公开(公告)号：US20250085177A1

公开(公告)日：2025-03-13

申请号：US18825641

申请日：2024-09-05

Applicant: CORNING INCORPORATED

Inventor： Ryan Claude Andrews ,  David Matthew Berg ,  Pierre Michel Bouzi ,  William John Furnas ,  Jacob Immerman ,  Jeremiah Robert Jacobson ,  Katherine Anne Lindberg ,  Andrew Allen Lindstrand ,  Glenn Abram Newcomer ,  Evan Lewis Olson ,  Babak Robert Raj ,  Nathaniel David Wetmore

IPC: G01L1/24 ,  G01J3/14 ,  G01J4/02 ,  G01N21/21 ,  G01N21/47

Abstract: Apparatus includes a sample holder with a cavity and a plurality of devices configured to hold a curvature of a curved substrate in a fixed configuration. Apparatus includes two prisms with a viewing apparatus of the sample holder configured to translate therebetween. Methods can include disposing the curved substrate in the sample holder, transmitting a first beam, translating the sample holder, and transmitting a second beam. Alternatively, apparatus include a light scattering-polarimetry sub-system configured to emit a first beam to impinge an end surface of coupling prism and detect at least a portion of the first beam impinging the first surface of the coupling prism. The apparatus includes an evanescent prism coupling spectroscopy sub-system configured to emit a second beam to impinge a first surface of the coupling system and detect at least a portion of the second beam impinging the second surface of the coupling prism.

公开(公告)号：US20240369738A1

公开(公告)日：2024-11-07

申请号：US18654918

申请日：2024-05-03

Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY

Inventor： Chao WANG ,  Yu YAO ,  Shinhyuk CHOI ,  Jiawei ZUO

IPC: G02B1/00 ,  G01J4/02 ,  G03F7/00 ,  G03F9/00 ,  H01L27/146

Abstract: A polarimetric metastructure is disclosed that includes a metasurface structure, one or more vertically coupled double-layer metallic gratings, and a dielectric spacer layer between the metasurface structure and the vertically coupled double-layer metallic gratings.

公开(公告)号：US11946809B2

公开(公告)日：2024-04-02

申请号：US17740529

申请日：2022-05-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ingi Kim ,  Minhwan Seo ,  Sangwoo Bae ,  Akinori Okubo ,  Jungchul Lee ,  Eunhee Jeang

IPC: G01J4/02 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J4/04

Abstract: Provided is a polarization measuring device including a stage on which a measurement target is provided, a light source assembly configured to emit incident light, a first polarimeter configured to polarize the incident light, a second polarimeter configured to polarize reflected light reflected from the measurement target that is irradiated by the incident light, a filter assembly configured to remove noise from the reflected light, and a detector configured to receive the reflected light and measure an intensity of the reflected light and a phase of the reflected light.

公开(公告)号：US11105612B2

公开(公告)日：2021-08-31

申请号：US16825338

申请日：2020-03-20

Applicant: CORNING INCORPORATED

Inventor： Ryan Claude Andrews ,  Pierre Michel Bouzi ,  William John Furnas ,  Jeremiah Robert Jacobson ,  Glenn Abram Newcomer ,  Evan Lewis Olson ,  Babak Robert Raj ,  Rostislav Vatchev Roussev ,  Viktor Stepanov ,  Nathaniel David Wetmore

IPC: G01B11/16 ,  G01J4/02

Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.

公开(公告)号：US10458851B2

公开(公告)日：2019-10-29

申请号：US15887994

申请日：2018-02-03

Applicant: Keysight Technologies, Inc.

Inventor： Gregory Steven Lee ,  Douglas Michael Baney ,  Todd Steven Marshall ,  Gregory Douglas VanWiggeren

IPC: G01J5/08 ,  G01J5/00 ,  H04B17/29 ,  H04B17/17 ,  G01J4/02 ,  G01J4/04 ,  G01J5/10

Abstract: Illustrative embodiments disclosed herein pertain to a thermal imaging system that includes a thermal imaging sheet having an array of thermal unit cells for generating a thermal footprint in response to receiving an RF signal. The thermal footprint is composed of an array of hotspots having a first set of hotspots indicative of a radiation characteristic of a first polarization component of the RF signal, and a second set of hotspots indicative of a radiation characteristic of a second polarization component of the RF signal. Each thermal unit cell includes a first RF antenna and a second RF antenna oriented orthogonal with respect to each other. The first RF antenna includes a terminating resistor that generates a hotspot among the first set of hotspots and the second RF antenna includes another terminating resistor that generates a hotspot in the second set of hotspots.

公开(公告)号：US20190056273A1

公开(公告)日：2019-02-21

申请号：US16024415

申请日：2018-06-29

Applicant: Polaris Sensor Technologies, Inc.

Inventor： J. Larry Pezzaniti

IPC: G01J4/02 ,  G01J3/02 ,  G02B5/30 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J4/04 ,  G01J5/58 ,  G01J2005/586 ,  G02B3/0006 ,  G02B5/30 ,  G02B5/3025 ,  G02B5/3058

Abstract: A short wave infrared polarimeter comprising a pixelated polarizer array and an Indium-Gallium-Arsenide (“InGaAs”) focal plane array. The short wave infrared polarimeter optionally includes a micro-lens array and/or an aperture layer

公开(公告)号：US20180241480A1

公开(公告)日：2018-08-23

申请号：US15895545

申请日：2018-02-13

Applicant: GOVERNMENT OF THE UNITED STATES AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE

Inventor： David H. Hughes ,  Reinhard K. Erdmann

IPC: H04B10/85 ,  H04L9/06 ,  G06N99/00 ,  H04B10/70 ,  G01J4/02

CPC classification number: H04B10/85 ,  G01J4/02 ,  G02B27/141 ,  G02B27/283 ,  G02B27/288 ,  G06N10/00 ,  G09C1/00 ,  H04B10/70 ,  H04L9/0618 ,  H04L9/0855

Abstract: A hyper-entanglement photon server (i.e., hub) employs non-degenerate frequencies input as entangled photon pairs into a beam splitter. The beam splitter splits probability amplitudes into two sets of bunched superposition states plus two sets of anti-bunched superposition states. The amplitudes pass through identical Lyot filters and then either enter a polarization beam splitter, where the bunched and anti-bunched states switch identities, or merely advance unchanged to awaiting users at two distinct and spatially-displaced positions (i.e., spokes). The Lyot filters change the output amplitudes from rotationally invariant superpositions of generalized Bell States to rotationally non-invariant superpositions of generalized Bell states. All hubs and spokes pre-share operating key material (a security method called KCQ) that may be continually updated by shared stream ciphers seeded by fresh key material engendered by hub-to-spoke quantum communication.

公开(公告)号：US20180066991A1

公开(公告)日：2018-03-08

申请号：US15556995

申请日：2016-03-10

Applicant: PRESIDENT AND FELLOWS OF HARVARD COLLEGE

Inventor： Jan Philipp Balthasar MUELLER ,  Kristjan LEOSSON ,  Federico CAPASSO

IPC: G01J4/02 ,  G01N21/47 ,  H01Q21/24 ,  G01R29/08 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J4/04 ,  G01J2004/002 ,  G01N21/47 ,  G01N2021/4792 ,  G01R29/0814 ,  G01R29/0892 ,  H01Q21/24

Abstract: A polarimeter includes an integrated device with an array of antennas including multiple column pairs. Each column pair has two columns, and each column in each column pair includes multiple antennas. A first column of each column pair in the array scatters a first polarization component of an incident radiation, and a second column of each column pair in the array scatters a second polarization component of the incident radiation. The scattered fields of the column pairs interfere constructively in a direction depending on the polarization of the incident radiation, resulting in maximal intensity at a certain point in space for a specific polarization state. Multiple column pairs in parallel and oriented at angles with respect to each other can be used to scatter different polarization components of the incident radiation directionally to different points in space. Detectors are positioned with respect to the integrated device to detect polarization components.

公开(公告)号：US20150204724A1

公开(公告)日：2015-07-23

申请号：US14417618

申请日：2013-07-25

Applicant: HORIBA JOBIN YVON SAS

Inventor： Olivier Acher ,  Simon Richard ,  Thanh-Liem Nguyen

IPC: G01J4/02

CPC classification number: G01J4/02 ,  G01J4/04

Abstract: An accurate and robust wavefront-division polarimetric analysis method and device, allows the quasi-instantaneous measurement of the polarization states of a luminous object. The device can be used to produce a plurality of light beams, all polarized according to different polarization states, from a single upstream light beam. The polarized light beams, which do not overlap and which carry information items that are complementary in terms of polarization, are analyzed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing elements digitally process the luminous intensity values obtained in order to determine the polarization state of the upstream light beam. The operations performed by the processing elements prevent luminous intensity variations in the split light beams during the division of the wavefront of the upstream light beam. Therefore, the wavefront-division polarimetric analysis device is robust and its accuracy is not hindered by the experimental conditions.

Abstract translation: 准确可靠的波前分割偏振分析方法和装置允许准瞬时测量发光物体的偏振状态。 该装置可用于从单个上游光束产生根据不同极化状态全部偏振的多个光束。 通过测量每个光束的发光强度的多个检测器同时分析不重叠并且携带在极化方面互补的信息项的偏振光束。 处理元件对获得的发光强度值进行数字处理，以确定上游光束的偏振状态。 由处理元件执行的操作防止在上游光束的波前划分期间分束光束的发光强度变化。 因此，波前分割极化分析装置是鲁棒的，其精度不受实验条件的影响。

公开(公告)号：US09041935B2

公开(公告)日：2015-05-26

申请号：US13482813

申请日：2012-05-29

Applicant: Xiaotian Steve Yao ,  Xiaojun Chen

Inventor： Xiaotian Steve Yao ,  Xiaojun Chen

IPC: G01B9/02 ,  G01N21/00 ,  G01J4/00 ,  G01J4/02 ,  G01N21/23

CPC classification number: G01J4/02 ,  G01N21/23

Abstract: Techniques and devices for measuring polarization crosstalk in birefringence optical media including polarization maintaining fiber.

Abstract translation: 用于测量双折射光学介质包括偏振保持光纤的偏振串扰的技术和装置。