附件可以用作透射型附件,其中辐射通过样品或作为内部反射附件,其中辐射通过样品架而被样品反射。 通过具有“背对背”抛物面反射器,即它们的反射表面基本上不同,优选地相反的方向来实现所述的焦距关系。 另一方面是结合用于调整抛物面反射器中至少一个的位置的装置,其沿着与由位置可调反射器反射的准直光束的轴垂直的第二线并且沿着第二线垂直。

    Interferometer spectrometer having simplified scanning motion control
    22.
    发明授权
    Interferometer spectrometer having simplified scanning motion control 失效
    干涉仪光谱仪具有简化的扫描运动控制

    公开(公告)号:US4556316A

    公开(公告)日:1985-12-03

    申请号:US470936

    申请日:1983-03-01

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/4535

    Abstract: A spectrometer is disclosed having an interferometer in which: (a) the variable-length arm has a moving retroreflector (copy A to A in summary). The pivoted linkage comprises three or more arms each having its upper end pivotally connected to a supporting structure and its lower end pivotally connected to a carrier for the retroreflector. The stationary folding mirror blocks approximately half of the open face of the retroreflector, causing the radiation which enters the unblocked half of the retroreflector to be reflected back to the retroreflector after it has traveled diagonally across the retroreflector and then been reflected toward the folding mirror.

    Abstract translation: 公开了一种具有干涉仪的光谱仪,其中:(a)可变长度臂具有移动后向反射器(总之,A到A)。 枢转联动装置包括三个或更多个臂,每个臂的上端可枢转地连接到支撑结构,并且其下端枢转地连接到用于后向反射器的载体。 固定的折叠镜阻挡后向反射器的开放面的大约一半,使得进入后向反射器的未阻挡的一半的辐射在其沿对角线穿过后向反射器行进后被反射回到后向反射器,然后被反射到折叠反射镜。

    Interferometer spectrometer having improved scanning reference point
    23.
    发明授权
    Interferometer spectrometer having improved scanning reference point 失效
    干涉仪光谱仪具有改进的扫描参考点

    公开(公告)号:US4537508A

    公开(公告)日:1985-08-27

    申请号:US470937

    申请日:1983-03-01

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/453 G01J2003/2866

    Abstract: An interferometer, for use in spectrometry, is disclosed in which a more reliable synchronization of the starting points of successive analytical scans is obtained by combining:(a) a moving retro-reflector in the variable-length arm which reflects both the analytical beam and the reference beam;(b) stationary reflecting means in the variable-length arm providing a flat "folding" reflector which causes the path of at least the reference beam from the retro-reflector to be folded on itself and returned to the retro-reflector; and(c) stationary reflecting means for the reference beam in the fixed-length arm so located as to offset the reference interferogram with respect to the analytical interferogram. Two versions of the invention are shown, each having two disclosed embodiments. In one version all three of the beams (clock, reference, and analytical) are "folded" by means of mirrors located adjacent to the moving retro-reflector. In the other version only the reference beam is folded.

    Abstract translation: 公开了一种用于光谱测定的干涉仪,其中通过组合以下方法获得连续分析扫描的起始点的更可靠的同步:(a)可变长臂中的移动后向反射器,其反映分析光束和 参考光束; (b)可变长度臂中的固定反射装置,提供平坦的“折叠”反射器,其使至少来自后向反射器的参考光束的路径自身折叠并返回到后向反射器; 以及(c)用于固定长度臂中的参考光束的固定反射装置,以便相对于分析干涉图偏移参考干涉图。 示出了本发明的两个版本,每个具有两个公开的实施例。 在一个版本中,所有三个光束(时钟,参考和分析)通过位于移动后向反射器附近的反射镜“折叠”。 在另一个版本中,只有参考光束被折叠。

    Refractively scanned interferometer
    24.
    发明授权
    Refractively scanned interferometer 失效
    折射扫描干涉仪

    公开(公告)号:US4265540A

    公开(公告)日:1981-05-05

    申请号:US80287

    申请日:1979-10-01

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/4537

    Abstract: A refractively scanned interferometer, of the type in which a wedge-shaped prism is moved across one interferometer arm for scanning purposes, in which a similarly shaped fixed prism in the other arm provides optical compensation to avoid aberration problems. The beamsplitter surface is on the fixed wedge-shaped prism, and the two wedge-shaped prisms constitute the only refractive elements in the interferometer arms.

    Abstract translation: 折射扫描干涉仪,其中楔形棱镜通过一个干涉仪臂移动以用于扫描目的,其中另一个臂中的类似形状的固定棱镜提供光学补偿以避免像差问题。 分束器表面在固定的楔形棱镜上,两个楔形棱镜构成干涉仪臂中唯一的折射元件。

    Refractively scanned interferometer
    25.
    发明授权
    Refractively scanned interferometer 失效
    折射扫描干涉仪

    公开(公告)号:US4190366A

    公开(公告)日:1980-02-26

    申请号:US790457

    申请日:1977-04-25

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/4537

    Abstract: An interferometer, preferably of the Michelson type, is disclosed, in which the reflectors associated with the interferometer arms are stationary, and scanning is accomplished by displacement of a single wedge-shaped refractive element in one of the arms. The reflectors are preferably retro-reflectors rather than flat mirrors in order to minimize the effects of chromatic dispersion. A Moire scale may be used to measure the position of the wedge-shaped refractive element.

    Abstract translation: 公开了优选为迈克尔逊型干涉仪,其中与干涉仪臂相关联的反射器是静止的,并且通过在一个臂中移位单个楔形折射元件来实现扫描。 为了最小化色散的影响,反射器优选地是反射器而不是平面镜。 可以使用莫尔刻度来测量楔形折射元件的位置。

    Dual beam Fourier spectrometer
    26.
    发明授权
    Dual beam Fourier spectrometer 失效
    双光束傅立叶光谱仪

    公开(公告)号:US4183669A

    公开(公告)日:1980-01-15

    申请号:US830576

    申请日:1977-09-06

    Inventor: Walter M. Doyle

    CPC classification number: G01J3/453

    Abstract: A dual beam Fourier-type spectrometer is disclosed incorporating distinct sample and reference beams which enter the Michelson-type interferometer on the same side of the beam splitter and propagate at slightly different angles through the interferometer. The portions of both beams which emerge from the side of the beam splitter opposite the input side are directed to two separate optical detectors, the outputs of which are electronically subtracted. In a preferred embodiment, the interferometer is of the refractively scanned type, wherein the increased field-of-view facilitates the use of beams having different propagation angles.

    Abstract translation: 公开了一种双波束傅立叶型光谱仪,其结合了不同的采样和参考光束,其在分束器的同一侧进入迈克尔逊型干涉仪,并以稍微不同的角度通过干涉仪传播。 从分束器与输入侧相反的一侧出射的两个光束的部分被引导到两个分离的光学检测器,其输出被电子减去。 在优选实施例中,干涉仪是折射扫描型的,其中增加的视野有助于使用具有不同传播角度的光束。

    Attenuated total reflecance probe employing large incidence angles
    27.
    发明授权
    Attenuated total reflecance probe employing large incidence angles 失效
    使用大入射角的衰减全反射探头

    公开(公告)号:US5991029A

    公开(公告)日:1999-11-23

    申请号:US55392

    申请日:1998-04-06

    Inventor: Walter M. Doyle

    CPC classification number: G01N21/552

    Abstract: A sample immersion probe is disclosed which has an ATR (attenuated total reflectance) element at its tip. The ATR is so shaped that radiation exiting the probe will travel in paths parallel to radiation entering the probe. The angles of incidence of radiation on the ATR surface (or surfaces) which permit partial absorption by the sample material are greater than 45.degree.. At least one of the ATR surfaces in contact with the sample has a fully reflecting coating which prevents radiation absorption by the sample at that location. The ATR shape may be symmetrical or non-symmetrical with respect to the axis of symmetry of the probe. The radiation entering the probe may be in a separate light guide (i.e., path) from the radiation exiting the probe; or the entering and exiting radiation may be in the same light guide (path).

    Abstract translation: 公开了一种在其尖端具有ATR(衰减的全反射率)元件的样品浸没式探针。 ATR被成形为使得离开探针的辐射将以与进入探针的辐射平行的路径行进。 允许样品材料部分吸收的ATR表面(或表面)上的辐射入射角大于45°。 与样品接触的至少一个ATR表面具有完全反射的涂层,其防止样品在该位置的辐射吸收。 ATR形状可以相对于探针的对称轴对称或非对称。 进入探针的辐射可以离开离开探针的辐射的单独光导(即,路径)中; 或者进入和退出的辐射可以在相同的光导(路径)中。

    Reflectance infrared microscope having high radiation throughput
    28.
    发明授权
    Reflectance infrared microscope having high radiation throughput 失效
    反射率红外显微镜具有高辐射通量

    公开(公告)号:US5011243A

    公开(公告)日:1991-04-30

    申请号:US907995

    申请日:1986-09-16

    CPC classification number: G02B21/082 G01N21/55 G02B21/0004 G01N21/35

    Abstract: An infrared microscope is disclosed which provides illumination for reflectance by the sample. This illumination follows a path through the objective toward the sample, and again, after reflection, through the objective toward the detector. The reflectance illumination is directed toward the objective and sample by a fully reflective mirror, which injects approximately half of the interferometer beam into the microscope, and permits substantially all of the reflected beam to reach the detector.

    Abstract translation: 公开了一种红外显微镜,其提供了样品反射率的照明。 该照明遵循通过物体朝向样品的路径,并且再次在反射之后通过物镜朝向检测器。 反射照明通过完全反射镜指向物镜和样品,其将大约一半的干涉仪光束注入显微镜,并且基本上允许所有的反射光束到达检测器。

    Infrared microscope employing a projected field stop
    29.
    发明授权
    Infrared microscope employing a projected field stop 失效
    使用投射场停止的红外显微镜

    公开(公告)号:US4843242A

    公开(公告)日:1989-06-27

    申请号:US921066

    申请日:1986-10-20

    Inventor: Walter M. Doyle

    Abstract: An infrared microscope is disclosed in which two adjustable field stops are included. One is used to determine the illuminated area at the sample when the microscope is used in the transmission mode. The other is used to determine the illuminated area at the sample when the microscope is used in the reflectance mode. The latter field stop is imaged in the plane of the former; and the radiation in the reflectance mode passes through the former field stop both as it passes to the sample and as it returns from the sample after reflectance.

    Abstract translation: 公开了一种红外显微镜,其中包括两个可调节的场停止。 当在传输模式下使用显微镜时,用于确定样品的照射面积。 另一个用于在反射模式下使用显微镜时确定样品的照明面积。 后一个场站在前者的平面中成像; 并且反射率模式中的辐射通过前一个场停止,当它传递到样品并且在反射后从样品返回。

    Parabolic focusing apparatus for optical spectroscopy
    30.
    再颁专利
    Parabolic focusing apparatus for optical spectroscopy 失效
    用于光谱的抛物面聚焦装置

    公开(公告)号:USRE32912E

    公开(公告)日:1989-04-25

    申请号:US42056

    申请日:1987-04-24

    Inventor: Walter M. Doyle

    CPC classification number: G01N21/552 G01J3/02 G01J3/0208 G01J3/453

    Abstract: An accessory for use in the sample region of a spectrometer is disclosed which combines a matched pair of off-axis paraboloid reflectors having their focii optically imaged on the sample (either imaged at a common point or at two points which are optically imaged on each other) and having relative locations and orientations such that each ray of radiation strikes the two reflectors at points on the reflectors having approximately the same focal lengths. This arrangement involves the use of collimated optical beams into and out of the accessory. The accessory may function as a transmission-type accessory, in which the radiation passes through the sample, or as an internal reflectance accessory, in which the radiation passes through the sample holder but is reflected by the sample. The focal length relationship set forth is accomplished by having the "back-to-back" paraboloid reflectors, i.e., their reflecting surfaces face in substantially different, preferably opposite, directions. A further aspect is the incorporation of means for adjusting the position of at least one of the paraboloid reflectors along a first line parallel to, and along a second line perpendicular to, the axis of the collimated optical beam reflected by the position-adjustable reflector.

Patent Agency Ranking