Abstract:
An accessory for use in the sample region of a spectrometer is disclosed which combines a matched pair of off-axis paraboloid reflectors having their focii optically imaged on the sample (either imaged at a common point or at two points which are optically imaged on each other) and having relative locations and orientations such that each ray of radiation strikes the two reflectors at points on the reflectors having approximately the same focal lengths. This arrangement involves the use of collimated optical beams into and out of the accessory. The accessory may function as a transmission-type accessory, in which the radiation passes through the sample, or as an internal reflectance accessory, in which the radiation passes through the sample holder but is reflected by the sample. The focal length relationship set forth is accomplished by having "back-to-back" paraboloid reflectors, i.e., their reflecting surfaces face in substantially different, preferably opposite, directions. A further aspect is the incorporation of means for adjusting the position of at least one of the paraboloid reflectors along a first line parallel to, and along a second line perpendicular to, the axis of the collimated optical beam reflected by the position-adjustable reflector.
Abstract:
A spectrometer is disclosed having an interferometer in which: (a) the variable-length arm has a moving retroreflector (copy A to A in summary). The pivoted linkage comprises three or more arms each having its upper end pivotally connected to a supporting structure and its lower end pivotally connected to a carrier for the retroreflector. The stationary folding mirror blocks approximately half of the open face of the retroreflector, causing the radiation which enters the unblocked half of the retroreflector to be reflected back to the retroreflector after it has traveled diagonally across the retroreflector and then been reflected toward the folding mirror.
Abstract:
An interferometer, for use in spectrometry, is disclosed in which a more reliable synchronization of the starting points of successive analytical scans is obtained by combining:(a) a moving retro-reflector in the variable-length arm which reflects both the analytical beam and the reference beam;(b) stationary reflecting means in the variable-length arm providing a flat "folding" reflector which causes the path of at least the reference beam from the retro-reflector to be folded on itself and returned to the retro-reflector; and(c) stationary reflecting means for the reference beam in the fixed-length arm so located as to offset the reference interferogram with respect to the analytical interferogram. Two versions of the invention are shown, each having two disclosed embodiments. In one version all three of the beams (clock, reference, and analytical) are "folded" by means of mirrors located adjacent to the moving retro-reflector. In the other version only the reference beam is folded.
Abstract:
A refractively scanned interferometer, of the type in which a wedge-shaped prism is moved across one interferometer arm for scanning purposes, in which a similarly shaped fixed prism in the other arm provides optical compensation to avoid aberration problems. The beamsplitter surface is on the fixed wedge-shaped prism, and the two wedge-shaped prisms constitute the only refractive elements in the interferometer arms.
Abstract:
An interferometer, preferably of the Michelson type, is disclosed, in which the reflectors associated with the interferometer arms are stationary, and scanning is accomplished by displacement of a single wedge-shaped refractive element in one of the arms. The reflectors are preferably retro-reflectors rather than flat mirrors in order to minimize the effects of chromatic dispersion. A Moire scale may be used to measure the position of the wedge-shaped refractive element.
Abstract:
A dual beam Fourier-type spectrometer is disclosed incorporating distinct sample and reference beams which enter the Michelson-type interferometer on the same side of the beam splitter and propagate at slightly different angles through the interferometer. The portions of both beams which emerge from the side of the beam splitter opposite the input side are directed to two separate optical detectors, the outputs of which are electronically subtracted. In a preferred embodiment, the interferometer is of the refractively scanned type, wherein the increased field-of-view facilitates the use of beams having different propagation angles.
Abstract:
A sample immersion probe is disclosed which has an ATR (attenuated total reflectance) element at its tip. The ATR is so shaped that radiation exiting the probe will travel in paths parallel to radiation entering the probe. The angles of incidence of radiation on the ATR surface (or surfaces) which permit partial absorption by the sample material are greater than 45.degree.. At least one of the ATR surfaces in contact with the sample has a fully reflecting coating which prevents radiation absorption by the sample at that location. The ATR shape may be symmetrical or non-symmetrical with respect to the axis of symmetry of the probe. The radiation entering the probe may be in a separate light guide (i.e., path) from the radiation exiting the probe; or the entering and exiting radiation may be in the same light guide (path).
Abstract:
An infrared microscope is disclosed which provides illumination for reflectance by the sample. This illumination follows a path through the objective toward the sample, and again, after reflection, through the objective toward the detector. The reflectance illumination is directed toward the objective and sample by a fully reflective mirror, which injects approximately half of the interferometer beam into the microscope, and permits substantially all of the reflected beam to reach the detector.
Abstract:
An infrared microscope is disclosed in which two adjustable field stops are included. One is used to determine the illuminated area at the sample when the microscope is used in the transmission mode. The other is used to determine the illuminated area at the sample when the microscope is used in the reflectance mode. The latter field stop is imaged in the plane of the former; and the radiation in the reflectance mode passes through the former field stop both as it passes to the sample and as it returns from the sample after reflectance.
Abstract:
An accessory for use in the sample region of a spectrometer is disclosed which combines a matched pair of off-axis paraboloid reflectors having their focii optically imaged on the sample (either imaged at a common point or at two points which are optically imaged on each other) and having relative locations and orientations such that each ray of radiation strikes the two reflectors at points on the reflectors having approximately the same focal lengths. This arrangement involves the use of collimated optical beams into and out of the accessory. The accessory may function as a transmission-type accessory, in which the radiation passes through the sample, or as an internal reflectance accessory, in which the radiation passes through the sample holder but is reflected by the sample. The focal length relationship set forth is accomplished by having the "back-to-back" paraboloid reflectors, i.e., their reflecting surfaces face in substantially different, preferably opposite, directions. A further aspect is the incorporation of means for adjusting the position of at least one of the paraboloid reflectors along a first line parallel to, and along a second line perpendicular to, the axis of the collimated optical beam reflected by the position-adjustable reflector.